Nanoscale optical tomography based on volume-scanning near-field microscopy
View Patent ↗An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.
1. An apparatus for imaging an object characterized by a surface, the apparatus comprising:
a. a light source for illuminating the object with an illuminating electromagnetic wave via an illumination path;
b. a detector for detecting electromagnetic waves scattered by the object via a collection path, and for generating a detector signal,
c. an aperture, disposed within at least one of the illuminating path and the collection path, wherein the aperture is characterized by a dimension equal to, or smaller than, a characteristic wavelenth of the illuminating electromagnetic wave;
d. a scanner for scanning a relative position of the aperture with respect to the object to a plurality of relative positions, not all of which relative positions are coplanar, above the surface of the object; and
e. a controller adapted
i. to apply a forward model of a point scatterer in a manner as to derive a three dimensional scattering model;
ii. to receive the detector signal and generate a detected data function; and
iii. to invert the detected data function in terms of the forward model to obtain a three-dimensional reconstruction of the object.
2. An apparatus in accordance with claim 1 , wherein the aperture is disposed in the illumination path.
3. An apparatus in accordance with claim 1 , wherein the aperture is a probe tip.
4. An apparatus in accordance with claim 1 , wherein a single aperture lies in both the illumination and the collection path.
5. An apparatus in accordance with claim 1 , wherein the light source is tunable in wavelength.
6. A method for imaging an object characterized by a surface, the method comprising:
a. illuminating the object with an illuminating electromagnetic wave via an illumination path;
b. detecting, with a detector disposed in a far field, electromagnetic waves scattered by the object via a collection path,
wherein an aperture, disposed within at least one of the illumination path and the collection path, is equal to, or smaller than, a characteristic wavelength of the electromagnetic wave;
c. scanning a relative position of the aperture with respect to the object to a plurality of positions, not all of which positions are coplanar, above the surface of the object;
d. applying a forward model of a point scatterer in a manner as to derive a three dimensional scattering model; and
e. inverting a detected data function in terms of the forward model to obtain a three-dimensional reconstruction of the object.
7. A method in accordance with claim 6 , wherein the step of scanning the aperture includes scanning a position of a probe tip that is small on a scale of the characterizing wavelength of the illuminating electromagnetic wave.
8. A method in accordance with claim 6 , wherein the forward model is expressed in terms of a block-diagonalized forward integral equation.