IP Library Granted Patent US 8,203,380
Granted Patent B2
US 8,203,380 · App. 12/483,668 · Granted Jun 19, 2012

Semiconductor device

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Quick Facts
Patent No.
US 8,203,380
App. No.
12/483,668
Granted
Jun 19, 2012
Kind
B2
Abstract

In a semiconductor device, a high-side driver is arranged in a region closer to a periphery of a semiconductor substrate than a high-side switch, and a low-side driver is arranged in a region closer to the periphery of the semiconductor substrate than the low-side switch. By this means, a path from a positive terminal of an input capacitor to a negative terminal of the input capacitor via the high-side switch and the low-side switch is short, a path from a positive terminal of a drive capacitor to a negative terminal of the drive capacitor via the low-side driver is short, and a path from a positive terminal of a boot strap capacitor to a negative terminal of the boot strap capacitor via the high-side driver is short, and therefore, the parasitic inductance can be reduced, and the conversion efficiency can be improved.

Claims (30)

1. A semiconductor device comprising:

a high-side switch having a drain electrically connected to an input power supply potential and a source electrically connected to an output wire;

a high-side driver for driving the high-side switch, electrically connected to an external bootstrap capacitor;

a low-side switch having a drain electrically connected to the output wire and a source electrically connected to a reference potential wire; and

a low-side driver for driving the low-side switch, electrically connected to an external drive capacitor,

the high-side switch, the high-side driver, the low-side switch, and the low-side driver being formed on the same semiconductor substrate, wherein

the high-side driver is arranged on a periphery side of the high-side switch in a region closer to a first periphery of the semiconductor substrate than the high-side switch;

the low-side driver is arranged on a periphery side of the low-side switch in a region closer to a second periphery of the semiconductor substrate than the low-side switch,

the high-side driver is arranged between the bootstrap capacitor and a region where the high-side switch is formed,

the low-side driver is arranged between the drive capacitor and a region where the low-side switch is formed, and

the periphery side of the high-side switch and the periphery side of the low-side switch are oppositely positioned to each other so as to sandwich the high-side switch and the low-side switch therebetween.

2. The semiconductor device according to claim 1 , wherein

bumps are used for connecting portions of the high-side switch and the low-side switch.

3. The semiconductor device according to claim 1 , wherein

a lateral MOSFET is used for the high-side switch and the low-side switch.

4. A semiconductor device comprising:

a high-side switch having a drain electrically connected to an input power supply potential and a source electrically connected to an output wire;

a high-side drivers for driving the high-side switch, including a first high-side driver electrically connected to an external bootstrap capacitor;

a low-side switch having a drain electrically connected to the output wire and a source electrically connected to a reference potential wire; and

a low-side drivers for driving the low-side switch, including a first low-side driver electrically connected to an external drive capacitor,

the high-side switch, the high-side drivers, the low-side switch, and the low-side drivers being formed on the same semiconductor substrate, wherein

the first high-side driver is arranged on a periphery side of the high-side switch in a region closer to a first periphery of the semiconductor substrate than the high-side switch, and a second one of the high-side drivers is arranged in a region closer to the center of the semiconductor substrate than the high-side switch;

the first low-side driver is arranged on a periphery side of the low-side switch in a region closer to a second periphery of the semiconductor substrate than the low-side switch, and a second one of the low-side drivers is arranged in a region closer to the center of the semiconductor substrate than the low-side switch;

the first high-side driver is arranged between the bootstrap capacitor and a region where the high-side switch is formed,

the first low-side driver is arranged between the drive capacitor and a region where the low-side switch is formed, and

the periphery side of the high-side switch and the periphery side of the low-side switch are oppositely positioned to each other so as to sandwich the high-side switch and the low-side switch therebetween.

5. The semiconductor device according to claim 4 , wherein

bumps are used for connecting portions of the high-side switch and the low-side switch.

6. The semiconductor device according to claim 4 , wherein

a lateral MOSFET is used for the high-side switch and the low-side switch.

Assignments (3)
MERGER Recorded Sep 15, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024987/0833 →
CHANGE OF NAME Recorded Sep 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024988/0161 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2009
From: HASHIMOTO, TAKAYUKI; HIRAO, TAKASHI; AKIYAMA, NOBORU
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 023521/0400 →