NITRIDE SEMICONDUCTOR FREESTANDING SUBSTRATE AND MANUFACTURING METHOD OF THE SAME, AND LASER DIODE

1 . A nitride semiconductor freestanding substrate, with a dislocation density set to be 4×10 6 /cm 2 or less in a surface of the nitride semiconductor freestanding substrate, having an in-surface variation of directions of crystal axes along the substrate surface at each point on the substrate surface, with this variation of the directions of the crystal axes along the substrate surface set to be in a range of ±0.2° or less.

2 . The nitride semiconductor freestanding substrate according to claim 1 , having an in-surface variation of the directions of the crystal axes along a vertical line on the substrate surface at each point in the surface of the substrate, with this variation of the directions of the crystal axes along the vertical line on the substrate surface set to be in the range of ±0.2° or less.

3 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is C-face.

4 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is an inclined surface inclined from C-face in a range of 5° or less.

5 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is M-face.

6 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is an inclined surface inclined from M-face in a range of 5° or less.

7 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is A-face.

8 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is an inclined surface inclined from A-face in a range of 5° or less.

9 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a wurtzite structure, and the substrate surface is a high index face between two faces of any one of C-face, M-face, and A-face.

10 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is (001) face.

11 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is an inclined surface inclined from (001) face in a range of 5° or less.

12 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is (111) A-face.

13 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate is has a zinc blende structure, and the substrate surface is an inclined surface inclined from (111) A-face in a range of 5° or less.

14 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is (111) B-face.

15 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is an inclined surface inclined from (111) B-face in a range of 5° or less.

16 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a zinc blende structure, and the substrate surface is a high index face between two faces of any one of (001) face, (111) A-face, and (111) B-face.

17 . The nitride semiconductor freestanding substrate according to claim 1 , wherein the nitride semiconductor freestanding substrate has a film thickness distribution of ±2% or less in a state of as-grown.

18 . A laser diode, having epitaxial layers of a laser diode structure laminated and formed on the nitride semiconductor freestanding substrate of claim 1 .

19 . A manufacturing method of a nitride semiconductor freestanding substrate, comprising the steps of:

growing a nitride semiconductor layer, becoming a nitride semiconductor freestanding substrate, on a substrate for growth by supplying gas containing source gas, using a hydride vapor phase epitaxy method or a metal-organic vapor phase epitaxy method; and

manufacturing the nitride semiconductor freestanding substrate from the nitride semiconductor layer obtained by removing the substrate for growth,

wherein in the step of growing the nitride semiconductor layer, a gas flow speed of the gas containing the source gas in an area for growing the nitride semiconductor layer on the substrate for growth is set to be 1 m/s or more, and a distance from a gas jet hole for jetting the gas containing the source gas for forming the nitride semiconductor layer, to the area for growing the nitride semiconductor layer is set to be 50 cm or more, to thereby grow the nitride semiconductor layer with a dislocation density set to be 4×10 6 /cm 2 or less.

20 . The manufacturing method of the nitride semiconductor freestanding substrate according to claim 19 , wherein in the step of growing the nitride semiconductor layer, a growing rate distribution in a surface of the nitride semiconductor layer is set to be ±2% or less.