Circuit analysis method, semiconductor integrated circuit manufacturing method, circuit analysis program and circuit analyzer
To perform a timing analysis at a high analysis accuracy while reducing a TAT. A circuit analyzer according to the present invention performs a timing analysis on a design target circuit after a layout change. The circuit analyzer includes a storage device in which an extraction range reference is set, an extraction range setting unit and a timing analysis unit. The extraction setting unit sets the extraction range reference including a layout-changed portion, as a parasitic element extraction target range. The timing analysis unit performs a timing analysis by using, as an analysis target, a predetermined range including a parasitic element extracted from the extraction target range.
1 . A circuit analyzer for a design target circuit after a layout change, the circuit analyzer comprising:
a storage device in which an extraction range reference is set;
an extraction range setting unit which sets the extraction range reference including a layout-changed portion, as a parasitic element extraction target range; and
a timing analysis unit which performs a timing analysis by using, as an analysis target, a predetermined range including a parasitic element extracted from the extraction target range, wherein
the timing analysis unit updates, on the basis of a result of the timing analysis, a timing analysis result of the design target circuit after the layout change, the timing analysis result recorded in the storage device.
2 . The circuit analyzer according to claim 1 , further comprising a calculation range setting unit, wherein
a delay time calculation range reference is further set in the storage device,
the calculation range setting unit sets the delay time calculation range reference including the parasitic element extracted from the extraction target range, as a calculation target range, and
the timing analysis unit includes a delay time calculation unit which calculates a delay time in the calculation target range.
3 . The circuit analyzer according to claim 2 , further comprising an analysis range setting unit, wherein
a crosstalk analysis range reference is further set in the storage device,
the analysis range setting unit sets the crosstalk analysis range reference including the calculation target range, as an analysis target range, and
the timing analysis unit further includes a crosstalk analysis unit which analyses crosstalk in the analysis target range by using the delay time.
4 . The circuit analyzer according to claim 3 , wherein the analysis target range is a range defining a portion of the circuit operating at the same operation timing as a portion of the circuit in the calculation target range.
5 . The circuit analyzer according to claim 1 , wherein the extraction range reference is a range reference set on the basis of an analysis accuracy of the timing analysis unit.
6 . The circuit analyzer according to claim 2 , wherein the delay time calculation range reference is a range reference set on the basis of an analysis accuracy of the delay time calculation unit.
7 . The circuit analyzer according to claim 3 , wherein the crosstalk analysis range reference is a range reference set on the basis of an analysis accuracy of the crosstalk analysis unit.
8 . The circuit analyzer according to 1 , further comprising a layout change unit which performs a layout change on the design target circuit on the basis of the result of the timing analysis, wherein
the timing analysis unit judges whether the updated timing analysis result satisfies a constraint set in the storage device; and
the layout change unit performs a layout change on the design target circuit on the basis of a result of the judgment.