IP Library Assignment 052838/0945
Patent Assignment
Reel/Frame 052838/0945

Release of Security Interest

Recorded: 2020-06-04 Pages: 4
Assignor
BANK LEUMI LE-ISRAEL B.M.
Executed: 2020-06-04
Assignee
OPTIMAL PLUS LTD.
18 EINSTEIN ST., NES-ZIONNA 74140, ISRAEL
Covered Properties (19)
Optimize Parallel Testing
Patent: 7,208,969 →
Application: 11/175,026 →
Publication: US 2007/0007981
Augmenting Semiconductor's Devices Quality and Reliability
Patent: 7,340,359 →
Application: 11/343,209 →
Publication: US 2006/0267577
Methods and Systems for Semiconductor Testing Using a Testing Scenario Language
Patent: 7,567,947 →
Application: 11/396,938 →
Publication: US 2007/0233629
Methods and Systems for Semiconductor Testing Using Reference Dice
Patent: 7,532,024 →
Application: 11/480,452 →
Publication: US 2008/0007284
Methods for Slow Test Time Detection of an Integrated Circuit During Parallel Testing
Patent: 7,528,622 →
Application: 11/646,588 →
Publication: US 2007/0132477
System and Methods for Parametric Test Time Reduction
Patent: 8,112,249 →
Application: 12/341,431 →
Publication: US 2010/0161276
Methods and Systems for Semiconductor Testing Using Reference Dice
Patent: 7,679,392 →
Application: 12/346,087 →
Publication: US 2009/0112501
Methods and Systems for Semiconductor Testing Using Reference Dice
Patent: 7,737,716 →
Application: 12/346,129 →
Publication: US 2009/0119048
Methods and Systems for Semiconductor Testing Using Reference Dice
Patent: 7,777,515 →
Application: 12/346,194 →
Publication: US 2009/0115445
Systems and Methods for Test Time Outlier Detection and Correction in Integrated Circuit Testing
Patent: 7,969,174 →
Application: 12/418,024 →
Publication: US 2009/0192754
Methods and Systems for Semiconductor Testing Using a Testing Scenario Language
Patent: 8,069,130 →
Application: 12/493,460 →
Publication: US 2009/0265300
System and Method for Binning at Final Test
Application: 12/497,798 →
Publication: US 2011/0000829
Misalignment Indication Decision System and Method
Patent: 8,838,408 →
Application: 12/944,363 →
Publication: US 2012/0123734
Systems and Methods for Test Time Outlier Detection and Correction in Integrated Circuit Testing
Patent: 8,421,494 →
Application: 13/113,409 →
Publication: US 2011/0224938
System and Methods for Parametric Testing
Patent: 8,781,773 →
Application: 13/164,910 →
Publication: US 2011/0251812
Systems and Methods for Test Time Outlier Detection and Correction in Integrated Circuit Testing
Patent: 8,872,538 →
Application: 13/803,268 →
Publication: US 2013/0193994
Systems and Methods for Test Time Outlier Detection and Correction in Integrated Circuit Testing
Patent: 9,529,036 →
Application: 14/492,392 →
Publication: US 2015/0012237
Dynamic Process for Adaptive Tests
Patent: 9,885,751 →
Application: 14/958,462 →
Publication: US 2017/0160342
Detection of Counterfeit Electronic Items
Patent: 9,767,459 →
Application: 15/069,284 →
Publication: US 2017/0262860
Related Assignments (13)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name May 20, 2014
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 032962/0973 →
Change of Name Jul 10, 2014
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 033295/0433 →
Change of Name Jul 10, 2014
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 033295/0398 →
Change of Name Sep 4, 2014
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 033685/0637 →
Corrective Assignment to Correct the Patent Number Previously Assigned as 7,657,947 to the Correct Patent Number 7,567,947 Previously Recorded on Reel 033295 Frame 0398. Assignor(S) Hereby Confirms the Assignment of Assignor's Interest. Oct 17, 2014
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 034036/0797 →
Assignment of Assignor's Interest Apr 23, 2015
From: BALOG, GIL; LINDE, REED; GOLAN, AVI
To: OPTIMAL PLUS LTD.
Reel/Frame 035482/0189 →
Change of Name Aug 5, 2015
From: OPTIMAL TEST LTD
To: OPTIMAL PLUS LTD
Reel/Frame 036283/0364 →
Security Interest Dec 3, 2019
From: OPTIMAL PLUS LTD.
To: BANK LEUMI LE-ISRAEL B.M.
Reel/Frame 051155/0161 →
Assignment of Assignor's Interest Apr 7, 2021
From: BALOG, GIL
To: OPTIMALTEST LTD.
Reel/Frame 055850/0658 →
Assignment of Assignor's Interest Apr 23, 2021
From: BALOG, GIL
To: OPTIMALTEST LTD.
Reel/Frame 056023/0860 →
Assignment of Assignor's Interest Apr 23, 2021
From: BALOG, GIL; LINDE, REED; GOLAN, AVI
To: OPTIMALTEST LTD.
Reel/Frame 056024/0281 →
Security Interest Jun 18, 2021
From: NATIONAL INSTRUMENTS CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 057280/0028 →
Release of Security Interest in Patents (Reel/Frame 057280/0028) Oct 13, 2023
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: NATIONAL INSTRUMENTS CORPORATION
Reel/Frame 065231/0466 →