Interferometer step scanning systems and methods
View Patent ↗In some embodiments, the pathlength difference (retardation) in a step scanning infrared (IR) spectrometer interferometer is maintained under AC servomechanism (servo) control for a first period following a step change, and under DC servo control for a second period following the first period. Data is acquired during and/or after the DC servo control period. Switching off the AC servo control prior to data acquisition allows limiting the dither-frequency noise that could otherwise affect signals of interest, particularly in fast-time-scale applications such as high-speed time-resolved spectroscopy (TSR). A mirror position control circuit controls a mirror position stepping as well as switching a mirror servo control from AC to DC.
1. A method comprising:
stepping an optical pathlength difference in a step scanning interferometer from a first value to a second value;
enabling an interferometer mirror dither under AC servo control for a first time interval to stabilize the pathlength difference at the second step value;
for a second time interval subsequent to the first time interval, disabling the mirror dither under AC servo control and enabling an interferometer mirror position DC servo control; and
performing an interferometer sample data collection while the mirror dither under AC servo control is disabled.
2. The method of claim 1 , further comprising:
for the first time interval, setting an AC servo input signal to be proportional to −A+B−C+D, wherein A, B, C, and D represent time integrals of a pathlength difference optical detector signal over four equal and consecutive time intervals each equal to one fourth of a dither period; and
for the second time interval, setting a DC servo input signal to be proportional to A′+B′+C′+D′, wherein A′, B′, C′, and D′ represent time integrals of the pathlength difference optical detector signal over four equal and consecutive time intervals each equal to one fourth of the dither period.
3. The method of claim 2 , further comprising:
during the first time interval, applying an AC servo input signal gain having a first value to the pathlength difference optical detector signal to generate an AC servo input signal; and
during the second time interval, applying a DC servo input signal gain having a second value different from the first value to the pathlength difference optical detector signal to generate a DC servo input signal.
4. The method of claim 1 , further comprising setting a last error position measured during the first time interval to be an initial position offset for the second time interval.
5. The method of claim 1 , further comprising:
providing a pathlength difference optical detector signal as a servo input during the first time interval and the second time interval;
applying a high-pass filter to the pathlength difference optical detector signal for the first time interval; and
not applying the high-pass filter to the pathlength difference optical detector signal for the second time interval.
6. The method of claim 1 , further comprising:
controlling a position of a first interferometer mirror mounted on a linear motor to perform the stepping of the optical pathlength difference; and
controlling a position of a second interferometer mirror mounted on a piezoelectric transducer to perform the interferometer mirror dither.
7. An apparatus comprising:
at least one actuator configured to step an optical pathlength difference in a step scanning interferometer from a first value to a second value; and
a system controller connected to the at least one actuator and configured to enable an interferometer mirror dither under AC servo control for a first time interval to stabilize the pathlength difference at the second step value,
for a second time interval subsequent to the first period, disable the mirror dither under AC servo control and enable an interferometer mirror position DC servo control, and
perform an interferometer sample data collection while the mirror dither under AC servo control is disabled.
8. The apparatus of claim 7 , wherein the system controller is further configured to:
for the first time interval, set an AC servo input signal to be proportional to −A+B−C+D, wherein A, B, C, and D represent time integrals of a pathlength difference optical detector signal over four equal and consecutive time intervals each equal to one fourth of a dither period; and
for the second time interval, set a DC servo input signal to be proportional to A′+B′+C′+D′, wherein A′, B′, C′, and D′ represent time integrals of the pathlength difference optical detector signal over four equal and consecutive time intervals each equal to one fourth of the dither period.
9. The apparatus of claim 8 , wherein the system controller is further configured to:
during the first time interval, apply an AC servo input signal gain having a first value to the pathlength difference optical detector signal to generate an AC servo input signal; and
during the second time interval, apply a DC servo input signal gain having a second value different from the first value to the pathlength difference optical detector signal to generate a DC servo input signal.
10. The apparatus of claim 7 , wherein the system controller is further configured to set a last error position measured during the first time interval to be an initial position offset for the second time interval.
11. The apparatus of claim 7 , wherein the system controller is further configured to:
provide a pathlength difference optical detector signal as a servo input during the first time interval and the second time interval;
apply a high-pass filter to the pathlength difference optical detector signal for the first time interval; and
not apply the high-pass filter to the pathlength difference optical detector signal for the second time interval.
12. The apparatus of claim 7 , wherein the system controller is further configured to:
control a position of a first interferometer mirror mounted on a linear motor to perform the stepping of the optical pathlength difference; and
control a position of a second interferometer mirror mounted on a piezoelectric transducer to perform the interferometer mirror dither.