IP Library Granted Patent US 8,339,117
Granted Patent B2
US 8,339,117 · App. 12/669,520 · Granted Dec 25, 2012

Start-up circuit element for a controlled electrical supply

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Quick Facts
Patent No.
US 8,339,117
App. No.
12/669,520
Granted
Dec 25, 2012
Kind
B2
Abstract

Electrical supply apparatus comprising a start-up circuit element coupled to an output element for ensuring reliable start-up when first connected to a source of power. The start-up circuit element comprises first and second branches with current mirror coupling therebetween. The first branch comprises first and second transistors of opposite polarities for connection in series between the source of power and ground and a leakage path to ground in parallel with the second transistor for start-up current for the first transistor of the first branch in response to application of voltage from the source of power. The current mirror coupling between the first and second branches responds to start-up of the first transistor of the first branch to start up a first transistor of the second branch and provide start-up current to the output element. The second branch may comprise a control element connected to turn off the second transistor of the first branch on start up of the output element and turn off the first transistors. Alternatively, the start-up circuit may have elements common with the output circuit and remain conductive after the output circuit starts.

Claims (34)

1. Electrical supply apparatus comprising:

an output element; and

a start-up circuit element coupled to the output element to ensure that the electrical supply apparatus reliably starts operation when first connected to a voltage of power supply rail, said start-up circuit element comprising first and second branches with current mirror coupling therebetween, said first branch comprising first and second transistors of opposite polarities coupled in series between the power supply rail and ground, and at least one leakage path coupled to the ground in parallel with said second transistor of said first branch to generate a start-up current through said first transistor of said first branch in response to an application of the voltage on the power supply rail, said second branch comprising a first transistor coupled between the power supply rail and a node connected to said output element, said current mirror coupling beteen said first and second branches to start up said first transistor of said second branch and to provide the start-up current through said node to the output element in response to the start-up current through said first transistor of said first branch,

wherein said leakage path to ground comprises a P-N unction that is reverse biased in operation, and

wherein a leakage current conduction area of said P-N junction in said leakage path to ground is greater than leakage current conduction areas of said first transistors.

2. Electrical supply apparatus as claimed in claim 1 , wherein said second branch comprises a control element connected between said node and the ground, and the control element responsive to an output voltage from said output element, on start up of said output element, to turn off said second transistor of said first branch and to turn off said first transistors.

3. Electrical supply apparatus as claimed in claim 2 , wherein said start-up circuit element includes a comparator and a threshold voltage source to maintain said control element in a non-conductive state until said output voltage exceeds a threshold voltage from the threshold voltage source on start up of said output element and to cause said control element to conduct when said output voltage exceeds the threshold voltage and to turn off said transistors of said first and second branches and the control element.

4. Electrical supply apparatus as claimed in claim 3 , wherein said start-up circuit element includes a unidirectional coupling element to pass said start-up current between said node and said output element and to prevent flow of current in an opposite sense.

5. Electrical supply apparatus as claimed in claim 2 , wherein a leakage current conduction area to ground of said control element is smaller than leakage current conduction areas of said first transistors.

6. Electrical supply apparatus as claimed in claim 1 , wherein said leakage path to ground also comprises a further P-N junction that is reverse biased in operation, connected in parallel with said second transistor, and an impedance connected in series between the ground and the parallel combination of said second transistor and said further P-N junction.

7. Electrical supply apparatus as claimed in claim 1 , wherein said output element comprises a current mirror.

8. Electrical supply apparatus as claimed in claim 1 , wherein said output element comprises a voltage regulator or a voltage reference circuit.

9. Electrical supply apparatus as claimed in claim 1 , wherein said output element comprises a band gap circuit.

10. Electrical supply apparatus as claimed in claim 1 , wherein said output element comprises a current source.

11. Electrical supply apparatus as claimed in claim 10 , wherein said output element comprises an output transistor, and said first transistors and said output transistor comprise respective control gates coupled together so that said output transistor copies with a multiplication ratio a current flowing in said first transistors.

12. A start-up circuit comprising:

a first transistor having a first current electrode coupled to a power supply rail, a second current electrode, and a control electrode coupled to the second current electrode;

a second transistor having polarity opposite of a polarity of the first transistor, the second transistor connected in series with the first transistor between the power supply rail and a ground;

a leakage current path connected to the ground in parallel with the second transistor, the leakage current path to provide a start-up current to the first transistor in response to a voltage being provided on the power supply rail; and

a third transistor having a first current electrode coupled to the power supply rail, and a control electrode coupled to the control electrode of the first transistor, and a second current electrode coupled to a node, the third transistor to provide the start-up current to an output element in response to the start-up current in the first transistor, wherein the leakage current path is formed via a reversed biased diode connected in parallel with the third transistor, and an impedance connected in series between the ground and a combination of the reversed biased diode and the third transistor.

13. The start-up circuit of claim 12 further comprising:

a fourth transistor having a first current electrode coupled to the node, a second current electrode coupled to the ground, and a control electrode coupled to a feedback output, the fourth transistor to active in response to an output voltage received at the control electrode from the output element via the feedback output, and the fourth transistor to deactivate the first transistor and the third transistor in response to the fourth transistor being activated.

14. A method for controlling a start-up circuit, the method comprising:

providing a voltage on a power supply rail of the start-up circuit;

generating a leakage current from the power supply rail through a first transistor and a leakage path to ground in response to the voltage being provided on the power supply rail;

generating a start-up current in a second transistor in response to the leakage current through the first transistor, the second transistor being connected between the power supply rail and a node; and

providing the start-up current to an output element via the node,

wherein the leakage path is formed via a reversed biased diode connected in parallel with a third transistor, and an impedance connected in series between the ground and a combination of the reversed biased diode and a third transistor.

15. The method of claim 14 wherein the start-up current is a multiple times larger than the leakage current based on a difference between a size of the first transistor and a size of the second transistor.

16. The method of claim 14 further comprising:

receiving, at the third transistor coupled to the second transistor, an output voltage from the output element;

activating the third transistor in response to receiving the output voltage; and

deactivating the first transistor and the second transistor while the third transistor is activated.

17. The method of claim 14 wherein the first transistor and the second transistor form a current mirror.

Assignments (37)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
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From: FREESCALE SEMICONDUCTOR INC.
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CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
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To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
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SECURITY AGREEMENT Recorded Mar 15, 2010
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