IP Library Granted Patent US 8,866,018
Granted Patent B2
US 8,866,018 · App. 12/352,411 · Granted Oct 21, 2014

Passive electrical devices and methods of fabricating passive electrical devices

Inventors: Pranabes K. Pramanik (Clifton Park, NY); Yuji Kageyama (Clifton Park, NY); Fujio Kuwako (Clifton Park, NY); Jin Hyun Hwang (Clifton Park, NY)
Assignee: Oak-Mitsui Technologies LLC
H01G4/18H01G4/203H01G4/33H05K1/162H05K2201/0166H05K2201/0195H05K2201/0355H05K2201/09309
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Quick Facts
Patent No.
US 8,866,018
App. No.
12/352,411
Granted
Oct 21, 2014
Kind
B2
Abstract

A thin laminate passive electrical device, such as, a capacitor, and a method of fabricating a thin laminate passive electrical device are provided. The passive electrical device includes two conductors, for example, copper foil conductors, separated by a dielectric having a first layer of a first material having a softening point temperature greater than a first temperature and a first layer of a second material having a softening point temperature less than the first temperature. The first temperature may be at least 150 degrees C. or higher. By providing a first layer having a higher softening point material, shorting across the conductors, that can be promoted by the fabrication process, is prevented. Methods of fabricating passive electrical devices are also disclosed.

Claims (27)

1. A thin laminate capacitive device comprising:

a first conductor;

a first layer of a first insulating material adjacent to the first conductor, the first insulating material of the first layer having a softening point temperature greater than a lamination temperature of the device;

a first layer of a second insulating material adjacent to the first layer of the first insulating material, the second insulating material being different from the first insulating material, having a lower thermal deformation resistance than the first insulating material, and having a softening point temperature less than the lamination temperature of the device, wherein the lamination temperature of the device is 150 degrees C.; and

a second conductor adjacent the first layer of the second insulating material.

2. A thin laminate capacitive device comprising:

a first conductor;

a first layer of a first insulating material adjacent to the first conductor, the first insulating material of the first layer having a softening point temperature greater than a lamination temperature of the device;

a first layer of a second insulating material adjacent to the first layer of the first insulating material, the second insulating material being different from the first insulating material, having a lower thermal deformation resistance than the first insulating material, and having a softening point temperature less than the lamination temperature of the device, wherein the lamination temperature of the device is at least 200 degrees C.; and

a second conductor adjacent the first layer of the second insulating material.

3. The thin laminate capacitive device as recited in claim 2 , wherein the capacitive device comprises a capacitance density of at least 50 pF/cm 2 and a dielectric strength of at least 200 kV/mm.

4. The thin laminate capacitive device as recited in claim 2 , wherein the device further comprises a second layer of the first insulating material between the first layer of the second insulating material and the second conductor.

5. The thin laminate capacitive device as recited in claim 4 , wherein the device further comprises a second layer of the second insulating material between the first layer of the second insulating material and the second conductor.

6. The thin laminate capacitive device as recited in claim 2 , wherein the second conductor is laminated to the first layer of the second insulating material at the lamination temperature of the device.

7. The thin laminate capacitive device as recited in claim 2 , wherein the first insulating material comprises at least one of a thermoplastic polymer and a thermosetting polymer.

8. The thin laminate capacitive device as recited in claim 2 , wherein the first insulating material comprises a polymer comprising at least one of a polyamide, a polyamide-imide, a polyimide, a polymer sulphones, a polyaryl sulfone, a polyphenylene sulfide, a polyetheretherketone, a polyphenyleneoxide, a polybismalimide, an epoxy, a polyester, and a polyurethane.

9. The thin laminate capacitive device as recited in claim 2 , wherein the second insulating material comprises a polymer comprising at least one of an epoxy, a polyimide, a polyamides, a polyamideimide, a polyethersulfone, a polyester, a polybismalemide, an alkyd, a polyurethane, and a bismalemide triazine.

10. The thin laminate capacitive device as recited in claim 2 ,

wherein the first conductor is a first copper foil conductor, the second conductor is a second copper foil conductor, the first insulating material is a first polymer having a softening point temperature greater than 150 degrees C., and the second insulating material is a second polymer having a softening point temperature less than 150 degrees C.;

wherein the first layer of the first polymer is bonded to the first copper foil conductor, the first layer of the second polymer is bonded to the first layer of the first polymer, and the second copper foil is bonded to the first layer of the second polymer; and

wherein the capacitive device comprises a capacitance density of at least 50 pF/cm 2 and a dielectric strength of at least 200 kV/mm.

11. The thin laminate capacitive device as recited in claim 10 , wherein the second polymer comprises at least one of an epoxy, a polyimide, a polyamides, a polyamideimide, a polyethersulfone, a polyester, a polybismalemide, an alkyd, a polyurethane, and a bismalemide triazine.

12. The thin laminate capacitive device as recited in claim 2 , wherein the first polymer comprises at least one of a polyamide, a polyamide-imide, a polyimide, a polymer sulphones, a polyaryl sulfone, a polyphenylene sulfide, a polyetheretherketone, a polyphenyleneoxide, a polybismalimide, an epoxy, a polyester, and a polyurethane.

13. A printed circuit board having the thin laminate capacitive device recited in claim 2 .

14. An electronic device having the printed circuit board recited in claim 13 .

15. The thin laminate capacitive device as recited in claim 2 , wherein the first insulating material comprises a polyamide.

16. The thin laminate capacitive device as recited in claim 2 , wherein the first insulating material comprises a polyamideimide polymer, and the second insulating material comprises an epoxy thermosetting polymer.

Assignments (4)
CHANGE OF NAME Recorded Mar 31, 2026
From: MITSUI MINING AND SMELTING COMPANY, LIMITED
To: MITSUI KINZOKU COMPANY, LIMITED
Reel/Frame 075357/0342 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED AT REEL: 044761 FRAME: 0045. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 27, 2018
From: OAK-MITSUI TECHNOLOGIES LLC.
To: MITSUI MINING & SMELTING CO., LTD.
Reel/Frame 045831/0512 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2018
From: OAK-MITSUI TECHNOLOGIES LLC.
To: MITSUI MINING & SMELTING CO. LTD.
Reel/Frame 044761/0045 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2009
From: PRAMANIK, PRANABES K.; KAGEYAMA, YUJI; KUWAKO, FUJIO; HWANG, JIN HYUN
To: OAK-MITSUI TECHNOLOGIES LLC
Reel/Frame 023365/0065 →
Continuity (1)
Related Publication 20100175914A1 · Jul 15, 2010