Methods of Forming Electrical Interconnects Using Thin Electrically Insulating Liners in Contact Holes
Methods of forming integrated circuit devices include forming an electrically insulating layer having a contact hole therein, on a substrate, and then depositing an electrically insulating liner onto a sidewall of the contact hole using an atomic layer deposition (ALD) technique. This electrically insulating liner, which may include gelatinous silica or silicon dioxide, for example, may be deposited to a thickness in a range from 40 Å to 100 Å. A portion of the electrically insulating liner is then removed from a bottom of the contact hole and a barrier metal layer is then formed on the electrically insulating liner and on a bottom of the contact hole. The step of forming the barrier metal layer may be followed by filling the contact hole with a metal interconnect.
1 . A method of forming an integrated circuit device, comprising:
forming an electrically insulating layer having a contact hole therein, on a substrate;
depositing an electrically insulating liner onto a sidewall of the contact hole using an atomic layer deposition (ALD) technique;
removing a portion of the electrically insulating liner from a bottom of the contact hole; and then
forming a barrier metal layer on the electrically insulating liner.
2 . The method of claim 1 , wherein said depositing step comprises depositing the electrically insulating liner at a temperature in a range from about 75° C. to about 150° C.
3 . The method of claim 1 , wherein said removing step is preceded by a step of densifying the electrically insulating liner in a vacuum having a pressure in a range from about 0.5 torr to about 1.5 torr.
4 . The method of claim 3 , wherein densifying the electrically insulating liner comprises annealing the electrically insulating liner at a temperature in a range from about 250° C. to about 500° C.
5 . The method of claim 1 , wherein said removing step comprises anisotropically etching the portion of the electrically insulating liner from the bottom of the contact hole.
6 . The method of claim 1 , wherein said removing step is preceded by a step of annealing the electrically insulating liner at a temperature in a range from about 250° C. to about 500° C.
7 . The method of claim 6 , wherein the deposited electrically insulating liner comprises gelatinous silica.
8 . The method of claim 1 , wherein depositing an electrically insulating liner comprises depositing an electrically insulating liner having a thickness in a range from about 40 Å to about 100 Å onto the sidewall of the contact hole.
9 . The method of claim 8 , wherein the electrically insulating liner comprises silicon dioxide.
10 . The method of claim 1 , wherein forming a barrier metal layer is followed by filling the contact hole with a metal interconnect.
11 . The method of claim 10 , wherein the barrier metal layer comprises titanium; and wherein the metal interconnect comprises copper.
12 . The method of claim 4 , wherein densifying the electrically insulating liner comprises annealing the electrically insulating liner at a temperature in a range from about 400° C. to about 500° C.
13 . The method of claim 4 , wherein densifying the electrically insulating liner comprises annealing the electrically insulating liner at a temperature in a range from about 400° C. to about 500° C., for a duration in a range between 30 seconds and two minutes.
14 . A method of forming an integrated circuit device, comprising:
forming a plurality of gate electrodes on a semiconductor substrate;
forming an electrically insulating layer on the plurality of gate electrodes;
forming a contact hole that extends through the electrically insulating layer and exposes a portion of the semiconductor substrate extending adjacent at least one of the plurality of gate electrodes;
depositing an electrically insulating liner onto a sidewall of the contact hole using an atomic layer deposition (ALD) technique;
densifying the electrically insulating liner by annealing the electrically insulating liner at a temperature in a range from about 250° C. to about 500° C.;
anisotropically etching a portion of the electrically insulating liner at a bottom of the contact hole for a sufficient duration to expose the semiconductor substrate; then
forming a barrier metal layer on the electrically insulating liner; and then
filling the contact hole with a metal interconnect.
15 . The method of claim 14 , wherein depositing an electrically insulating liner onto a sidewall of the contact hole comprises depositing a gelatinous silica layer onto the sidewall of the contact hole.
16 . The method of claim 15 , wherein depositing a gelatinous silica layer onto the sidewall of the contact hole comprises reacting a silicon halide with water at a temperature in a range from 75° C. to 150° C.
17 . The method of claim 16 , wherein the silicon halide is Si 2 Cl 6 .
18 . A method of forming an integrated circuit device, comprising:
forming an electrically insulating layer having a contact hole therein, on a substrate;
depositing a gelatinous silica layer onto the sidewall of the contact hole by reacting a silicon halide with water at a temperature in a range from 75° C. to 150° C.;
densifying the gelatinous silica layer by annealing the gelatinous silica layer at a temperature in a range from about 250° C. to about 500° C.;
removing a portion of the densified gelatinous silica layer from a bottom of the contact hole; and then
filling the contact hole with an electrical interconnect.
19 . The method of claim 18 , wherein the silicon halide is Si 2 Cl 6 .
20 . The method of claim 18 , wherein densifying the gelatinous silica layer comprises densifying the gelatinous silica layer in a vacuum having a pressure in a range from about 0.5 torr to about 1.5 torr.