Methods and systems for semiconductor testing using a testing scenario language
View Patent ↗Methods and systems for semiconductor testing. In one embodiment, a semiconductor testing method includes one or more of the following stages: defining a rule relating to semiconductor testing, validating the rule, bundling the rule with other rules, correlating the rule with other rules, publishing the rule, actualizing the rule, and follow up relating to the rule. In one embodiment, a semiconductor testing system includes one or more of the following modules: rule creation module(s), analysis module(s), simulation module(s), real time production module(s), and offline production module(s). In one embodiment, user friendly graphical user interface(s) can be used for defining the building blocks of a rule and/or for viewing an optional hierarchy of categories to which the rule belongs.
1. A computer-implemented method of semiconductor testing, said method comprising:
defining a first semiconductor testing rule, said semiconductor testing rule relating to semiconductor testing;
validating said first semiconductor testing rule as being appropriate for a semiconductor testing system;
bundling said first semiconductor testing rule with other semiconductor testing rules;
correlating said first semiconductor testing rule with other semiconductor testing rules;
publishing said first semiconductor testing rule so that said rule is prepared for actualization; and
actualizing said published first semiconductor testing rule.
2. The method of claim 1 , wherein said actualizing said published first semiconductor testing rule comprises executing a simulation, said method further comprising:
analyzing said actualizing;
publishing said first semiconductor testing rule for production; and
actualizing said first semiconductor testing rule in production.
3. The method of claim 1 , wherein defining said first semiconductor testing rule comprises defining said rule at least in part on the basis of analysis of past semiconductor testing results.
4. The method of claim 1 , wherein said defining said first semiconductor testing rule includes: receiving input from a user.
5. The method of claim 1 , further comprising: following up on said actualizing.
6. A system for semiconductor testing, comprising:
a programmed computer; and
computer-readable memory having, tangibly embodied thereon:
means for defining a first semiconductor testing rule relating to semiconductor testing;
means for validating said first semiconductor testing rule as being appropriate for said semiconductor testing system;
means for bundling said first semiconductor testing rule with other semiconductor testing rules;
means for correlating said first semiconductor testing rule with other semiconductor testing rules;
means for publishing said first semiconductor testing rule so that said first semiconductor testing rule is prepared for actualization; and
means for actualizing said published first semiconductor testing rule.
7. A computer program product comprising a statutory machine readable memory having computer readable program code embodied therein for semiconductor testing, the computer program product comprising:
computer readable program code for causing a computer to define a first semiconductor testing rule relating to semiconductor testing;
computer readable program code for causing a computer to validate said first semiconductor testing rule as being appropriate for a semiconductor testing system;
computer readable program code for causing a computer to bundle said first semiconductor testing rule with other semiconductor testing rules;
computer readable program code for causing a computer to correlate said first semiconductor testing rule with other semiconductor testing rules;
computer readable program code for causing a computer to publish said first semiconductor testing rule so that said rule is prepared for actualization; and
computer readable program code for causing a computer to actualize said published first semiconductor testing rule.
8. The method of claim 1 , wherein defining a first semiconductor testing rule comprises defining a parameter associated with said rule.
9. The method of claim 8 , wherein defining a parameter comprises defining monitored data to be leveraged.
10. The method of claim 8 , wherein defining a parameter comprises defining a population of semiconductor devices upon which said rule is to be executed.
11. The method of claim 8 , wherein defining a parameter comprises defining an entry condition.
12. The method of claim 8 , wherein defining a parameter comprises defining a rule action to be taken if rule criteria are met.
13. The method of claim 8 , wherein defining a parameter comprises defining a validity condition to determine if the rule is still applicable.
14. The method of claim 8 , wherein defining a parameter comprises defining a run point, said run point being an event that triggers the rule.
15. The method of claim 8 , wherein defining a parameter comprises defining an end point.
16. The method of claim 8 , wherein defining a parameter comprises defining a rule scope.
17. The method of claim 8 , wherein defining a parameter comprises defining an algorithm object.
18. The method of claim 8 , wherein defining a parameter comprises defining a rule state.
19. The method of claim 8 , wherein defining a parameter comprises defining at least one of a name, description, comment, and rule ID.