Semiconductor device and method of manufacturing the same

1. A semiconductor device, comprising:

a first layer;

a second layer above the first layer;

a first multi-layered structure;

a second multi-layered structure, the first and second multi-layered structures extending from the first layer to connect to the second layer;

a supporter extending from the first layer to connect to the second layer, the supporter being between the first and second multi-layered structures, the supporter being separated from the first and second multi-layered structures by empty space;

a first contact plug in the first layer, the first contact plug penetrating through the first layer, the first contact plug being electrically connected to the first multi-layered structure; and

a second contact plug in the first layer, the second contact penetrating through the first layer, the second contact plug being electrically connected to the second multi-layered structure,

wherein the supporter is electrically insulated from the first and second contact plugs.

2. The semiconductor device according to claim 1 , wherein the first multi-layered structure comprising a plurality of third layers; the second multi-layered structure comprising a plurality of fourth layers; and the supporter comprises a plurality of fifth layers, the plurality of fifth layers being stacked in one straight line vertical to the plurality of fifth layers.

3. The semiconductor device according to claim 2 , further comprising:

a plurality of first contact plugs connecting the second layer to the first and second multi-layered structures and to the supporter;

a plurality of second contact plugs connecting the plurality of third layers;

a plurality of third contact plugs connecting the plurality of fourth layers; and

a plurality of fourth contact plugs connecting the plurality of fifth layers in the one straight line.

4. The semiconductor device according to claim 3 , wherein the first to fifth layers, and the plurality of first to fourth contact plugs are made of a first material.

5. The semiconductor device according to claim 4 , further comprising:

a plurality of thin films satisfying first to third conditions, the first condition being that the plurality of thin films cover side surfaces of the plurality of third and fourth layers, the second condition being that the plurality of thin films cover side surfaces of the plurality of fifth layers, and the third condition being that the plurality of thin films cover side surfaces of the first to fourth contact plugs.

6. The semiconductor device according to claim 5 , wherein the first material has a first Young's modulus, the plurality of thin films are made of a second material having a second Young's modulus, and the second Young's modulus is greater than the first Young's modulus.

7. The semiconductor device according to claim 6 , wherein the second material has a lower density than the first material.