IP Library Granted Patent US 8,222,625
Granted Patent B2
US 8,222,625 · App. 12/657,715 · Granted Jul 17, 2012

Non-volatile memory device including phase-change material

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Quick Facts
Patent No.
US 8,222,625
App. No.
12/657,715
Granted
Jul 17, 2012
Kind
B2
Abstract

A non-volatile memory device including a phase-change material, which has a low operating voltage and low power consumption, includes a lower electrode; a phase-change material layer formed on the lower electrode so as to be electrically connected to the lower electrode, wherein the phase-change material layer includes a phase-change material having a composition represented by Sn X Sb Y Te Z or, alternatively with substitutions, in whole or in part, of silicon and/or indium for tin, arsenic and/or bismuth for antimony, and selenium for tellurium; and an upper electrode formed on the phase-change material layer so as to be electrically connected to the phase-change material layer. Here, 0.001≦X≦0.3, 0.001≦Y≦0.8, 0.1≦Z≦0.8, and X+Y+Z=1.

Claims (14)

1. A non-volatile memory device comprising:

a lower electrode;

a phase-change material layer formed on the lower electrode so as to be electrically connected to the lower electrode, wherein the phase-change material layer comprises a phase-change material having a composition represented by at least one of Formulas 3, 4 and 7, below; and

an upper electrode formed on the phase-change material layer so as to be electrically connected to the phase-change material layer;

Sn X (Sb V Q (1-V) ) Y Te Z .  [Formula 3]

Sn X Sb Y (Te W Se (1-W) ) Z ,  [Formula 4]

Sn X (Sb V Q (1-V) ) Y (Te W Se (1-W) ) Z ,  [Formula 7]

where Q, when present, includes at least one of arsenic (As) and bismuth (Bi); 0≦V≦1; 0≦W≦1; 0.001≦X≦0.3; 0.001≦Y≦0.8; 0.1≦Z≦0.8; V+W<2; and X+Y+Z=1.

2. The non-volatile memory device of claim 1 , wherein the phase-change material has a composition represented by Formula 3, below:

Sn X (Sb V Q (1-V) ) Y Te Z .  [Formula 3]

3. The non-volatile memory device of claim 1 , wherein the phase-change material has a composition represented by Formula 4, below:

Sn X Sb Y (Te W Se (1-W) ) Z .  [Formula 4]

4. The non-volatile memory device of claim 1 , wherein the phase-change material has a composition represented by Formula 7, below:

Sn X (Sb V Q (1-V) ) Y (Te W Se (1-W) ) Z .  [Formula 7]

Assignments (4)
CHANGE OF NAME Recorded Jul 18, 2016
From: CARLOW INNOVATIONS, LLC
To: OVONYX MEMORY TECHNOLOGY, LLC
Reel/Frame 039379/0077 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 8, 2015
From: OVONYX, INC.
To: CARLOW INNOVATIONS LLC
Reel/Frame 037244/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 19, 2010
From: SCHELL, CARL H.; MAIMON, JONATHAN D.; HUDGENS, STEPHEN J.
To: OVONYX,INC.
Reel/Frame 024409/0446 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 26, 2010
From: AHN, DONG-HO; HORII, HIDEKI; PARK, SOON-OH; KIM, YOUNG-HYUN; SHIN, HEE-JU; OH, JIN-HO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 023947/0725 →