IP Library Granted Patent US 7,781,865
Granted Patent B2
US 7,781,865 · App. 12/476,923 · Granted Aug 24, 2010

MIM capacitor and metal interconnection

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Quick Facts
Patent No.
US 7,781,865
App. No.
12/476,923
Granted
Aug 24, 2010
Kind
B2
Abstract

Disclosed are an MIM (Metal-Insulator-Metal) capacitor and a method of manufacturing the same. The MIM capacitor includes: a lower metal layer and a lower metal interconnection on a substrate; a barrier metal layer on the lower metal layer; an insulating layer on the barrier metal layer; an upper metal layer on the insulating layer; an interlayer dielectric layer having a via hole on the lower metal interconnection; and a plug in the via hole.

Claims (32)

1. An MIM (Metal-Insulator-Metal) capacitor, the MIM capacitor comprising:

a plurality of lower capacitor electrode portions and a lower metal interconnection on a substrate, the lower capacitor electrode portions being spaced apart from one another;

a barrier metal layer on the plurality of lower capacitor electrode portions, the barrier metal layer covering a top surface and sidewalls of the lower capacitor electrode portions and the substrate between the lower capacitor electrode portions;

a conformal insulating layer on the barrier metal layer such that a gap exists in the conformal insulation layer between the lower capacitor electrode portions;

an upper capacitor electrode on the conformal insulating layer and in the gap between the lower capacitor electrode portions;

a dielectric layer on the lower metal interconnection and having a via hole therein; and

a plug in the via hole.

2. The MIM capacitor of claim 1 , further comprising an uppermost metal layer on the upper capacitor electrode and the plug.

3. The MIM capacitor of claim 1 , wherein the lower capacitor electrode portions and the lower metal interconnection are spaced apart from each other on the substrate.

4. The MIM capacitor of claim 1 , wherein the lower capacitor electrode portions and the lower metal interconnection include an Al alloy, a layer of Ti and/or TiN, or a composite layer thereof.

5. The MIM capacitor of claim 1 , wherein the barrier metal layer includes a Ti layer and a TiN layer.

6. The MIM capacitor of claim 1 , wherein the conformal insulating layer comprises a SiON layer.

7. The MIM capacitor of claim 1 , wherein the upper capacitor electrode and the plug include tungsten.

8. The MIM capacitor of claim 1 , wherein the barrier metal layer is on the only the lower capacitor electrode portions.

9. The MIM capacitor of claim 1 , wherein the barrier metal layer is not on the lower metal interconnection.

10. The MIM capacitor of claim 1 , wherein the barrier metal layer includes a Ti layer or a TiN layer.

11. An MIM (Metal-Insulator-Metal) capacitor, the MIM capacitor comprising:

a plurality of lower capacitor electrode portions and a lower metal interconnection on a substrate, the lower capacitor electrode portions being spaced apart from one another;

a barrier metal layer on the plurality of lower capacitor electrode portions, wherein the barrier metal layer covers a top surface and sidewalls of the lower capacitor electrode portions and the substrate between the lower capacitor electrode portions;

a conformal insulating layer on the barrier metal layer such that a gap exists in the conformal insulating layer between the lower capacitor electrode portions, the conformal insulating layer comprising a SiON layer;

an upper capacitor electrode on the conformal insulating layer and in the gap between the lower capacitor electrode portions;

a dielectric layer on the lower metal interconnection and having a via hole therein; and

a plug in the via hole.

12. The MIM capacitor of claim 11 , further comprising an uppermost metal layer on the upper capacitor electrode and the plug.

13. The MIM capacitor of claim 11 , wherein the lower capacitor electrode portions and the lower metal interconnection are spaced apart from each other on the substrate.

14. The MIM capacitor of claim 11 , wherein the lower capacitor electrode portions and the lower metal interconnection include an Al alloy, a layer of Ti and/or TiN, or a composite layer thereof.

15. The MIM capacitor of claim 11 , wherein the barrier metal layer includes a Ti layer and a TiN layer.

16. The MIM capacitor of claim 11 , wherein the upper capacitor electrode and the plug include tungsten.

17. The MIM capacitor of claim 11 , wherein the barrier metal layer is on the only the lower capacitor electrode portions.

18. The MIM capacitor of claim 11 , wherein the barrier metal layer is not on the lower metal interconnection.

19. The MIM capacitor of claim 1 , wherein the spacing between the lower capacitor electrode portions is from 0.1 μm to 0.5 μm.

20. The MIM capacitor of claim 11 , wherein the spacing between the lower capacitor electrode portions is from 0.1 μm to 0.5 μm.

Assignments (2)
CHANGE OF NAME Recorded Nov 30, 2017
From: DONGBU HITEK CO., LTD.
To: DB HITEK CO., LTD
Reel/Frame 044555/0913 →
MERGER AND CHANGE OF NAME Recorded Nov 29, 2017
From: DONGBU ELECTRONICS CO., LTD.; DONGBU HITEK CO., LTD.
To: DONGBU HITEK CO., LTD.
Reel/Frame 044533/0523 →