Methods and systems for interferometric analysis of surfaces and related applications
A method for determining a spatial property of an object includes obtaining a scanning low coherence interference signal from a measurement object that includes two or more interfaces. The scanning low coherence interference signal includes two or more overlapping low coherence interference signals, each of which results from a respective interface. Based on the low coherence interference signal, a spatial property of at least one of the interfaces is determined. In some cases, the determination is based on a subset of the low coherence interference signal rather than on the entirety of the signal. Alternatively, or in addition, the determination can be based on a template, which may be indicative of an instrument response of the interferometer used to obtain the low coherence interference signal.
1. A method, comprising:
providing an article comprising a semiconductor wafer supporting at least one layer of material different from the semiconductor;
directing test light to reflect from the article, the reflected test light comprising light reflected from both a top interface and a bottom interface of at least one of the layers of material different from the semiconductor;
obtaining a low coherence interference signal including first and second overlapping interference patterns corresponding to the test light reflected from the top and bottom interfaces;
determining spatial information about the at least one layer of material based on the low coherence interference signal, wherein determining the spatial information comprises identifying an asymmetric subset of the overlapping interference patterns having a greater contribution from either the first or second interference pattern than the other interference pattern; and
processing the article based on the spatial information.
2. The method of claim 1 , wherein determining the spatial information comprises transforming the asymmetric subset.
3. The method of claim 1 , wherein the low coherence interference signal is obtained by imaging the article onto a detector, which acquires multiple low coherence signals each corresponding to a different area of the article.
4. The method of claim 1 , wherein the top interface is an outer surface of the article.
5. The method of claim 1 , wherein the top and bottom interfaces are separated by 1,000 nm or less.
6. The method of claim 1 , wherein processing the article comprises photolithographically processing the article.
7. The method of claim 6 , wherein the at least one layer is a layer of a photoresist and photolithographically processing the article comprises imaging a pattern onto the photoresist.
8. The method of claim 1 , wherein processing the article comprises polishing a surface of the article.
9. The method of claim 8 , wherein the spatial information comprises topography information about the surface and processing the article comprises adjusting the polishing based on the topography information.
10. The method of claim 9 , wherein adjusting the polishing comprises changing a pressure or pressure distribution of a pad used for the polishing, a characteristic of an agent used for the polishing, or a composition or flow of a solvent used for the polishing.
11. The method of claim 1 , wherein processing the wafer comprises scribing the wafer.
12. The method of claim 11 , wherein conditions of the scribing are adjusted based on the spatial information.
13. The method of claim 1 , wherein the material is a dielectric material.
14. The method of claim 1 , wherein the material is a photoresist.
15. The method of claim 1 , wherein the spatial information is a topography of the top or bottom interface, or a thickness or refractive index of the at least one layer.
16. A process for manufacturing an electronic circuit using the method of claim 1 , the process comprising:
forming a processed article using the method of claim 1 ; and
forming an electronic circuit from the processed article.
17. A method for determining a spatial property of an article, the method comprising:
providing a low coherence interference signal obtained from a first object using an interferometer; and
determining a spatial property of the article based upon the low coherence interference signal and a template indicative of a response of the interferometer,
wherein the article comprises a semiconductor wafer supporting at least one layer of material different from the semiconductor and the template is asymmetric.
18. A method comprising:
acquiring a low coherence interference signal including first and second overlapping interference patterns corresponding to the test light reflected from a surface of a photoresist film and at least one interface beneath the surface, respectively; and
determining a spatial property of the photoresist film based on the interference signal, wherein determining the spatial property comprises identifying an asymmetric portion of the interference signal corresponding to the first or second interference patterns.