Semiconductor device
View Patent ↗A semiconductor device includes an interface circuit that varies drive ability according to a control signal, and a control circuit that generates the control signal according to a range of an output voltage of the interface circuit. The interface circuit and the control circuit are provided on one chip.
1. A semiconductor device, comprising:
an interface circuit that varies drive ability according to a control signal; and
a control circuit that generates the control signal according to a range of an output voltage of the interface circuit,
wherein the interface circuit and the control circuit are provided on one chip,
wherein the output voltage of the interface circuit and a power supply voltage supplied to the interface circuit are substantially equal to each other,
wherein the control circuit compares a reference voltage generated from a fixed voltage employed by an internal circuit of the semiconductor device with the power supply voltage to generate the control signal, and
wherein the control circuit comprises a plurality of comparators powered by a core power supply providing the fixed voltage.
2. The semiconductor device according to claim 1 , wherein
the control circuit includes first and second resistance elements, and
the reference voltage is generated by dividing the fixed voltage by the first and second resistance elements.
3. The semiconductor device according to claim 2 , wherein
the control signal includes a first control signal and a second control signal,
the control circuit further comprises third to ninth resistance elements and first and second comparators,
the first comparator compares the reference voltage with a voltage obtained by dividing the power supply voltage by the third to sixth resistance elements to generate the first control signal, and
the second comparator compares the reference voltage with a voltage obtained by dividing the power supply voltage by the seventh to ninth resistance elements to generate the second control signal.
4. The semiconductor device according to claim 3 , wherein the first to ninth resistance elements are close to one another in the chip and are formed to have the same shape.
5. The semiconductor device according to claim 3 , further comprising:
a first latch circuit that latches the first control signal and outputs the latched first control signal to the interface circuit; and
a second latch circuit that latches the second control signal and outputs the latched second control signal to the interface circuit, wherein
the first and second latch circuits latch the first and second control signals by a reset signal, and the reset signal is used when the semiconductor device is activated.
6. The semiconductor device according to claim 1 , further comprising a ground terminal providing a ground voltage to the interface circuit and the control circuit from a single core including the interface circuit and the control circuit.
7. The semiconductor device according to claim 1 , wherein when the power supply voltage for the interface circuit varies, a delay of an output signal of the interface circuit is substantially constant with respect to an input signal of the interface circuit.
8. The semiconductor device according to claim 1 , wherein the power supply voltage for the interface circuit, the core power supply voltage of the fixed voltage and a ground voltage are supplied to the control circuit through wirings in a layer different from a layer in which the control circuit is formed.
9. The semiconductor device according to claim 1 , wherein the control circuit detects a change of the power supply voltage of the interface circuit and according to the change, outputs the control signals to the interface circuit.
10. A semiconductor device, comprising:
an interface circuit that varies drive ability according to a control signal; and
a control circuit that generates the control signal according to a range of an output voltage of the interface circuit,
wherein the interface circuit and the control circuit are provided on one chip,
wherein the output voltage of the interface circuit and a power supply voltage supplied to the interface circuit are substantially equal to each other,
wherein the control circuit compares a reference voltage generated from a fixed voltage employed by an internal circuit of the semiconductor device with the power supply voltage to generate the control signal,
wherein the control circuit includes a plurality of comparators powered by a core power supply to compare the reference voltage with the power supply voltage, and
wherein the core power supply provides the fixed voltage from a core including the interface circuit and the control circuit, while the power supply voltage supplied to the interface circuit is of a variable potential.
11. A semiconductor device, comprising:
an interface circuit formed on a first core that varies drive ability according to a control signal and supplied with a power supply voltage of an adjustable potential; and
a control circuit formed in the first core that generates the control signal according to a range of an output voltage of the interface circuit, the control circuit comparing a reference voltage generated from a substantially constant core power supply of the first core with the power supply voltage supplied to the interface circuit to generate the control signal,
wherein the control circuit comprises a plurality of comparators powered by the substantially constant core power supply voltage.
12. The semiconductor device according to claim 11 , wherein:
the control circuit includes first and second resistance elements, and
the reference voltage is generated by dividing the substantially constant core power supply voltage by the first and second resistance elements.
13. The semiconductor device according to claim 12 , wherein:
the control signal includes a first control signal and a second control signal, and
the control circuit further comprises third to ninth resistance elements and first and second comparators.
14. The semiconductor according to claim 13 , wherein:
the first comparator compares the reference voltage with a voltage obtained by dividing the power supply voltage by the third to sixth resistance elements to generate the first control signal, and
the second comparator compares the reference voltage with a voltage obtained by dividing the power supply voltage by the seventh to ninth resistance elements to generate the second control signal.
15. The semiconductor device according to claim 14 , wherein the first to ninth resistance elements are adjacent to one another in the core and are formed to have the same shape.
16. The semiconductor device according to claim 14 , further comprising:
a first latch circuit that latches the first control signal and outputs the latched first control signal to the interface circuit; and
a second latch circuit that latches the second control signal and outputs the latched second control signal to the interface circuit, wherein:
the first and second latch circuits latch the first and second control signals by a reset signal, and the reset signal is used when the semiconductor device is activated.
17. The semiconductor device according to claim 11 , wherein the power supply voltage for the interface circuit, a core power supply voltage of the substantially constant core power supply voltage and a ground voltage are supplied to the control circuit through wirings in a layer different from a layer in which the control circuit is formed.