IP Library Granted Patent US 8,049,187
Granted Patent B2
US 8,049,187 · App. 12/411,995 · Granted Nov 1, 2011

Charged particle beam irradiating apparatus

Assignee: Sumitomo Heavy Industries, Ltd.
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Quick Facts
Patent No.
US 8,049,187
App. No.
12/411,995
Granted
Nov 1, 2011
Kind
B2
Abstract

The present invention provides a charged particle beam irradiating apparatus capable of irradiating a charged particle beam using both a wobbler method and a scanning method. A charged particle beam irradiating apparatus includes: scanning electromagnets that scan a charged particle beam; a wobbler irradiation unit that irradiates the charged particle beam using a wobbler method; a scanning irradiation unit that irradiates the charged particle beam using a scanning method; and a control unit that controls the wobbler irradiation unit and the scanning irradiation unit. In the charged particle beam irradiating apparatus, the control unit operates one of the wobbler irradiation unit and the scanning irradiation unit, and controls the other irradiation unit to be in a withdrawn state so as not to hinder the irradiation of the charged particle beam.

Claims (25)

1. A charged particle beam irradiating apparatus for irradiating a charged particle beam to an object, comprising:

a scanning electromagnet that scans the charged particle beam;

a wobbler irradiation unit that irradiates the charged particle beam using a wobbler method;

a scanning irradiation unit that irradiates the charged particle beam using a scanning method; and

a control unit that controls the wobbler irradiation unit and the scanning irradiation unit,

wherein the control unit operates one of the wobbler irradiation unit and the scanning irradiation unit, and controls the other irradiation unit to be in a withdrawn state so as not to hinder the irradiation of the charged particle beam.

2. The charged particle beam irradiating apparatus according to claim 1 , further comprising:

a case to which the wobbler irradiation unit and the scanning irradiation unit are attached,

wherein the wobbler irradiation unit includes a charged particle beam shaping unit that shapes the charged particle beam according to the shape of the object,

the scanning irradiation unit includes a penetration depth adjusting unit that adjusts the penetration depth of the charged particle beam, and

the charged particle beam shaping unit and the penetration depth adjusting unit are interchangeably attached to the case.

3. The charged particle beam irradiating apparatus according to claim 2 , further comprising:

at least one of a first switch that is turned on or off when the charged particle beam shaping unit is attached to the case and a second switch that is turned on or off when the penetration depth adjusting unit is attached to the case,

wherein the control unit controls the scanning electromagnet on the basis of the states of the first and second switches.

4. The charged particle beam irradiating apparatus according to claim 1 ,

wherein the wobbler irradiation unit includes a collimator that has an opening with a variable shape formed therein,

the collimator allows the charged particle beam to pass through the opening to shape the planar shape of the charged particle beam, and

when operating the scanning irradiation unit, the control unit moves the collimator to an upstream side in an irradiation direction and expands the opening of the collimator.

5. The charged particle beam irradiating apparatus according to claim 1 ,

wherein the wobbler irradiation unit includes a filter that adjusts the dose distribution of the charged particle beam,

the filter includes a transmission portion that transmits the charged particle beam without any change, and

when operating the scanning irradiation unit, the control unit moves the filter such that the charged particle beam passes through the transmission portion.

6. The charged particle beam irradiating apparatus according to claim 1 ,

wherein the wobbler irradiation unit includes a scatterer that is provided on a downstream side of the scanning electromagnet and diffuses the charged particle beam, and

a portion of the passage of the charged particle beam that is disposed on the upstream side of the scatterer is vacuum sealed.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 7, 2009
From: TACHIKAWA, TOSHIKI
To: SUMITOMO HEAVY INDUSTRIES, LTD.
Reel/Frame 022673/0208 →
Priority Claims (1)
JP P2008-086554 · Mar 28, 2008 · national
Continuity (1)
Related Publication 20090242789A1 · Oct 1, 2009