Automated contact alignment tool
View Patent ↗An electronic testing machine that tests electronic components using test contacts is disclosed. A contact takes a plurality of electrical readings for a component retained in a test plate as the test plate is moved in microsteps. These electrical readings can be used to determine alignment and/or to correct alignment as necessary using an adjustment mechanism.
1. An electronic component testing machine, the machine including a test plate configured to retain a plurality of electronic components; the machine further including a plurality of test contacts and the test plate operatively connected to a motor such that the test plate is movable between a plurality of index positions such that each test contact comes into contact with a distinct electronic component to perform a discrete electrical test, the improvement comprising:
a motor controller configured to move the test plate in microsteps, the microsteps being a distance less than an index;
a controller configured to take multiple electrical measurements between an electronic component and a test contact for each microstep such that a plurality of electrical measurements is made between the test contact and at least one electronic component; and
means for adjusting the test contact to bring it into alignment based on the plurality of electrical measurements.
2. The electronic component testing machine as in claim 1 wherein the adjusting means comprises an adjustment screw configured to adjust a test head associated with the test contact.
3. The electronic component testing machine as in claim 1 wherein the adjusting means comprises an adjustment screw configured to adjust the test contact.
4. The electronic component testing machine as in claim 2 wherein the adjustment screw is configured to adjust the test contact in a theta orientation.
5. The electronic component testing machine as in claim 1 wherein the motor is a stepper motor.
6. The electronic component testing machine as in claim 1 wherein the controller is further configured to evaluate the plurality of electrical measurements to determine the alignment of the test contact.
7. The electronic component testing machine as in claim 1 wherein the adjusting means adjusts the test contact relative to a centerline, the centerline being a function of a fixed position on the test machine.
8. An electronic component testing machine, the machine including a test plate configured to retain a plurality of electronic components; the machine further including a plurality of test contacts and the test plate operatively connected to a motor such that the test plate is movable between a plurality of index positions such that each test contact comes into contact with a distinct electronic component to perform a discrete electrical test, the improvement comprising:
a motor controller configured to move the test plate in microsteps, the microsteps being a distance less than an index; and
a controller configured to take multiple electrical measurements between an electronic component and a test contact for each microstep such that a plurality of electrical measurements is made between the test contact and at least one electronic component and the controller configured to evaluate the plurality of electrical measurements to determine an alignment of the test contact.
9. The electronic component testing machine as in claim 8 , further comprising:
an adjustable connection supporting the test contact for adjustably bringing a misaligned test contact into alignment based on an evaluation of the plurality of electrical measurements.
10. The electronic component testing machine as in claim 8 wherein the alignment of the test contact is whether an intermittent contact condition exists.
11. The electronic component testing machine as in claim 8 wherein the controller is configured to evaluate the plurality of electrical measurements by comparing measurements for a single contact against a centerline to determine whether the alignment is leading or lagging.
12. The electronic component testing machine as in claim 11 wherein the centerline is between a pair of blow off holes located on the electronic testing machine.
13. The electronic component testing machine as in claim 11 wherein the centerline is a dynamic centerline.
14. The electronic component testing machine as in claim 8 wherein each index comprises about 200 microsteps.
15. The electronic component testing machine as in claim 8 wherein each test contact is part of a test head, the test head including a plurality of test contacts.
16. The electronic component testing machine as in claim 8 wherein the test head includes a theta adjustment and a y skew adjustment.