IP Library Granted Patent US 7,847,524
Granted Patent B2
US 7,847,524 · App. 12/691,301 · Granted Dec 7, 2010

High voltage protection for a thin oxide CMOS device

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Quick Facts
Patent No.
US 7,847,524
App. No.
12/691,301
Granted
Dec 7, 2010
Kind
B2
Abstract

A circuit includes a voltage regulator ( 208 ) for outputting a voltage at a regulated level, a protection circuit ( 260 ), and a load circuit ( 210 ) coupled to the voltage regulator. The protection circuit includes means for preventing the voltage regulator from outputting a voltage at a level higher than the regulated level during a start-up period of the voltage regulator.

Claims (40)

1. A circuit, comprising:

a voltage regulator, coupled to a supply of electrical power and to ground, and having an output for outputting an output voltage at a regulated level;

a load circuit, coupled to the output of the voltage regulator and to ground; and

a protection circuit, the protection circuit comprising,

a capacitor coupled to the supply and to a node,

a resistor coupled to the node and to ground, and

a transistor having a gate coupled to the node, a drain coupled to the output of the voltage regulator, and a source coupled to ground, such that when the voltage of the gate of the transistor is at the voltage of the supply, the drain of the transistor pulls the voltage at the output of the voltage regulator low, thereby preventing the voltage at the output of the voltage regulator from going above the regulated level.

2. The circuit of claim 1 , implemented in an integrated circuit (IC).

3. The circuit of claim 2 , in which the IC is fabricated using a dual-oxide complementary metal oxide semiconductor (CMOS) process.

4. The circuit of claim 3 , in which the IC comprises at least one thin oxide area and at least one thick oxide area.

5. The circuit of claim 4 in which the voltage regulator and the protection circuit are located in a thick oxide area.

6. The circuit of claim 4 in which the load circuit is located in a thin oxide area.

7. The circuit of claim 1 in which the voltage regulator receives the electrical power from the supply at a first voltage.

8. The circuit of claim 7 in which the regulated level of the output voltage from the voltage regulator is at a second voltage, the second voltage being less than the first voltage.

9. The circuit of claim 1 , in which the voltage regulator needs a start-up period to elapse subsequent to first receiving electrical power from the supply to be able to maintain the output voltage at the regulated level, and in which the capacitor becomes charged to the supply voltage upon occurrence of the voltage regulator being coupled to the supply and remains sufficiently charged during the start-up period to maintain a turned-on condition of the transistor.

10. The circuit of claim 9 , in which after the start-up period has elapsed, the capacitor becomes sufficiently discharged to cease maintaining the turned-on condition of the transistor, thereby allowing the output voltage to be maintained by the voltage regulator.

11. The circuit of claim 1 in which, subsequent to first receiving electrical power from the supply, the voltage regulator needs a start-up period to elapse to be able to maintain the output voltage at the regulated level.

12. An integrated circuit (IC), comprising:

a substrate;

a voltage regulator, coupled to a supply of electrical power and to ground, and having an output for outputting an output voltage at a regulated level, wherein the voltage regulator is disposed on the substrate;

a load circuit, coupled to the output of the voltage regulator and to ground, wherein the load circuit is disposed on the substrate; and

a protection circuit, disposed on the substrate, the protection circuit comprising,

a capacitor coupled to the supply and to a node,

a resistor coupled to the node and to ground, and

a transistor having a gate coupled to the node, a drain coupled to the output of the voltage regulator, and a source coupled to ground, such that when the voltage of the gate of the transistor is at the voltage of the supply, the drain of the transistor pulls the voltage at the output of the voltage regulator low, thereby preventing the voltage at the output of the voltage regulator from going above the regulated level.

13. The IC of claim 12 , in which the voltage regulator receives the electrical power from the supply at a first voltage.

14. The IC of claim 13 , in which the regulated level of the output voltage from the voltage regulator is at a second voltage, the second voltage being less than the first voltage.

15. The IC of claim 12 , in which, subsequent to first receiving electrical power from the supply, the voltage regulator needs a start-up period to elapse to be able to maintain the output voltage at the regulated level.

16. The IC of claim 15 , in which the capacitor becomes charged to the supply voltage upon occurrence of the voltage regulator being coupled to the supply and remains sufficiently charged during the start-up period to maintain a turned-on condition of the transistor.

17. An integrated circuit (IC) fabricated using complementary metal oxide semiconductor (CMOS) process, comprising:

a substrate including a thick oxide portion and a thin oxide portion;

a voltage regulator, coupled to a supply of electrical power and to ground, and having an output for outputting an output voltage at a regulated level, wherein the voltage regulator is disposed on the thick oxide portion;

a load circuit, coupled to the output of the voltage regulator and to ground, wherein the load circuit is disposed on the thin oxide portion; and

a protection circuit, disposed on the thick oxide portion, the protection circuit comprising,

a capacitor coupled to the supply and to a node,

a resistor coupled to the node and to ground, and

a transistor having a gate coupled to the node, a drain coupled to the output of the voltage regulator, and a source coupled to ground, such that when the voltage of the gate of the transistor is at the voltage of the supply, the drain of the transistor pulls the voltage at the output of the voltage regulator low, thereby preventing the voltage at the output of the voltage regulator from going above the regulated level.

18. The IC of claim 17 , in which the voltage regulator receives the electrical power from the supply at a first voltage.

19. The IC of claim 18 , in which the regulated level of the output voltage from the voltage regulator is at a second voltage, the second voltage being less than the first voltage.

20. The IC of claim 17 , in which the voltage regulator needs a start-up period to elapse subsequent to first receiving electrical power from the supply to be able to maintain the output voltage at the regulated level, and in which the capacitor becomes charged to the supply voltage upon occurrence of the voltage regulator being coupled to the supply and remains sufficiently charged during the start-up period to maintain a turned-on condition of the transistor.

Assignments (32)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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PATENT RELEASE Recorded Dec 21, 2015
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Sep 3, 2010
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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From: FREESCALE SEMICONDUCTOR, INC.
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