IP Library Granted Patent US 7,940,599
Granted Patent B2
US 7,940,599 · App. 12/404,892 · Granted May 10, 2011

Dual port memory device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,940,599
App. No.
12/404,892
Granted
May 10, 2011
Kind
B2
Abstract

A multi-port memory device having a storage node, a precharge node, a first, second, third, and fourth transistor, and a control module. The first transistor includes a current electrode connected to the storage node, another current electrode connected to a first bit line, and a gate connected to a first wordline. The second transistor includes a current electrode connected to the storage node, another current electrode connected to a second bit line, and a gate connected to a second wordline. The third transistor includes a current electrode connected to the reference node, another current electrode connected to the first bit line, and a gate. The fourth transistor includes a current electrode connected to the precharge node, another current electrode connected to the second bit line, and a gate. The control module deactivates the fourth transistor in response to a dummy access of the first storage module at the second transistor.

Claims (40)

1. A device comprising a plurality of bit cells, a first bit cell of the plurality of bit cells comprising:

a first storage module comprising a first storage node;

a first transistor comprising a first current electrode coupled to the first storage node, a second current electrode coupled to a first bit line, and a control electrode coupled to a first wordline;

a second transistor comprising a first current electrode coupled to the first storage node, a second current electrode coupled to a second bit line, and a control electrode coupled to a second wordline; and

a third transistor comprising a first current electrode coupled to the first bit line, a second current electrode coupled to the second bit line, and a control electrode;

a reference node to provide a precharge signal;

a fourth transistor comprising a first current electrode coupled to the reference node, a second current electrode coupled to the first bit line, and a control electrode;

a fifth transistor comprising a first current electrode coupled to the reference node, a second current electrode coupled to the second bit line, and a control electrode; and

a control module coupled to the control electrode of the fifth transistor and operable, in response to a dummy access of the first storage module at the second transistor, to deactivate the fifth transistor during the dummy access of the first bit cell.

2. The device of claim 1 wherein the control module is further coupled to the control electrode of the third transistor and operable, in response to a dummy access of the first bit cell, to activate the third transistor.

3. The device of claim 2 , wherein the control module is further operable in response to the dummy access of the first bit cell and a write access of the first bit cell, to activate the third transistor during the dummy access of the first storage cell.

4. The device of claim 1 , wherein the control module is further operable to deactivate the fifth transistor in response to the dummy access of the first bit cell and a write access of the first bit cell.

5. The device of claim 4 , wherein the control module is further operable to deactivate the fifth transistor in response to the dummy access of the first bit cell and the write access of the first bit cell occurring concurrently.

6. The device of claim 1 , wherein the control module is operable, in response to access inactivity at the second word line, to activate the fifth transistor during the access inactivity.

7. The device of claim 1 the control module further coupled to the control electrode of the third transistor and operable, in response to a dummy access of the first storage cell occurring concurrently with a write access of the first storage cell, to activate the third transistor.

8. A method comprising: terminating a precharge at a first bit line of a first port of a multi-port cell in response to determining an occurrence of a dummy access at the first port, and equalizing the first bit line of the first port of the multi-port cell to a second bit line of a second port of the multi-port cell in response to determining the occurrence of the dummy access at the first port.

9. The method of claim 8 , wherein equalizing the first bit line to the second bit line is in response to the occurrence of the dummy access at the first port and an occurrence of a write access at the second port of the multi-port bit cell.

10. The method of claim 9 , wherein equalizing the first bit line to the second bit line is in response to the dummy access and the write access being concurrent.

11. The method of claim 8 , wherein terminating the precharge is further in response to the occurrence of a write access at a second port of the multi-port bit cell.

12. The method of claim 11 , wherein the terminating the precharge is in response to the dummy access and the write access being concurrent.

13. The method of claim 8 further comprising:

maintaining the precharge at the first bit line in response to detecting access inactivity at the second port.

14. The method of claim 9 further comprising:

negating a signal provided to a word line of the first port in response to the dummy access being a read access and the dummy access occurring concurrently with the write access.

15. The method of claim 14 further comprising:

asserting the signal provided to the word line of the first port in response to the read access prior to negating the signal.

16. The method of claim 9 further comprising:

asserting a signal provided to a word line of the first port in response to a write access at the first port of the multi-port bit cell; and

maintaining a negated signal at a word line of a second port of the multi-port bit cell in response to a read access request to the second port of the multi-port bit cell occurring while the signal provided to the word line of the first port is asserted.

17. The method of claim 16 , further comprising:

asserting the signal at the word line of the second port upon completion of the write access at the first port.

18. A device comprising a plurality of bit cells, a first bit cell of the plurality of bit cells comprising:

a first storage module comprising a first storage node and a second storage node;

a first transistor comprising a first current electrode coupled to the first storage node, a second current electrode coupled to a first bit line, and a control electrode coupled to a first wordline;

a second transistor comprising a first current electrode coupled to the first storage node, a second current electrode coupled to a second bit line, and a control electrode coupled to a second wordline;

a third transistor comprising a first current electrode coupled to the first bit line, a second current electrode coupled to the second bit line, and a control electrode;

a fourth transistor comprising a first current electrode coupled to the second storage node, a second current electrode coupled to a third bit line, and a control electrode coupled to the first wordline;

a fifth transistor comprising a first current electrode coupled to the second storage node, a second current electrode coupled to a fourth bit line, and a control electrode coupled to the second wordline;

a sixth transistor comprising a first current electrode coupled to the third bit line, a second current electrode coupled to the fourth bit line, and a control electrode; and

a seventh transistor comprising a first current electrode coupled to a voltage reference for precharging the first bit line, a second current electrode coupled to the first bit line, and a control electrode coupled to a control circuit, the control circuit to terminate a precharge at the first bit line in response to a dummy access to the first storage node.

Assignments (27)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0793 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 19, 2009
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 022703/0405 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2009
From: LU, OLGA R.; CHILDS, LAWRENCE F.; LISTON, THOMAS W.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 022435/0585 →