Methods and systems for analysis of multi-sample, two-dimensional data
The present invention utilizes a pattern extraction methodology to elucidate significant patterns and mathematical relationships that exist between and among pluralities of two-dimensional sample data sets of the same data type. In one instance, the present invention analyzes multi-sample, two-dimensional mass spectroscopy data, while in an alternate instance, another user-specified, preset, or automatically determined data type, modality, submodality, etc., is analyzed.
1. A system for use in analysis of two-dimensional data, the system comprising:
a computer having a processor, a display, and a memory, the processor being configured to operate programming instructions stored in the memory to:
access a first set of two-dimensional data, the first set comprising a plurality of data points each representing a series of points having a locus X-value and a corresponding locus Y-value; and
analyze the first set of two dimensional data to determine the presence of a first data set pattern at a determined locus X-value by developing a list of loci X-values and corresponding loci Y-values, the loci X-values being confined to a determined range including the locus X-value, the list further comprising data points drawn from the first set and excluding data points from the first set for which the Y-value is less than a determined tolerance value, the list further including only those data points for which a common mathematical relationship is found to be present.
2. The system of claim 1 , wherein the first data set pattern comprises a plurality of first data set patterns.
3. The system of claim 2 , wherein first set of data is drawn from a first known source and the programming instructions further cause the processor to associate the plurality of first data set patterns with the first known source.
4. The system of claim 3 , wherein the programming instructions further cause the processor to:
access a second set of two-dimensional data drawn from a second known source, the second set comprising a plurality of data points each representing a respective locus X-value having a corresponding locus Y-value; and
analyze the second set of two dimensional data to determine the presence of a plurality of second data set pattern at a determined locus X-value by developing a list of loci X-values and corresponding loci Y-values, the loci X-values being confined to a determined range including the locus X-value, the list further comprising data points drawn from the second set and excluding data points from the second set for which the Y-value is less than a determined tolerance value, the list further including only those data points for which a common mathematical relationship is found to be present; and
associate the plurality of second data set patterns with the second known source.
5. The system of claim 4 , wherein the programming instructions further cause the processor to compare the plurality of first data set patterns with the plurality of second data set patterns, and to remove any common patterns such that the each of the associated plurality of first data set patterns is different from the associated plurality of second data set patterns.
6. The system of claim 5 , wherein the programming instructions further cause the processor to:
access a third set of two-dimensional data, the third set comprising a plurality of data points each representing a respective locus X-value having a corresponding locus Y-value; and
analyze the third set of two dimensional data to determine the presence of one or more third data set patterns at a determined locus X-value;
compare the one or more third data set patterns with the associated first data set patterns to produce a first source score;
compare the one or more third data set patterns with the associated second data set patterns to produce a second source score; and
assign the third set of data to either the first source or the second source based on a comparison of the first source score and the second source score.