Single wafer fabrication process for wavelength dependent reflectance for linear optical serialization of accelerometers

1. An apparatus comprising:

a plurality of Fabry-Perot interferometric sensors optically coupled in series with each other to form an ordered optical series, each Fabry-Perot interferometric sensor having a unique signalband and a passband, each Fabry-Perot interferometric sensor having its unique signalband within the passbands of all of the next higher ordered Fabry-Perot interferometric sensors in the optical series so that a corresponding unique fringe signal from each of the Fabry-Perot interferometric sensors is a multiplexed output from the optical series; and

wherein each Fabry-Perot interferometric sensor comprises an accelerometer having a reference plate and a proof mass plate coupled to the reference plate and movable with respect thereto, the reference plate and proof mass plate having optically treated surfaces to form an optical resonance cavity between each other, the optical resonance cavities of the plurality of accelerometers being serially optically coupled with each other to form the ordered optical series.

2. The apparatus of claim 1 where each Fabry-Perot interferometric sensor is characterized by wavelength-dependent reflectance.

3. The apparatus of claim 1 where the plurality of Fabry-Perot interferometric sensors are optically coupled with each other to form a simply connected linear array along a beam of light.

4. The apparatus of claim 1 where each Fabry-Perot interferometric sensor comprises a thin film multilayer reflector.

5. The apparatus of claim 4 where the thin film multilayer reflector comprises a quarter wave multilayer reflector.

6. The apparatus of claim 5 further comprising two quarter wave reflectors with an intervening half wave dielectric layer therebetween.

7. The apparatus of claim 1 where each Fabry-Perot interferometric sensor comprises a Rugate thin film reflector.

8. The apparatus of claim 1 further comprising a broadband light input optically coupled to a first one of the Fabry-Perot interferometric sensors of the ordered optical series and an optical detector optically coupled to the a last one of the Fabry-Perot interferometric sensors of the ordered optical series.

9. The apparatus of claim 1 where each of the Fabry-Perot interferometric sensors is a seismic accelerometer with integrated optical signal wavelength multiplexing capability.

10. A method of using the plurality of Fabry-Perot interferometric sensors of claim 1 for acceleration sensing at multiple points over a distributed area, including, but not limited to large system or vehicle monitoring, structural health monitoring, tactical or border monitoring.

11. An apparatus comprising: a plurality seismic accelerometers, each seismic accelerometer having a reference plate and a proof mass plate coupled to the reference plate and movable with respect thereto, the reference plate and proof mass plate having optically treated surfaces to form an optical resonance cavity between each other forming a corresponding Fabry-Perot interferometric sensor, the optical resonance cavities of the plurality of accelerometers being serially optically coupled with each other to form an ordered optical series, each Fabry-Perot interferometric sensor having a unique signalband and a passband, each Fabry-Perot interferometric sensor having its unique signalband within the passbands of all of the next higher ordered Fabry-Perot interferometric sensors in the optical series so that a corresponding unique fringe signal from each of the Fabry-Perot interferometric sensors is a multiplexed output from the optical series.