Operation voltage supply method for semiconductor device
View Patent ↗The voltage application probe and the voltage measurement probe are connected to the voltage application pad and the voltage measurement pad of the semiconductor device. The voltage application pad and the voltage measurement pad are connected by the conductor, measuring the voltage applied to the voltage application pad through the voltage measurement probe. The voltage compensation circuit in the voltage development device operates to make the voltage applied to the voltage application pad equal to the set voltage for the voltage development device. Even when the resistance between the voltage application probe and the voltage application pad increases, the accurate setting voltage is applied to the voltage application pad.
1. An operation voltage supply method, comprising the steps of;
setting a set voltage of a variable voltage source of an operation voltage supply apparatus below 3.3 V;
contacting a voltage measurement probe of a prove card of the operation voltage supply apparatus with a voltage measurement pad of a semiconductor device, said voltage measurement probe including a first end electrically connected to an output terminal of the probe card and a second end electrically connected to the first end of the voltage measurement probe;
contacting a voltage application probe of a prove card of the operation voltage supply apparatus with a voltage application pad of the semiconductor device, said voltage application probe including a first end electrically connected to an input terminal of the probe card and a second end electrically connected to the first end of the voltage application probe; and
supplying an operation voltage to the voltage application pad of the semiconductor device from the operation voltage supply apparatus.
2. The operation voltage supply method according to claim 1 , wherein said operation voltage supply apparatus includes a voltage development device having the variable voltage source and a voltage compensation circuit, said voltage compensation circuit including a voltage input terminal for receiving the set voltage, an output terminal for outputting the operation voltage, and a measurement input terminal for receiving a measurement voltage from the voltage measurement pad.
3. The operation voltage supply method according to claim 2 , wherein said voltage compensation circuit is arranged to generate the operation voltage as a sum of the set voltage and a different between the set voltage and the measurement voltage.
4. The operation voltage supply method according to claim 2 , wherein said input terminal is connected to a voltage output terminal of the voltage compensation circuit, and said output terminal is connected to a measurement voltage input terminal of the voltage compensation circuit.
5. The operation voltage supply method according to claim 2 , which said operation voltage supply apparatus includes a first conductor for electrically connecting the output terminal and the voltage application probe, and a second conductor for electrically connecting the measurement input terminal and the voltage measurement probe.
6. The operation voltage supply method according to claim 1 , wherein said probe card include a plurality of voltage application probes, each of said voltage application probes being commonly connected to the output terminal.
7. The operation voltage supply method according to claim 1 , wherein said voltage application pad and said voltage measurement pad share a common pad.
8. The operation voltage supply method according to claim 1 , wherein said first end of the voltage application probe and said first end of the voltage measurement probe are located side by side each other, and said second end of the voltage application probe and said second end of the voltage measurement probe are located side by side each other.