Alignment mark and a method of aligning a substrate comprising such an alignment mark

1. An alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed its a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90°<β<0°;

wherein the first periodic structure formed by first mark lines touches the second periodic structure formed by second mark lines, and

wherein the first direction is not perpendicular to the second direction.

2. The alignment mark according to claim 1 , wherein the first angle α is substantially equal to minus the second angle β, α=−β.

3. The alignment mark according to claim 1 , wherein the first angle α substantially differs from the second angle β and the second angle β is substantially equal to −90°.

4. The alignment mark according to claim 1 , wherein −90°<β<0°.

5. The alignment mark according to claim 1 , wherein the first area and the second area substantially overlap.

6. The alignment mark according to claim 1 , wherein the alignment mark further comprises a third area comprising a third periodic structure, the third periodic structure being similar to the second periodic structure.

7. The alignment mark according to claim 6 , wherein the first area is touching both the second and third area.

8. The alignment mark according to claim 1 , wherein mark lines are formed by a plurality of sub-segment lines extending parallel or perpendicular with respect to the scribe lane direction.

9. The alignment mark according to claim 1 , where mark lines are formed by a plurality of periodic sub-segment lines.

10. The alignment mark according to claim 1 , wherein the scribe lane direction is substantially parallel to or perpendicular to the scanning direction.

11. An alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed in a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90°≦β<0°;

wherein the first periodic structure has a first period and the second periodic structure has a second period, the first period differing from the second period.

12. The alignment mark according to claim 11 , wherein the alignment mark further comprises:

a third area comprising a third periodic structure formed by third mark lines extending in the first direction; and

a fourth area comprising a fourth periodic structure formed by fourth mark lines extending in the second direction.

13. The alignment mark according to claim 11 , wherein the first angle α is substantially equal to minus the second angle β, α=−β.

14. The alignment mark according to claim 11 , wherein the first angle α substantially differs from the second angle β and the second angle β is substantially equal to −90°.

15. The alignment mark according to claim 11 , wherein −90°<β<0°.

16. The alignment mark according to claim 11 , wherein the first area and the second area substantially overlap.

17. The alignment mark according to claim 11 , wherein the alignment mark further comprises a third area comprising a third periodic structure, the third periodic structure being similar to the second periodic structure.

18. The alignment mark according to claim 17 , wherein the first area is separated from both the second and third area by a gap.

19. The alignment mark according to claim 17 , wherein the first area is touching both the second and third area.

20. The alignment mark according to claim 11 , wherein mark lines are formed by a plurality of sub-segment lines extending parallel or perpendicular with respect to the scribe lane direction.

21. The alignment mark according to claim 11 , where mark lines are formed by a plurality of periodic sub-segment lines.

22. The alignment mark according to claim 11 , wherein the scribe lane direction is substantially parallel to or perpendicular to the scanning direction.

23. An alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed in a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90°≦β<0°;

wherein the first mark lines have a first period and the second mark lines have a second period, the first period being substantially identical to the second period,

wherein a line end of each first mark line connects to a line end of an adjacent second mark line, and

wherein the first direction is not perpendicular to the second direction.

24. The alignment mark according to claim 23 , wherein a position of a line end of each first mark line coincides with a same position of a line end of an adjacent second mark line so as to form a concatenated line of the first mark line and the second mark line.

25. The alignment mark according to claim 23 , wherein the alignment mark further comprises a third area comprising a third periodic structure, the third periodic structure being similar to the first periodic structure, and wherein a further line end of each second mark line connects to a line end of an adjacent third mark line.

26. The alignment mark according to claim 23 , wherein the first angle α is substantially equal to minus the second angle β, α=−β.

27. The alignment mark according to claim 23 , wherein the first angle α substantially differs from the second angle β and the second angle β is substantially equal to −90°.

28. The alignment mark according to claim 23 , wherein −90°<β<0°.

29. The alignment mark according to claim 23 , wherein mark lines are formed by a plurality of sub-segment lines extending parallel or perpendicular with respect to the scribe lane direction.

30. The alignment mark according to claim 23 , where mark lines are formed by a plurality of periodic sub-segment lines.

31. The alignment mark according to claim 23 , wherein the scribe lane direction is substantially parallel to or perpendicular to the scanning direction.

32. A substrate comprising an alignment mark, the alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed in a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90°<β<0°,

wherein the first periodic structure has a first period and the second periodic structure has a second period, the first period differing from the second period.

33. A substrate comprising an alignment mark, the alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed in a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90≦β<0°;

wherein the first mark lines have a first period and the second mark lines have a second period, the first period being substantially identical to the second period, and

wherein a line end of the first mark lines connects to as line end of an adjacent ones of the second mark lines, and

wherein the first direction is not normal to the second direction.

34. A substrate comprising an alignment mark, the alignment mark comprising a periodic structure formed by mark lines, the alignment mark being formed in a scribe lane of a substrate, the scribe lane extending in a scribe lane direction, the alignment mark comprising:

a first area comprising a first periodic structure formed by first mark lines extending in a first direction, the first direction being at a first angle α with respect to the scribe lane direction, wherein 0°<α<90°; and

a second area comprising a second periodic structure formed by second mark lines extending in a second direction, the second direction being at a second angle β with respect to the scribe lane direction, wherein −90°≦β<0°;

wherein the first periodic structure formed by first mark lines touches the second periodic structure formed by second mark lines, and

wherein the first direction is not perpendicular to the second direction.