Two-dimensional condensation for uniaxially strained semiconductor fins
Techniques are disclosed for enabling multi-sided condensation of semiconductor fins. The techniques can be employed, for instance, in fabricating fin-based transistors. In one example case, a strain layer is provided on a bulk substrate. The strain layer is associated with a critical thickness that is dependent on a component of the strain layer, and the strain layer has a thickness lower than or equal to the critical thickness. A fin is formed in the substrate and strain layer, such that the fin includes a substrate portion and a strain layer portion. The fin is oxidized to condense the strain layer portion of the fin, so that a concentration of the component in the strain layer changes from a pre-condensation concentration to a higher post-condensation concentration, thereby causing the critical thickness to be exceeded.
1. A method for fabricating fin-based transistors, the method comprising:
providing a strain layer on a bulk substrate, the strain layer being associated with a first critical thickness that is dependent on a component of the strain layer, the strain layer having a thickness lower than or equal to the first critical thickness;
forming a fin in the substrate and strain layer, such that the fin includes a substrate portion and a strain layer portion; and
oxidizing the fin to condense the strain layer portion of the fin, so that a concentration of the component in the strain layer potion changes from a pre-condensation concentration to a higher post-condensation concentration, associated with a second critical thickness, wherein the thickness of the strain layer portion exceeds the second critical thickness.
2. The method of claim 1 wherein after oxidizing the fin, the method further comprises at least one of:
depositing and planarizing shallow trench isolation (STI) oxide over the fin; and
forming at least one of gate, drain region, and source transistor regions.
3. The method of claim 1 wherein the fin has a uniaxial strain in a current flow axis.
4. The method of claim 1 wherein oxidizing the fin to condense the strain layer portion causes a two-dimensional distribution of the component within the fin.
5. The method of claim 1 wherein oxidizing the fin causes multi-sided condensation of the fin.
6. The method of claim 1 wherein there are a plurality of fins.
7. The method of claim 1 wherein the bulk substrate is silicon and the strain layer is silicon germanium, the component being germanium, and the post-condensation concentration of germanium is at least 2 times greater than the pre-condensation concentration of germanium.
8. The method of claim 1 wherein the post-condensation concentration of the component is at least 2 times greater than the pre-condensation concentration of the component.
9. A method for fabricating fin-based transistors, the method comprising:
providing a strain layer on a bulk substrate, the strain layer being associated with a first critical thickness that is dependent on a component of the strain layer, the strain layer having a thickness lower than or equal to the first critical thickness;
forming a plurality of fins in the substrate and strain layer, such that each fin includes a substrate portion and a strain layer portion; and
oxidizing the fins to condense the strain layer portion of each fin, so that a concentration of the component in the strain layer portion changes from a pre-condensation concentration to a higher post-condensation concentration associated with a second critical thickness, wherein the thickness of the strain layer portion exceeds the second critical thickness;
wherein oxidizing the fins further causes a two-dimensional distribution of the component within the fin.
10. The method of claim 9 wherein after oxidizing the fins, the method further comprises at least one of:
depositing and planarizing shallow trench isolation (STI) oxide over the fins; and
forming at least one of gate, drain region, and source transistor regions.
11. The method of claim 9 wherein each of the fins has a uniaxial strain in a current flow axis.
12. The method of claim 9 wherein oxidizing the fins to condense the strain layer portion causes a two-dimensional distribution of the component within each of the fins.
13. The method of claim 9 wherein the bulk substrate is silicon and the strain layer is silicon germanium, the component being germanium, and the post-condensation concentration of germanium is at least 2 times greater than the pre-condensation concentration of germanium.
14. The method of claim 9 wherein the post-condensation concentration of the component is at least 2 times greater than the pre-condensation concentration of the component.
15. A method for fabricating fin-based transistors, the method comprising:
providing a strained silicon germanium layer on a bulk substrate, the strained silicon germanium layer being associated with a first critical thickness that is dependent on a germanium concentration in the strained silicon germanium layer, the strained silicon germanium layer having a thickness lower than or equal to the first critical thickness;
forming a fin in the substrate and strained silicon germanium layer, such that the fin includes a substrate portion and a strain layer portion; and
oxidizing the fin to condense the strain layer portion of the fin, so that the germanium concentration in the strain layer portion changes from a pre-condensation concentration to a higher post-condensation concentration associated with a second critical thickness, wherein the thickness of the strain layer portion exceeds the second critical thickness.
16. The method of claim 15 wherein after oxidizing the fin, the method further comprises at least one of:
depositing and planarizing shallow trench isolation (STI) oxide over the fin; and
forming at least one of gate, drain region, and source transistor regions.
17. The method of claim 15 wherein the fin has a uniaxial strain in a current flow axis.
18. The method of claim 15 wherein oxidizing the fin to condense the strain layer portion causes a two-dimensional distribution of germanium within the fin.
19. The method of claim 15 wherein oxidizing the fin causes multi-sided condensation of the fin.
20. The method of claim 15 wherein the post-condensation concentration of germanium is at least 2 times greater than the pre-condensation concentration of germanium.