IP Library Granted Patent US 8,143,698
Granted Patent B2
US 8,143,698 · App. 12/535,282 · Granted Mar 27, 2012

Semiconductor device

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Quick Facts
Patent No.
US 8,143,698
App. No.
12/535,282
Granted
Mar 27, 2012
Kind
B2
Abstract

A problem of an increased manufacturing cost is caused in conventional semiconductor devices. A semiconductor device 1 includes: a lower electrode 102 provided on a semiconductor substrate 101 ; an insulating film 105 , provided on the lower electrode 102 so as to be in contact with the lower electrode 102 ; an upper electrode 103 , provided on the insulating film 105 so as to be in contact with the insulating film 105 ; an opening portion 121 , provided in the lower electrode 102 and extending through the lower electrode 102 ; and an opening portion 122 , provided in the upper electrode 103 and extending through the upper electrode 103 . The insulating film 123 is embedded in the opening portion 121 that is provided in the lower electrode 102 . Similarly, the insulating film 124 is embedded in the opening portion 122 that is provided in the upper electrode 103.

Claims (11)

1. A semiconductor device, comprising:

a first electrode provided on a semiconductor substrate;

a capacitive film, provided on said first electrode so as to be in contact with the first electrode;

a second electrode, provided on said capacitive film so as to be in contact with the capacitive film, said second electrode, said first electrode and said capacitive film constituting a capacitor element;

a first opening portion, provided in said first electrode and extending through the first electrode; and

a second opening portion, provided in said second electrode and extending through the second electrode,

wherein insulating films are embedded within said first opening portion and said second opening portion,

wherein a width of said first opening portion is equal to or shorter than a thickness of said first electrode and a width of said second opening portion is equal to or shorter than a thickness of said second electrode, and

wherein an orthogonal projection of said first opening portion to a plane that is parallel to a substrate surface of said semiconductor substrate is identical with an orthogonal projection of said second opening portion to said plane.

2. The semiconductor device according to claim 1 , wherein said first opening portion and said second opening portion are slit-shaped in plan view.

3. The semiconductor device according to claim 1 , wherein a plurality of said first opening portions and a plurality of said second opening portions are provided, and are arranged to form a lattice pattern in plan view.

Assignments (3)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025193/0156 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 4, 2009
From: YOSHINAGA, CHIKASHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023050/0095 →