IP Library Granted Patent US 8,278,932
Granted Patent B2
US 8,278,932 · App. 12/621,238 · Granted Oct 2, 2012

Method and detector for determining a state of a switch

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Quick Facts
Patent No.
US 8,278,932
App. No.
12/621,238
Granted
Oct 2, 2012
Kind
B2
Abstract

In an integrated circuit, a state of a switch coupled to the integrated circuit is determined by comparing a switch voltage at a first terminal of the switch to a reference voltage at a first time. If the switch voltage is higher than the reference voltage, the switch is determined to be in a first state. If the switch voltage is lower than the reference voltage, the switch voltage is stored in a storage element to produce a stored voltage. The stored voltage is compared to the switch voltage at a second time after the first time. A determination is made that the switch is in the first state if the switch voltage is higher than the stored voltage at the second time. A determination is made that the switch is in a second state if the switch voltage is not higher than the stored voltage at the second time.

Claims (28)

1. A method for determining a state of a switch, the method comprising:

comparing a switch voltage at a first terminal of the switch to a reference voltage at a first time;

if the switch voltage is higher than the reference voltage, determining that the switch is in a first state;

if the switch voltage is lower than the reference voltage, storing the switch voltage in a storage element to produce a stored voltage;

comparing the stored voltage to the switch voltage at a second time after the first time;

determining that the switch is in the first state if the switch voltage is higher than the stored voltage at the second time; and

determining that the switch is in a second state if the switch voltage is not higher than the stored voltage at the second time.

2. The method of claim 1 , wherein determining that the switch is in a first state further comprises determining that the switch is in an open state.

3. The method of claim 1 , wherein determining that the switch is the second state further comprises determining that the switch is in a closed state.

4. The method of claim 1 , wherein the storage element is characterized as being a capacitive storage element.

5. The method of claim 1 , wherein the storage element is a capacitor.

6. The method of claim 1 , wherein the switch is a portion of a mechanical relay.

7. The method of claim 1 , wherein the second time is in a range of between 10-20 microseconds after the first time.

8. The method of claim 1 , further comprising reporting the state of the switch if the state of the switch has changed.

9. The method of claim 8 , wherein the state of the switch is reported as an interrupt if the state of the switch has changed.

10. A method for determining a state of a switch, the method comprising:

comparing a switch voltage at a first terminal of the switch to a reference voltage at a first time;

if the switch voltage is higher than the reference voltage, determining that the switch is in an open state;

if the switch voltage is lower than the reference voltage, storing the switch voltage in a storage element to produce a stored voltage;

comparing the stored voltage to the switch voltage at a second time after the first time;

determining that the switch is in the open state if the switch voltage is higher than the stored voltage at the second time; and

determining that the switch is in a closed state if the switch voltage is not higher than the stored voltage at the second time.

11. The method of claim 10 , wherein the storage element is characterized as being a capacitive storage element.

12. The method of claim 10 , wherein the storage element is a capacitor.

13. The method of claim 10 , wherein the switch is a portion of a mechanical relay.

14. The method of claim 10 , wherein the second time is in a range of between 10-20 microseconds after the first time.

15. The method of claim 10 , further comprising reporting the state of the switch to a controller circuit if the state of the switch has changed.

16. The method of claim 15 , wherein the state of the switch is reported as an interrupt if the state of the switch has changed.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037355/0723 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024079/0082 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2009
From: QUINONES, BRYAN; GRAY, RANDALL C.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 023552/0011 →