Method of manufacturing semiconductor device, cleaning method and cleaning control apparatus
View Patent ↗Efficient cleaning is possible although the film qualities and thicknesses of a reaction tube and a gas supply nozzle are different. There is provided a method of manufacturing a semiconductor device. The method includes forming a film on a substrate, performing a first cleaning process to remove a first deposition substance attached to an inner wall of a gas introducing part, and performing a second cleaning process to remove a second deposition substance attached to an inside of a process chamber and having a chemical composition different from that of the first deposition substance. In the first cleaning process, cleaning conditions are set according to the accumulated supply time of a first source gas supplied to the inside of the process chamber through the gas introducing part, and in the second cleaning process, cleaning conditions are set according to the accumulated thickness of a film formed on the substrate.
1. A method of manufacturing a semiconductor device, comprising:
loading a substrate into a process chamber;
forming a film comprising a plurality of elements on the substrate by supplying a first source gas and a second source gas into the process chamber through a first gas introducing part and a second gas introducing part, respectively, the first source gas comprising at least one of the plurality of elements and the second source gas comprising at least one of the plurality of elements other than those of the first source gas;
unloading the substrate from the process chamber after the film is formed on the substrate;
performing a first cleaning process so as to remove a first deposition substance attached to an inner wall of the first gas introducing part by supplying a cleaning gas to the first gas introducing part, the first deposition substance comprising the at least one of the plurality of elements of the first source gas as a main component, wherein a cleaning condition is set according to an accumulated supply time of the first source gas supplied into the process chamber through the first gas introducing part; and
performing a second cleaning process so as to remove a second deposition substance attached to an inside of the process chamber and having a different chemical composition from that of the first deposition substance by supplying the cleaning gas into the process chamber through a third gas introducing part connected to a lower side of the process chamber at a position where the substrate is not placed, the second deposition substance comprising the plurality of elements as main components, wherein the cleaning condition is set according to an accumulated thickness of the film formed on the substrate,
wherein the first source gas comprises a silicon-containing gas, and the second source gas comprises a nitrogen-containing gas, and
wherein the cleaning gas comprises:
at least one of nitrogen trifluoride (NF 3 ) gas, chlorine trifluoride (ClF 3 ) gas, fluorine (F 2 ) gas, hydrogen fluoride (HF) gas, chlorine (Cl 2 ) gas and boron trichloride (BCl 3 ) gas.
2. The method of claim 1 , wherein the cleaning condition comprises a pressure of the inside of the process chamber and a flowrate of the cleaning gas.
3. The method of claim 1 , wherein a pressure of the inside of the process chamber in the first cleaning process is set to be lower than that of the second cleaning process.
4. The method of claim 1 , wherein the cleaning gas is continuously supplied to the first gas introducing part in the first cleaning process, and the cleaning gas is intermittently supplied into the process chamber in the second cleaning process.
5. A method of manufacturing a semiconductor device, comprising:
loading a substrate into a process chamber;
forming a film comprising a plurality of elements on the substrate by supplying a first source gas and a second source gas into the process chamber through a first gas introducing part and a second gas introducing part, respectively, the first source gas comprising at least one of the plurality of elements and the second source gas comprising at least one of the plurality of elements other than those of the first source gas;
unloading the substrate from the process chamber after the film is formed on the substrate;
performing a first cleaning process so as to remove a first deposition substance attached to an inner wall of the first gas introducing part by supplying a cleaning gas to the first gas introducing part, the first deposition substance comprising the at least one of a plurality of elements of the first source gas as a main component; and
performing a second cleaning process so as to remove a second deposition substance attached to an inside of the process chamber and having a different chemical composition from that of the first deposition substance by supplying the cleaning gas into the process chamber through a third gas introducing part connected to a lower side of the process chamber at a position where the substrate is not placed,
wherein a concentration of the cleaning gas supplied to the first gas introducing part is lower than that of the cleaning gas supplied to the third gas introducing part when at least portions of the first cleaning process and the second cleaning process are performed simultaneously,
wherein the first source gas comprises a silicon-containing gas, and the second source gas comprises a nitrogen-containing gas, and
wherein the cleaning gas comprises:
at least one of nitrogen trifluoride (NF 3 ) gas, chlorine trifluoride (ClF 3 ) gas, fluorine (F 2 ) gas, hydrogen fluoride (HF) gas, chlorine (Cl 2 ) gas and boron trichloride (BCl 3 ) gas.