IP Library › Granted Patent US 8,102,528
Granted Patent B2
US 8,102,528 · App. 12/549,781 · Granted Jan 24, 2012

Particle standard and method of calibrating or validating an optical particle analyzer

Assignee: Brightwell Technologies Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,102,528
App. No.
12/549,781
Granted
Jan 24, 2012
Kind
B2
Abstract

The present invention provides a particle standard including particles having optical properties similar to those of a carrier in which the particles are dispersed, as well as a method of calibrating or validating a subject optical particle analyzer with respect to a reference optical particle analyzer by using the particle standard. In the method, the particle standard is analyzed with the reference optical particle analyzer to obtain a reference particle concentration and a reference particle-size distribution. Analogously, the particle standard is analyzed with the subject optical particle analyzer to obtain a subject particle concentration and a subject particle-size distribution. The subject particle concentration and the subject particle-size distribution are then compared to the reference particle concentration and the reference particle-size distribution, respectively, and the subject optical particle analyzer is adjusted accordingly.

Claims (10)

1. A method of calibrating or validating a subject optical particle analyzer with respect to a reference optical particle analyzer, comprising:

a) providing a particle standard comprising:

a carrier; and

particles dispersed in the carrier, wherein the particles have particle sizes within a reference particle-size range of the reference optical particle analyzer, and wherein the particles have optical properties similar to those of the carrier, such that less than substantially all of the particles are detectable by the reference optical particle analyzer;

b) analyzing the particle standard with the reference optical particle analyzer to obtain a reference particle concentration and a reference particle-size distribution;

c) analyzing the particle standard with the subject optical particle analyzer to obtain a subject particle concentration and a subject particle-size distribution;

d) comparing the subject particle concentration to the reference particle concentration and the subject particle-size distribution to the reference particle-size distribution to determine a first difference and a second difference, respectively; and

e) adjusting the subject optical particle analyzer on the basis of the first difference and the second difference, wherein said adjusting includes adjusting software or hardware of the subject optical particle analyzer.

2. The method of claim 1 , wherein b) includes making a record of the reference particle concentration and the reference particle-size distribution, and associating the record with the particle standard.

3. The method of claim 1 , further comprising, prior to c), coarsely calibrating or validating the subject optical particle analyzer, wherein e) includes adjusting the subject optical particle analyzer on the basis of the first difference and the second difference to finely calibrate or validate the subject optical particle analyzer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2013
From: BRIGHTWELL TECHNOLOGIES INC.
To: PROTEINSIMPLE
Reel/Frame 030691/0449 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2009
From: MERCHANT, CLARK ADRIEN; OMA, PETER
To: BRIGHTWELL TECHNOLOGIES INC.
Reel/Frame 023165/0379 →
Continuity (3)
Continuation In Part 12209260 · Sep 12, 2008
Provisional Application 60971935 · Sep 13, 2007
Related Publication 20090308133A1 · Dec 17, 2009