IP Library Granted Patent US 7,858,979
Granted Patent B2
US 7,858,979 · App. 12/475,013 · Granted Dec 28, 2010

Method of aligning deposited nanotubes onto an etched feature using a spacer

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Quick Facts
Patent No.
US 7,858,979
App. No.
12/475,013
Granted
Dec 28, 2010
Kind
B2
Abstract

A method of forming an aligned connection between a nanotube layer and a raised feature is disclosed. A substrate having a raised feature has spacers formed next to the side of the raised feature. The spacers are etched until the sidewalls of the raised feature are exposed forming a notched feature at the top of the spacers. A patterned nanotube layer is formed such that the nanotube layer overlies the top of the spacer and contacts a side portion of the raised feature in the notched feature. The nanotube layer is then covered with an insulating layer. Then a top portion of the insulating layer is removed to expose a top portion of the etched feature.

Claims (16)

1. A carbon nanotube electrical connection to a raised feature, the connection comprising:

a raised feature formed on a substrate, the raised feature having a top portion, and a sidewall;

a sidewall spacer formed next to the sidewall of the raised feature and exposing a portion of the sidewall near the top of the raised feature, thereby defining a notched region above the spacer;

a nanotube layer formed on the substrate such that the nanotube layer contacts an exposed portion of the sidewall and overlies the spacer in the notched region; and

an insulating layer on the substrate that covers the nanotube layer and leaves a portion of the top of the raised feature exposed.

2. The carbon nanotube electrical connection of claim 1 , wherein the raised feature comprises a raised metallization layer.

3. The carbon nanotube electrical connection of claim 1 , wherein the raised feature comprises a transistor gate stack.

4. The carbon nanotube electrical connection of claim 1 , wherein the raised feature comprises a metal-containing material.

5. The carbon nanotube electrical connection of claim 4 , wherein the metal-containing material comprises a material selected from among aluminum, tungsten, tantalum, and titanium.

6. The carbon nanotube electrical connection of claim 4 , wherein the metal-containing material comprise a metal alloy.

7. The carbon nanotube electrical connection of claim 4 , wherein the metal-containing material comprises a metal nitride.

8. The carbon nanotube electrical connection of claim 1 , wherein the raised feature comprises more than one layer of metal-containing material.

9. The carbon nanotube electrical connection of claim 1 , wherein the notched region extends downward exposing no more than half of the height of the side of the raised feature.

10. The carbon nanotube electrical connection of claim 1 , wherein the raised feature is formed using chemical mechanical polishing.

11. The carbon nanotube electrical connection of claim 1 , the raised feature is formed using etching.

12. The carbon nanotube electrical connection of claim 1 , wherein the insulating layer comprises silicon dioxide.

Assignments (2)
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jul 8, 2021
From: SILICON VALLEY BANK
To: NANTERO, INC.
Reel/Frame 056790/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Nov 11, 2020
From: NANTERO, INC.
To: SILICON VALLEY BANK
Reel/Frame 054383/0632 →