IP Library Granted Patent US 8,313,662
Granted Patent B2
US 8,313,662 · App. 12/572,220 · Granted Nov 20, 2012

Methods for globally treating silica optics to reduce optical damage

Assignee: Lawrence Livermore National Security, LLC
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Quick Facts
Patent No.
US 8,313,662
App. No.
12/572,220
Granted
Nov 20, 2012
Kind
B2
Abstract

A method for preventing damage caused by high intensity light sources to optical components includes annealing the optical component for a predetermined period. Another method includes etching the optical component in an etchant including fluoride and bi-fluoride ions. The method also includes ultrasonically agitating the etching solution during the process followed by rinsing of the optical component in a rinse bath.

Claims (17)

1. A method for mitigating optical damage in an optical component, the method comprising:

providing an optical component having a region including optical damage precursors, the damage precursors including laser damage sites, scratches, and chemical impurities;

placing the optical component in an aqueous solution including species of one of hydrofluoric acid, fluoride ions, or bi-fluoride ions, the aqueous solution having an etch rate;

agitating the aqueous solution at a megasonic frequency after placing the optical component in the aqueous solution;

removing a surface layer from the region;

thereafter, placing the optical component in a rinse bath comprising deionized water for a first time duration and agitating the rinse bath at an ultrasonic frequency; and

after expiration of the first time duration, spray rinsing the optical component for a second time duration.

2. The method of claim 1 wherein removing the surface layer comprises removing about 100 nanometers to about 100 microns of material from the region.

3. The method of claim 1 wherein the second time duration is at least 15 minutes.

4. The method of claim 1 wherein the aqueous solution contains hydrofluoric acid and high purity water.

5. The method of claim 1 further comprising manipulating the etch rate of the aqueous solution to be lower than a removal rate for byproducts generated during the removing step.

6. The method of claim 1 wherein the aqueous solution is substantially free of cations capable of forming hexafluorosilicate salts with low solubility in the aqueous solution.

7. The method of claim 6 wherein the cations include one or more of sodium (Na + ), potassium (K + ), magnesium (Mg 2+ ) calcium (Ca 2+ ), barium (Ba 2+ ), zinc (Zn 2+ ), lead (Pb 2+ ), iron (Fe 2+ , Fe 3+ ), or aluminum (Al 3+ ).

8. The method of claim 1 further comprising adding ethylene diamine bifluoride, or fluoride salts of primary, secondary, or tertiary ammonium cations to the aqueous solution.

9. The method of claim 1 further comprising adding ammonium fluoride to the aqueous solution to stabilize pH concentration of the aqueous solution.

10. The method of claim 9 wherein the aqueous solution includes 1.2 moles per liter in hydrofluoric acid and 3 moles per liter in ammonium fluoride.

11. The method of claim 1 wherein the first time duration is at least 30 minutes.

Assignments (2)
CONFIRMATORY LICENSE Recorded Jan 6, 2010
From: LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
To: U.S. DEPARTMENT OF ENERGY
Reel/Frame 023740/0120 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2009
From: MILLER, PHILIP EDWARD; SURATWALA, TAYYAB ISHAQ; BUDE, JEFFREY DEVIN; SHEN, NAN; STEELE, WILLIAM AUGUSTUS; LAURENCE, TED ALFRED; FEIT, MICHAEL DENNIS; WONG, LANA LOUIE
To: LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Reel/Frame 023322/0655 →
Continuity (1)
Related Publication 20110079931A1 · Apr 7, 2011