Optical-magnetic Kerr effect waveform testing
View Patent ↗System and methods are provided for optical-magnetic Kerr effect signal analysis. In one aspect, a test fixture is supplied having parallel conductive lines, with an input of a first line adjacent a resistively loaded output of a second line and a resistively loaded output of the first line adjacent an input of the second line. An optically transparent test region is interposed between the conductive lines, and a metallic reflector underlies the test region. A signal reference is supplied to the input of the first line and a signal under test is supplied to the input of the second line. A light beam having a first angle of polarization is focused through the test region onto the reflector. The intensity of the reflected light is measured and the similarity between the signal under test and the reference signal can be determined in response to the measured light intensity.
1. A method for optical-magnetic Kerr effect signal analysis, the method comprising:
supplying a test fixture including parallel conductive lines, with an input of a first line adjacent a resistively loaded output of a second line and a resistively loaded output of the first line adjacent an input of the second line, an optically transparent test region interposed between the conductive lines, and a metallic reflector underlying the test region;
supplying a signal reference to the input of the first line;
supplying a signal under test to the input of the second line;
focusing a light beam having a first angle of polarization through the test region onto the reflector;
measuring the intensity of the reflected light; and,
determining a similarity between the signal under test and the reference signal in response to the measured light intensity.
2. The method of claim 1 wherein measuring the intensity of the reflected light includes:
using an output polarizer to pass a particular polarization angle of the light; and,
measuring the light passing through the output polarizer.
3. The method of claim 2 wherein focusing the light beam with the first angle of polarization includes:
supplying a light source and an input polarizer; and,
adjusting the input polarizer to supply light having the first angle of polarization.
4. The method of claim 2 further comprising:
supplying the signal reference, but not the signal under test;
wherein using the output polarizer to pass the particular polarization of light includes calibrating the output polarizer to pass the first angle of polarization by adjusting the output polarizer to pass the maximum light intensity.
5. The method of claim 1 wherein supplying the signal reference to the input of the first line includes supplying an ac signal reference having a first frequency;
wherein measuring the intensity of light includes using a light detector having a frequency response slower that the first frequency and measuring a maximum light intensity; and,
wherein determining the similarity between the signal under test and the reference signal includes determining that the signals are different in response to measuring the maximum intensity.
6. The method of claim 1 wherein supplying the signal reference to the input of the first line includes supplying an ac signal reference having a first frequency and a plurality of information patterns; and,
wherein measuring the intensity of light includes using a light detector having a frequency response greater than the first frequency and measuring a maximum light intensity in a first period of time associated with a first information pattern; and,
wherein determining the similarity between the signal under test and the reference signal includes determining that the signals are different during the first period of time, in response to measuring the maximum intensity.