IP Library Granted Patent US 8,581,679
Granted Patent B2
US 8,581,679 · App. 12/713,390 · Granted Nov 12, 2013

Switch with increased magnetic sensitivity

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Quick Facts
Patent No.
US 8,581,679
App. No.
12/713,390
Granted
Nov 12, 2013
Kind
B2
Abstract

Switches that are actuated through exposure to a magnetic field are described. A mobile element of a switch includes one or more anchoring members that are in electrical contact with one of the conductive portions. The mobile element also has a beam that is attached to the one or more anchoring members. The beam can be attached to the one or more anchoring members by flexures. The beam has an end portion that is configured to move toward the other conductive portion when exposed to an external force, such as a magnetic field. Various configurations of anchoring members may significantly decrease initial upward beam deformation upon manufacture of the mobile element, resulting in an increased sensitivity upon exposure to a magnetic field. Methods for manufacturing switches that exhibit increased sensitivity to magnetic fields are also disclosed.

Claims (35)

1. A switch comprising:

a substrate having a first conductive portion and a second conductive portion; and

a mobile element disposed on the substrate, the mobile element comprising:

an anchoring member disposed on the substrate and in contact with the first conductive portion of the substrate; and

a beam attached to the anchoring member, the beam including a plurality of strips and a connection portion, each strip extending substantially along an entire length of the beam and being attached to another strip by the connection portion such that an opening that is fully enclosed within a plane is formed by adjacent strips and the connection portion, and the beam having an end portion that is adapted to move toward the second conductive portion upon exposure to an external force, wherein when the end portion of the beam is in contact with the second conductive portion, an electrical pathway is formed between the first and second conductive portions of the substrate.

2. The switch of claim 1 , further comprising a plurality of flexures that are attached to the beam and the anchoring member, the plurality of flexures configured to accommodate increased displacement in the mobile element.

3. The switch of claim 1 , wherein at least one of the plurality of strips is longer than another of the plurality of strips.

4. The switch of claim 1 , wherein the beam includes 3 strips.

5. The switch of claim 1 , wherein the second conductive portion comprises a fixed element disposed on the substrate.

6. The switch of claim 1 , wherein the fixed element includes a plurality of strips.

7. The switch of claim 1 , wherein the end portion of the beam is adapted to move toward the second conductive portion upon exposure to a magnetic field.

8. The switch of claim 7 , wherein the electrical pathway between the first and second conductive portions is formed from contact between the beam and the second conductive portion when the magnetic field is less than about 20 mT.

9. The switch of claim 7 , wherein the electrical pathway between the first and second conductive portions is formed from contact between the beam and the second conductive portion when the magnetic field is less than about 10 mT.

10. The switch of claim 7 , wherein the electrical pathway between the first and second conductive portions is formed from contact between the beam and the second conductive portion when the magnetic field is less than about 5 mT.

11. The switch of claim 7 , wherein the electrical pathway between the first and second conductive portions is formed from contact between the beam and the second conductive portion when the magnetic field is about 2 mT.

12. The switch of claim 1 , wherein the anchoring member comprises one of a plurality of anchoring members that cooperate to minimize deformation resulting from residual stress in the mobile element.

13. The switch of claim 2 , wherein the plurality of flexures are attached to a side portion of the beam.

14. The switch of claim 1 , further comprising a plurality of flexures attached to the anchoring member and extending from a side portion of the beam.

15. The switch of claim 12 , wherein the plurality of anchoring members are disposed on the substrate and in contact with the first conductive portion of the substrate.

16. The switch of claim 15 , wherein the plurality of anchoring members are spaced apart from one another.

17. The switch of claim 15 , wherein the plurality of anchoring members have contact surface areas in electrical contact with the first conductive portion of the substrate, each of the contact surface areas being substantially equal to one another.

18. The switch of claim 15 , wherein the plurality of anchoring members have contact surface areas in electrical contact with the first conductive portion of the substrate, the contact surface area of at least one of the anchoring members being unequal from the contact surface area of another anchoring member.

19. The switch of claim 15 , wherein the plurality of anchoring members include a first anchoring member having a first contact surface area and a second anchoring member having a second contact surface area, the first contact surface area being greater than the second contact surface area.

20. The switch of claim 19 , wherein the first anchoring member is a central anchoring member that is disposed adjacent to each of the other anchoring members, the first contact surface area being greater than each contact surface area of the other anchoring members.

21. The switch of claim 15 , wherein the plurality of anchoring members have contact surface areas in electrical contact with the first conductive portion of the substrate, the contact surface areas of the anchoring members being disposed in a grid pattern.

22. The switch of claim 21 , wherein the contact surface areas of the anchoring members are patterned in a 3×4 grid.

23. The switch of claim 21 , wherein the contact surface areas of the anchoring members are patterned in a 4×5 grid.

24. The switch of claim 21 , wherein the contact surface areas of the anchoring members are patterned in a 5×6 grid.

25. The switch of claim 1 , wherein the anchoring member reduces bending of the beam away from the second conductive portion.

26. The switch of claim 12 , wherein the plurality of anchoring members are constructed and arranged to reduce upward bending of the beam.

27. The switch of claim 1 , wherein an uppermost surface of the anchoring member is substantially coplanar with an uppermost surface of the beam.

28. The switch of claim 1 , wherein a maximum width of the beam is less than a maximum width of a contact region between the substrate and the anchoring member.

29. The switch of claim 14 , wherein the side portion of the beam is spaced from opposing ends of the beam.

30. The switch of claim 14 , wherein the plurality of flexures comprise crab leg-type flexures.

31. The switch of claim 1 , wherein the anchoring member is in fixed contact with the first conductive portion of the substrate.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2024
From: STMICROELECTRONICS PTE LTD
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 068433/0985 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2022
From: STMICROELECTRONICS N.V.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 062201/0917 →
QUITCLAIM ASSIGNMENT Recorded Oct 31, 2022
From: STMICROELECTRONICS ASIA PACIFIC PTE LTD
To: STMICROELECTRONICS PTE LTD
Reel/Frame 061815/0026 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2012
From: INSTITUTE OF MICROELECTRONICS
To: STMICROELECTRONICS NV
Reel/Frame 027700/0547 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME AND ADDRESS OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 023996 FRAME 0639. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECTION OF THE NAME AND ADDRESS OF THE ASSIGNEE.. Recorded Feb 14, 2012
From: LE NEEL, OLIVIER; SHANKAR, RAVI
To: STMICROELECTRONICS PTE. LTD.
Reel/Frame 027700/0728 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2010
From: MIN, TANG; LE NEEL, OLIVIER; SHANKAR, RAVI
To: INSTITUTE OF MICROELECTRONICS; STMICROELECTONICS, ASIA PACIFIC PTE LTD.
Reel/Frame 023996/0639 →