Stacking devices at finished package level
An embodiment is a method and apparatus to stack devices. A first finished package level (FPL) device having a first grounded tested die (GTD) is reduced to nearly size of the first GTD. The first FPL has a first plurality of solder balls. The reduced first FPL device is attached to a first substrate to form a first device assembly.
1. A method comprising:
reducing a first finished package level (FPL) device having a first grounded tested die (GTD) to nearly size of the first GTD, the first FPL having a first plurality of solder balls; and
attaching the reduced first FPL device to a first substrate to form a first device assembly,
wherein the first FPL being a device that is previously tested and packaged by an IC manufacturer.
2. The method of claim 1 wherein reducing comprises:
grinding left and right sides of the first FPL device to nearly the size of the first GTD; and
grinding top surface of the first FPL device.
3. The method of claim 1 wherein attaching comprises:
applying a solder paste to the first substrate; and
reflowing the solder paste.
4. The method of claim 3 wherein attaching further comprises:
seating the reduced first FPL device into the first substrate having clearing holes that fit the first plurality of solder balls such that the solder balls are inserted into the clearing holes.
5. The method of claim 1 further comprising:
reducing a second FPL device having a second GTD to nearly size of the second GTD, the second FPL having a second plurality of solder balls;
attaching the reduced second FPL device to a second substrate to form a second device assembly; and
stacking the second device assembly on top of the first device assembly.
6. The method of claim 5 wherein stacking comprises:
attaching the second substrate to the reduced first FPL device.
7. The method of claim 5 further comprising:
wire bonding the second substrate to the first substrate; and
encapsulating the second device assembly and the first device assembly.
8. The method of claim 1 wherein attaching the reduced first FPL device to the first substrate comprises:
stepping the first substrate to a predetermined thickness, the stepped first substrate having a cavity; and
attaching the reduced first FPL device to top surface of the stepped first substrate.
9. The method of claim 8 further comprising:
reducing a second FPL device having a second GTD to nearly size of the second GTD, the second FPL having a second plurality of solder balls;
attaching the reduced second FPL device to bottom surface of the stepped first substrate into the cavity; and
encapsulating the reduced first FPL device.
10. The method of claim 1 wherein the first FPL device is a ball grid array (BGA) device.