IP Library › Granted Patent US 8,359,927
Granted Patent B2
US 8,359,927 · App. 12/539,853 · Granted Jan 29, 2013

Molded differential PRT pressure sensor

Inventors: Stephen R. Hooper (Mesa, AZ); James D. MacDonald (Chandler, AZ); William G. McDonald (Payson, AZ)
Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 8,359,927
App. No.
12/539,853
Granted
Jan 29, 2013
Kind
B2
Abstract

A method and apparatus are described for fabricating an exposed differential pressure sensor ( 30 ) which protects interior electrical components ( 37 ) formed on a topside surface of a differential pressure sensor transducer die ( 31 ) from corrosive particles using a molding compound ( 39 ), but which vents both sides of a piezoresistive transducer sensor diaphragm ( 33 ) through a first vent hole ( 42 ) formed in an exposed die flag ( 36 ) and a second vent hole ( 38 ) formed in an exposed cap structure ( 33 ), enabling the sensor diaphragm ( 33 ) to sense differential pressure variations directly or indirectly through a protective gel.

Claims (40)

1. A packaged differential pressure sensor, comprising:

an exposed die flag in which a first vent hole is formed;

a differential pressure sensor transducer die comprising a sensor diaphragm located between a backside and topside of the differential pressure sensor transducer die and sensor circuitry located on the topside of the differential pressure sensor transducer die, where the backside of the differential pressure sensor transducer is affixed to the exposed die flag so that a backside of the sensor diaphragm is directly vented to the environment through the first vent hole in the exposed die flag;

a cap structure in which a second vent hole is located, where the cap structure is attached to the topside of the differential pressure sensor transducer die and so that the topside of the sensor diaphragm is vented to the environment through the second vent hole in the cap structure;

one or more electrical connectors that are electrically coupled to the sensor circuitry located on the topside of the differential pressure sensor transducer die; and

a molded body formed at least partially around the electrical connectors and around the differential pressure sensor transducer die without covering the first vent hole in the exposed die flag or the second vent hole in the cap structure, where the molded body covers the sensor circuitry located on the topside of the differential pressure sensor transducer die.

2. The packaged differential pressure sensor of claim 1 , where the cap structure is die bonded to the differential pressure sensor transducer die.

3. The packaged differential pressure sensor of claim 1 , where the exposed die flag is in substantially the same plane as a plurality of lead frame elements forming at least part of the electrical connectors so that the exposed die flag and plurality of lead frame elements are exposed at a bottom surface of the molded body.

4. The packaged differential pressure sensor of claim 1 , where the cap structure comprises a top surface in which the second vent hole is located, wherein the top surface of the cap structure and the second vent hole are exposed at a top surface of the molded body.

5. The packaged differential pressure sensor of claim 1 , where the differential pressure sensor transducer die comprises a piezoresistive transducer die.

6. The packaged differential pressure sensor of claim 1 , where the differential pressure sensor transducer die comprises a piezoresistive transducer die formed from a monocrystalline silicon substrate layer in which an opening is formed to define the sensor diaphragm.

7. The packaged differential pressure sensor of claim 1 , where the one or more electrical connectors comprise:

one or more bond pads located on the topside of the differential pressure sensor transducer die;

a wire connector connected to each of the one or more bond pads; and

a lead frame element connected to each wire connector, where the lead frame element extends through the molded body.

8. The packaged differential pressure sensor of claim 1 , where the molded body comprises a QFN (Quad Flat No leads), SOIC (Small-Outline Integrated Circuit), QFP (Quad Flat Package), or LGA (Land Grid Array) packaging body.

9. A method for packaging an exposed differential pressure sensor, comprising:

affixing a piezoresistive transducer die to a die flag so that a differential sensor diaphragm formed on the piezoresistive transducer die has a backside that is vented through a first vent hole formed in the die flag;

attaching a cap structure having a second vent hole to a topside of the piezoresistive transducer die so that the differential sensor diaphragm formed on the piezoresistive transducer die has a topside that is vented through the second vent hole in the cap structure;

electrically connecting circuitry located on the topside of the piezoresistive transducer die to one or more electrical connectors; and

forming a molded body at least partially around the one or more electrical connectors and around the piezoresistive transducer die to cover at least the circuitry on the topside of the piezoresistive transducer die without covering the first vent hole in the exposed die flag or the second vent hole in the cap structure.

10. The method of claim 9 , where affixing the piezoresistive transducer die to the die flag comprises die bonding a backside of the piezoresistive transducer die to a lead frame so that the differential sensor diaphragm formed on the backside of the piezoresistive transducer die is aligned with the first vent hole formed in the die flag.

11. The method of claim 9 , where affixing the piezoresistive transducer die to the die flag comprises attaching a backside of the piezoresistive transducer die to a lead frame comprising an exposed die flag that is in substantially the same plane as a plurality of lead frame elements forming at least part of the electrical connectors so that the exposed die flag and plurality of lead frame elements are exposed at a bottom surface of the molded body.

12. The method of claim 9 , where the piezoresistive transducer die comprises a monocrystalline silicon substrate layer having a backside surface in which an opening is formed to define the backside of the differential sensor diaphragm.

13. The method of claim 9 , where electrically connecting circuitry comprises wire coupling one or more bond pads located on the topside of the piezoresistive transducer die to one or more lead frame electrical connectors.

14. The method of claim 9 , where electrically connecting circuitry comprises thermosonically bonding wire connectors to electrically connect one or more bond pads located on the topside of the piezoresistive transducer die to one or more lead frame electrical connectors.

15. The method of claim 9 , where forming the molded body comprises overmolding or transfer molding a composite material to cover at least the circuitry on the topside of the piezoresistive transducer die without covering the first vent hole in the exposed die flag or the second vent hole in the cap structure.

16. The method of claim 9 , where forming the molded body comprises forming a QFN (Quad Flat No leads), SOIC (Small-Outline Integrated Circuit), QFP (Quad Flat Package), or LGA (Land Grid Array) packaging body.

17. A packaged differential sensor, comprising:

a piezoresistive transducer die having a differential sensor diaphragm with first and second sensor surfaces;

an exposed pad attached to the piezoresistive transducer die having a first vent hole located in the exposed pad for venting the first sensor surface of the differential sensor diaphragm to a first external environment;

a cap structure attached to the piezoresistive transducer die having a second vent hole located in the cap structure for venting the second sensor surface of the differential sensor diaphragm to a second external environment;

a housing formed to surround and protect the piezoresistive transducer die without covering the first and second vent holes; and

at least a first electrical connector protruding through said housing that is electrically coupled to the piezoresistive transducer die.

18. The packaged differential pressure sensor of claim 17 , where the first electrical connector comprises:

one or more bond pads located on the piezoresistive transducer die;

a wire connector connected to each of the one or more bond pads; and

a lead frame element connected to each wire connector, where the lead frame element extends through the housing.

19. The packaged differential pressure sensor of claim 17 , where the housing comprises a QFN (Quad Flat No leads), SOIC (Small-Outline Integrated Circuit), QFP (Quad Flat Package), or LGA (Land Grid Array) packaging body.

20. The packaged differential pressure sensor of claim 17 , where the cap structure comprises a silicon cap that is mounted to the piezoresistive transducer die with glass frit, direct bonding, epoxy, fusion bonding, or solvent bonding so that the second vent hole is aligned with the second sensor surface of the differential sensor diaphragm.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0854 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Feb 3, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 023882/0834 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2009
From: HOOPER, STEPHEN R.; MACDONALD, JAMES D.; MCDONALD, WILLIAM G.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 023090/0743 →
Continuity (1)
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