IP Library Granted Patent US 7,855,403
Granted Patent B2
US 7,855,403 · App. 12/569,460 · Granted Dec 21, 2010

Hybrid carbon nanotube FET (CNFET)-FET static RAM (SRAM) and method of making same

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,855,403
App. No.
12/569,460
Granted
Dec 21, 2010
Kind
B2
Abstract

Hybrid carbon nanotube FET (CNFET), static ram (SRAM) and method of making same. A static ram memory cell has two cross-coupled semiconductor-type field effect transistors (FETs) and two nanotube FETs (NTFETs), each having a channel region made of at least one semiconductive nanotube, a first NTFET connected to the drain or source of the first semiconductor-type FET and the second NTFET connected to the drain or source of the second semiconductor-type FET.

Claims (9)

1. An intermediate SRAM structure comprising:

an organized and structured arrangement of SRAM cells, each SRAM cell having

two semiconductor-type field effect transistors (FETs), each FET having a semiconductor drain region and a semiconductor source region of a first type of semiconductor material, and each FET having a semiconductor channel region positioned between respective drain and source regions, said channel region made of a second type of semiconductor material, each FET further having a gate node in proximity to a respective channel region so as to be able to modulate the conductivity of the channel by electrically stimulating the gate, wherein the two semiconductor-type FETs are cross-coupled so that gate of one FET connects to the drain or source of the other; and

two nanotube FETs (NTFETs), each having a channel region made of non-woven nanotube fabric, connected to a respective source and drain region of a corresponding NTFET, a first NTFET connected to the drain or source of the first semiconductor-type FET and the second NTFET connected to the drain or source of the second semiconductor-type FET;

burn-off circuitry to electrically stimulate the channel regions of the NTFETs to fail nanotubes of metallic type while leaving at least one nanotube of semiconductor type.

2. The intermediate SRAM cell of claim 1 wherein SRAM cell select transistors are used as burn-off select transistors.

3. The intermediate SRAM cell of claim 2 wherein select transistors are controlled by dedicated burn-off circuitry.

4. The intermediate SRAM cell of claim 3 wherein burn-off control circuits are operational prior to completion of chip wiring.

5. The intermediate SRAM cell of claim 4 wherein burn-off control circuits are operational prior to formation of SRAM functional circuits.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jul 8, 2021
From: SILICON VALLEY BANK
To: NANTERO, INC.
Reel/Frame 056790/0001 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Nov 11, 2020
From: NANTERO, INC.
To: SILICON VALLEY BANK
Reel/Frame 054383/0632 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2010
From: BERTIN, CLAUDE L.; MEINHOLD, MITCHELL; KONSEK, STEVEN L.; RUECKES, THOMAS; GUO, FRANK
To: NANTERO, INC.
Reel/Frame 025093/0732 →