Process for fabricating piezoelectrically actuated ultrananocrystalline diamond tip array integrated with ferroelectric or phase change media for high-density memory

1. A process for fabricating a piezoactuated storage device having a tip array and a memory media, comprising the steps of:

photolithographing a surface of a silicon (Si) wafer to define regions of substantially microscale or nanoscale square or rectangular regions;

etching the regions on the surface of the silicon wafer to produce substantially pyramidal etch pits by anisotropic etching or chemical etching with potassium hydroxide (KOH);

growing an oxide layer on a top surface of the silicon wafer and in the substantially pyramidal etch pits to produce oxidation sharpening of the substantially pyramidal etch pits;

forming an array of conductive tips of a nanocarbon film of nanostructured carbon material by deposition, said nanostructured carbon material being selected from the group consisting of: ultrananocrystalline diamond (UNCD), ta-C, and diamond-like carbon films;

forming an oxygen diffusion barrier layer by deposition of a TiAl, TaAl, or any other oxygen diffusion barrier layer material on the nanocarbon film;

providing a bottom electrode by deposition of platinum (PT), or other oxidation-resistant metal, or a conductive oxide layer, over the oxygen diffusion barrier layer and over the top part of the array of conductive tips;

photolithographing and reactive ion etching the bottom electrode to define substantially parallel lower metallic strips;

forming a piezoelectric layer by deposition of a piezoelectric thin film over the bottom electrode;

forming a top electrode by deposition of platinum or other oxidation-resistant metal, or a conductive oxide layer, over the piezoelectric layer;

photolithographing and reactive ion etching the top electrode to define substantially parallel upper metallic strips and arranging the upper metallic strips at about a 90° orientation with respect to the lower metallic strips;

encapsulating a protection coating on the piezoactuated storage device; and

etching oxide on the bottom side of silicon wafer to define access at least one opening for the conductive tips so that the conductive tips can move in contact with the memory layer to imprint information in the piezoactuated storage device.

2. A process for fabricating a piezoactuated storage device in accordance with claim 1 , including:

forming a ferroelectric/electrically conductive heterostructure; and wherein

said memory layer is formed by deposition of a polarizable memory layer selected from the group consisting of a ferroelectric layer comprising PbZr x Ti 1-x O 3 (PZT) or any other polarizable ferroelectric material.

3. A process for fabricating a piezoactuated storage device in accordance with claim 1 , including:

forming a piezoactuated storage device with a phase change memory media; and wherein

said memory layer is formed by deposition of a phase change memory layer of a phase change material exhibiting two orders of magnitude difference in electrical resistance between amorphous and crystalline phases.

4. A process for fabricating a piezoactuated storage device in accordance with claim 1 , wherein:

said conductive tips are fabricated to form an array of tips; and

said metal of said lower or said upper metallic strips comprises platinum (Pt) or an oxidation-resistant metal, or an electrically conductive oxide layer.