Method, design program and design system for semiconductor device
A method of designing a semiconductor device includes: calculating a design value of a noise parameter based on design specification of the semiconductor device. The noise parameter contributes to power-supply noise of the semiconductor device. The method further includes: setting the noise parameter variably within a predetermined range including the calculated design value; calculating amount of power-supply noise of the semiconductor device by using the set noise parameter; and generating a noise database indicating correspondence relationships between the noise parameter within the predetermined range and the calculated amount of power-supply noise.
1 . A method of designing a semiconductor device, comprising:
calculating a design value of a noise parameter based on design specification of said semiconductor device, said noise parameter contributing to power-supply noise of said semiconductor device;
setting said noise parameter variably within a predetermined range including said calculated design value;
calculating amount of power-supply noise of said semiconductor device by using said set noise parameter; and
generating a noise database indicating correspondence relationships between said noise parameter within said predetermined range and said calculated amount of power-supply noise.
2 . The method according to claim 1 , further comprising:
referring to said noise database to determine an acceptable range of said noise parameter within which said calculated amount of power-supply noise is not more than a predetermined acceptable amount; and
generating a design constraint data indicating said acceptable range of said noise parameter.
3 . The method according to claim 2 ,
wherein said acceptable range of said noise parameter is so determined as to further meet a condition required by physical specification of said semiconductor device.
4 . The method according to claim 2 , further comprising:
performing a circuit design of said semiconductor device by referring to said design constraint data such that said noise parameter satisfies said acceptable range.
5 . The method according to claim 1 ,
wherein said design specification of said semiconductor device includes information of at least one of a chip size, power consumption, a package and a board.
6 . A design program recorded on a computer-readable medium that, when executed, causes a computer to perform a design processing comprising:
calculating a design value of a noise parameter based on design specification of a semiconductor device, said noise parameter contributing to power-supply noise of said semiconductor device;
setting said noise parameter variably within a predetermined range including said calculated design value;
calculating amount of power-supply noise of said semiconductor device by using said set noise parameter; and
generating a noise database indicating correspondence relationships between said noise parameter within said predetermined range and said calculated amount of power-supply noise.
7 . A design system for designing a semiconductor device, comprising:
a memory device in which a design specification data indicating design specification of said semiconductor device is stored; and
a processor configured to calculate a design value of a noise parameter based on said design specification, said noise parameter contributing to power-supply noise of said semiconductor device, to set said noise parameter variably within a predetermined range including said calculated design value, to calculate amount of power-supply noise of said semiconductor device by using said set noise parameter, and to generate a noise database indicating correspondence relationships between said noise parameter within said predetermined range and said calculated amount of power-supply noise.