IP Library Patent Application 12713995
Patent Application
App. No. 12/713,995

METAL CAPTURING APPARATUS AND ATOMIC LAYER DEPOSITION APPARATUS HAVING THE SAME

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Quick Facts
Patent No.
US None
App. No.
12/713,995
Abstract

A metal capturing apparatus and an atomic layer deposition apparatus, which are capable of discharging an exhaust gas from a process chamber, in which a metal atomic layer is deposited on a substrate using a reaction gas containing a metal catalyst, without a scrubber, and easily reusing the metal catalyst contained in the exhaust gas. The metal capturing apparatus includes a capturing chamber having a capturing space, a capturing plate disposed at one side of the capturing chamber and partially inserted into the capturing chamber, a refrigerant source feeding a refrigerant cooling the capturing plate, and an attachment unit attaching the capturing plate to the capturing chamber. The atomic layer deposition apparatus includes a process chamber, a vacuum pump connected to an exhaust port of the process chamber, and a metal capturing apparatus disposed between the process chamber and the vacuum pump.

Claims (60)

1 . A metal capturing apparatus comprising:

a capturing chamber having a capturing space;

a capturing plate disposed at one side of the capturing chamber and partially inserted into the capturing chamber;

a refrigerant source feeding a refrigerant cooling the capturing plate; and

an attachment unit attaching the capturing plate to the capturing chamber.

2 . The metal capturing apparatus according to claim 1 , wherein the capturing plate comprises:

a body attached to the capturing chamber; and

at least one capturing finger inserted into the capturing chamber.

3 . The metal capturing apparatus according to claim 2 , wherein the capturing plate comprises a plurality of capturing fingers inserted into the capturing chamber and stacked in the same direction as a flow of an exhaust gas passing through the capturing chamber.

4 . The metal capturing apparatus according to claim 2 , further comprising a sealing member interposed between the capturing chamber and the body.

5 . The metal capturing apparatus according to claim 2 , wherein the attachment unit is located at an edge of the body of the capturing plate.

6 . The metal capturing apparatus according to claim 1 , wherein the capturing plate comprises a refrigerant pipe therein through which the refrigerant flows.

7 . The metal capturing apparatus according to claim 1 , wherein the refrigerant comprises helium (He) gas.

8 . A atomic layer deposition (ALD) apparatus comprising:

a process chamber performing an ALD process;

a vacuum pump connected to an exhaust port of the process chamber; and

a metal capturing apparatus disposed between the process chamber and the vacuum pump,

wherein the metal capturing apparatus comprises:

a capturing chamber having a capturing space;

a capturing plate partially inserted into the capturing chamber;

a refrigerant source feeding a refrigerant cooling the capturing plate; and

an attachment unit attaching the capturing plate to the capturing chamber.

9 . The atomic layer deposition apparatus according to claim 8 , wherein the capturing plate comprises:

a body attached to the capturing chamber; and

at least one capturing finger inserted into the capturing chamber.

10 . The atomic layer deposition apparatus according to claim 9 , wherein the capturing plate comprises a plurality of capturing fingers inserted into the capturing chamber and stacked in the same direction as a flow of an exhaust gas passing through the capturing chamber.

11 . The atomic layer deposition apparatus according to claim 9 , further comprising a sealing member interposed between the capturing chamber and the body of the capturing plate.

12 . The atomic layer deposition apparatus according to claim 9 , wherein the attachment unit is located at an edge of the body of the capturing plate.

13 . The atomic layer deposition apparatus according to claim 8 , wherein the capturing plate comprises a refrigerant pipe therein through which the refrigerant flows.

14 . The atomic layer deposition apparatus according to claim 8 , wherein the refrigerant comprises helium (He) gas.

15 . The atomic layer deposition apparatus according to claim 8 , wherein the process chamber comprises:

a chamber body;

an inflow pipe introducing a reaction gas or a purge gas into the chamber body;

a shower head uniformly spraying the reaction gas or the purge gas introduced through the inflow pipe on a substrate;

a support chuck supporting the substrate; and

an exhaust pipe exhausting a metal catalyst remaining in the chamber body.

16 . The atomic layer deposition apparatus according to claim 15 , wherein the support chuck comprises a temperature controller maintaining the temperature of the supported substrate.

17 . The metal capturing apparatus according to claim 1 , wherein the attachment unit selectively detaches the capturing plate from the capturing chamber.

18 . The atomic layer deposition apparatus according to claim 8 , wherein the attachment unit selectively detaches the capturing plate from the capturing chamber.

19 . The metal capturing apparatus according to claim 6 , wherein the refrigerant pipe is disposed in the body of the at least one capturing finger of the capturing plate and is attached to the refrigerant source.

20 . The atomic layer deposition apparatus according to claim 13 , wherein the refrigerant pipe is disposed in the body of the at least one capturing finger of the capturing plate and is attached to the refrigerant source.

21 . A capturing plate of a metal capturing apparatus, the capturing plate comprising:

a capturing finger disposed in a direction traversing the flow of an exhaust gas having metal; and

a body attached to the capturing finger.

22 . The capturing plate of claim 21 , further comprising a refrigerant pipe disposed in the body and the capturing finger.

23 . The capturing plate of claim 21 , wherein the refrigerant pipe is connected to a refrigerant source and feeds a refrigerant to the capturing plate.

24 . The capturing plate of claim 22 , wherein the refrigerant includes helium (He) gas.

25 . The capturing plate of claim 21 , wherein an attachment unit attaches the body of the capturing plate to an apparatus through which the exhaust gas flows.

26 . The capturing plate of claim 25 , wherein the body unit comprises the attachment unit.

27 . A method of capturing metal in an atomic layer deposition (ALD) operation, the method comprising:

disposing a capturing finger in a direction traversing a flow of exhaust gas of the ALD operation;

cooling the capturing finger; and

passing the exhaust gas of the ALD operation over the capturing finger in order to capture metal in the exhaust gas.

28 . The method of claim 27 , wherein a plurality of capturing fingers are disposed in the direction traversing the flow of the exhaust gas of the ALD operation.

29 . The method of claim 27 , further comprising:

removing the capturing finger from the flow of the exhaust gas of the ALD operation; and

collecting the captured metal from the capturing finger.

30 . The method of claim 27 , further comprising discharging the exhaust gas from a chamber in which the ALD operation is performed.

31 . The method of claim 27 , wherein the cooling the capturing finger comprises passing a refrigerant through the capturing finger.

32 . The method of claim 31 , wherein the refrigerant comprises helium (He) gas.

Assignments (2)
MERGER Recorded Aug 29, 2012
From: SAMSUNG MOBILE DISPLAY CO., LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 028868/0413 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2010
From: NA, HEUNG-YEOL; LEE, KI-YONG; SEO, JIN-WOOK; JEONG, MIN-JAE; HONG, JONG-WON; KANG, EU-GENE; CHANG, SEOK-RAK; CHUNG, YUN-MO; YANG, TAE-HOON; PARK, BYOUNG-KEON; LEE, DONG-HYUN; LEE, KIL-WON; PARK, JONG-RYUK; CHOI, BO-KYUNG; JUNG, JAE-WAN; SO, BYUNG-SOO; BAEK, WON-BONG; MAIDANCHUK, IVAN
To: SAMSUNG MOBILE DISPLAY CO., LTD.
Reel/Frame 024003/0771 →