IP Library Granted Patent US 8,581,606
Granted Patent B2
US 8,581,606 · App. 12/622,677 · Granted Nov 12, 2013

Test point structure for RF calibration and test of printed circuit board and method thereof

Inventor: Young-Ju Kim (Suwon-si, KR)
Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 8,581,606
App. No.
12/622,677
Granted
Nov 12, 2013
Kind
B2
Abstract

A point structure for RF calibration and testing of a PCB is provided. The point structure includes a test pad, an antenna connection pad, and a device mounting pad. The test pad is connected to a circuit unit of the PCB, and a ground pad is connected with a ground of the PCB. A contact probe apparatus for performing RF calibration and testing is connected to the test pad and the ground pad. The antenna connection pad is connected to an antenna unit. The device mounting pad is connected with the test pad and the antenna connection pad. An antenna device is mounted on the device mounting pad. The test pad, the ground pad, the antenna connection pad, and the device mounting pad are separated from one another. Since the point structure can replace an RF switch, a circuit area on the PCB may be reduced, a mounting space may be secured, and a manufacturing cost may be reduced.

Claims (21)

1. A test point structure for Radio Frequency (RF) calibration and testing of a Printed Circuit Board (PCB), the structure comprising:

a test pad connected to a circuit unit of the PCB;

a ground pad connected with a ground of the PCB;

an antenna connection pad connected to an antenna unit; and

at least one device mounting pad respectively connected with the test pad and the antenna connection pad, and on which an antenna element is mounted,

wherein the test pad, the ground pad, the antenna connection pad, and the at least one device mounting pad are mounted on a surface of the PCB, and

wherein the test pad, the ground pad, the antenna connection pad, and the at least one device mounting pad are separated from one another.

2. The structure of claim 1 , further comprising an electrical connection unit for detachably connecting the test pad and the antenna connection pad.

3. The structure of claim 1 , further comprising a dummy resistor mounted on the at least one device mounting pad.

4. The structure of claim 1 , wherein each of the test pad, the ground pad, the antenna pad, and the at least one device mounting pad comprises a thin plate for a substrate.

5. The structure of claim 1 , wherein the test pad and the antenna connection pad are electrically connected by soldering.

6. The structure of claim 1 , wherein a size of the antenna connection pad is determined based on RF characteristics of the PCB.

7. The structure of claim 1 , wherein a distance between the test pad and the antenna connection pad is determined based on RF characteristics of the PCB.

8. A method for Radio Frequency (RF) calibration and testing in a test point structure of a Printed Circuit Board (PCB) comprising a test pad connected to a circuit unit of the PCB, a ground pad connected with a ground of the PCB, an antenna connection pad connected to an antenna unit, and at least one device mounting pad respectively connected with the test pad and the antenna connection pad, and on which an antenna element is mounted, wherein the test pad, the ground pad, the antenna connection pad, and the at least one device mounting pad are on mounted on a surface of the PCB, and wherein the test pad, the ground pad, the antenna connection pad, and the at least one device mounting pad are separated from one another, the method comprising:

performing RF calibration and testing using a contact probe apparatus through the test pad and the ground pad.

9. The method of claim 8 , further comprising, after the performing of the RF calibration and testing, electrically connecting the test pad with the antenna connection pad.

10. The method of claim 9 , wherein the electrically connecting of the test pad with the antenna connection pad comprises using a detachable connection.

11. The method of claim 9 , wherein the electrically connecting of the test pad with the antenna connection pad comprises soldering.

12. The method of claim 8 , further comprising, after the performing of the RF calibration and testing, mounting a dummy resistor on the at least one device mounting pad.

13. The method of claim 8 , further comprising determining a size of the antenna connection pad based on RF characteristics of the PCB.

14. The method of claim 8 , further comprising determining a distance between the test pad and the antenna connection pad based on RF characteristics of the PCB.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2009
From: KIM, YOUNG-JU
To: SAMSUNG ELECTRONICS CO. LTD.
Reel/Frame 023549/0980 →
Priority Claims (1)
KR 10-2008-0115689 · Nov 20, 2008 · national
Continuity (1)
Related Publication 20100123473A1 · May 20, 2010