Semiconductor device structure having enhanced performance FET device
View Patent ↗A method for making a semiconductor device structure, includes: providing a substrate; forming on the substrate: a first layer below and second layers on a gate with spacers, source and drain regions adjacent to the gate, silicides on the gate and source and drain regions; disposing a stress layer over the structure resulting from the forming step; disposing an insulating layer over the stress layer; removing portions of the insulating layer to expose a top surface of the stress layer; removing the top surface and other portions of the stress layer and portions of the spacers to form a trench, and then disposing a suitable stress material into the trench.
1. A semiconductor device structure comprising:
a field effect transistor device including a substrate, the transistor device being of an n-conductive type and including a gate stack on the substrate, the gate stack being provided with sidewall layers and sidewall spacers;
a stress film disposed on the spacers, the spacers and the stress film forming a trench, said trench extending below an upper surface of a gate electrode of the gate stack and exposing a vertical wall of said sidewall layers; and
a stress material disposed in the trench, so that a tensile stress resulting in the channel of the field effect transistor is increased, and wherein a portion of the stress material directly contacts said vertical wall of said sidewall layers.
2. The structure as claimed in claim 1 , wherein said stress film is a tensile stress film and said stress material is a compressive stress material.
3. The structure as claimed in claim 1 , wherein said stress film is a compressive stress film and said stress material is a tensile stress material.
4. The structure as claimed in claim 1 , wherein the trench has a rectangular area.
5. The structure as claimed in claim 1 , wherein the sidewall layers are oxide layers.
6. The structure as claimed in claim 1 , wherein the gate stack has a height, and wherein the trench extends a distance approximately 50% along said height.
7. A semiconductor device structure comprising:
a pFET device including a substrate, the pFET device including a gate stack provided on the substrate, the gate stack being provided with sidewall layers and sidewall spacers;
a stress film disposed on the sidewall spacers, the sidewall spacers and the stress film forming a trench, said trench extending below an upper surface of a gate electrode of the gate stack and exposing a vertical wall of said sidewall layers; and
a stress material disposed in the trench, so that a compressive stress resulting in the channel of the pFET device is increased, and wherein a portion of the stress material directly contacts said vertical wall of said sidewall layers.