Apparatus for memory interface configuration
View Patent ↗An apparatus includes a memory circuit and an interface circuit. The interface circuit is coupled to the memory circuit. The interface circuit selects a phase value of clock signal adapted to clock the memory circuit.
1. An apparatus, comprising:
a memory circuit; and
an interface circuit, coupled to the memory circuit, that receives a clock signal having a phase value, and provides to a source of the clock signal a signal to sweep the phase value of the clock signal; wherein the clock signal is adapted to clock the memory circuit.
2. The apparatus according to claim 1 , wherein the interface circuit selects the phase value by evaluating a range of phase values using a set of windows.
3. The apparatus according to claim 2 , wherein the interface circuit evaluates each window in the set of windows to determine a pass condition or a fail condition.
4. The apparatus according to claim 1 , wherein the interface circuit selects the phase value by performing a phase change over a range of phase values, and capturing data for each phase value in the range of phase values.
5. The apparatus according to claim 4 , wherein the interface circuit evaluates the data captured for each phase value in the range of phase values.
6. The apparatus according to claim 4 , wherein the phase change is performed over a 360-degree range of phase values.
7. The apparatus according to claim 4 , wherein the phase change is performed over a 720-degree range of phase values.
8. The apparatus according to claim 4 , wherein the phase change is performed over an (M*360)-degree range of phase values, where M is an integer.
9. An integrated circuit (IC), comprising:
a memory circuit; and
an interface circuit, coupled to the memory circuit, that provides a clock signal to the memory circuit, the interface circuit comprising a selectable vector size shift register that changes a phase of the clock signal to select a phase value appropriate for interfacing with the memory circuit.
10. The integrated circuit (IC) according to claim 9 , wherein the clock signal is derived from an output signal of a phase locked loop (PLL) coupled to the interface circuit.
11. The integrated circuit (IC) according to claim 10 , wherein the interface circuit causes the phase locked loop (PLL) to generate the output signal with the selected phase value.
12. The integrated circuit (IC) according to claim 9 , wherein the shift register is serially loaded.
13. The integrated circuit (IC) according to claim 9 , wherein the shift register is loaded in parallel.
14. The integrated circuit (IC) according to claim 9 , wherein interfacing with the memory circuit comprises performing a DQS-based data capture.
15. The integrated circuit (IC) according to claim 9 , wherein interfacing with the memory circuit comprises performing a calibrated capture clock data capture.
16. The integrated circuit (IC) according to claim 9 , wherein the shift register changes the phase of the clock signal by using a set of windows.
17. The integrated circuit (IC) according to claim 16 , wherein the interface circuit selects a window from the set of windows that has a largest size.
18. The integrated circuit (IC) according to claim 17 , wherein the interface circuit calculates a center of the selected window.
19. The integrated circuit (IC) according to claim 9 , further comprising programmable logic circuitry coupled to the interface circuit.
20. The integrated circuit (IC) according to claim 9 , further comprising programmable interconnect circuitry coupled to the interface circuit.
21. An integrated circuit (IC), comprising:
a memory circuit; and
an interface circuit, coupled to the memory circuit, that receives a clock signal having a phase value, and provides to a source of the clock signal a signal to change the phase value of the clock signal; the clock signal adapted to clock the memory circuit during a data capture operation such that the results of the data capture operation meet a specified criterion.
22. The integrated circuit (IC) according to claim 21 , wherein the specified criterion comprises the results of the data capture being valid.
23. The integrated circuit (IC) according to claim 21 , wherein the phase value of the clock signal is selected by evaluating a range of phase values using a set of windows.
24. The integrated circuit (IC) according to claim 23 , wherein each window in the set of windows is evaluated to determine a pass condition or a fail condition.
25. The integrated circuit (IC) according to claim 21 , wherein the phase value of the clock is selected by changing the phase value of the clock signal over a range of phase values, and capturing data for each phase value in the range of phase values.
26. The integrated circuit (IC) according to claim 25 , wherein the data captured for each phase value in the range of phase values are evaluated.
27. The integrated circuit (IC) according to claim 25 , wherein the phase value of the clock signal is changed over a 360-degree range of phase values.
28. The integrated circuit (IC) according to claim 25 , wherein the phase value of the clock signal is changed over a 720-degree range of phase values.