Physical quantity sensor and physical quantity measuring method

1. A physical quantity sensor comprising:

a semiconductor laser which emits laser light to a measurement target;

an oscillation wavelength modulating device configured to operate the semiconductor laser such that at least one of a first oscillation period and a second oscillation period repeatedly exists, wherein an oscillation wavelength continuously and monotonically increases during the first oscillation period, and the oscillation wavelength continuously and monotonically decreases during the second oscillation period;

a detector configured to detect an electrical signal including interference waveforms, the interference waveforms being caused by a self-coupling effect of the laser light emitted from the semiconductor laser and return light from the measurement target;

a signal extracting device configured to measure each cycle of the interference waveforms whenever the interference waveform is input;

a cycle correcting device configured to compare each cycle of the interference waveforms received from the signal extracting device with a reference cycle so as to correct the cycles of the interference waveforms; and

a calculating device configured to calculate at least one of displacement and velocity of the measurement target based on each of the cycles of the interference waveforms corrected by the cycle correcting device.

2. The physical quantity sensor according to claim 1 , wherein the calculating device calculates at least one of the displacement and velocity of the measurement target based on: a frequency of a sampling clock to measure the cycles of the interference waveforms; the reference cycle; an average wavelength of the semiconductor laser; and a variation of the cycles corrected by the cycle correcting device with respect to the reference cycle.

3. The physical quantity sensor according to claim 1 ,

wherein, if the cycle of the interference waveform measured by the signal extracting device is k times as much as the reference cycle, where k is in a range of more than 0 to less than 1,

the cycle correcting device sets a cycle obtained by adding the cycle of the interference waveform and a next cycle of the interference waveform, as a correction cycle of the interference waveform and sets a waveform corresponding to the correction cycle as a single waveform, and

wherein, if the cycle of the interference waveform measured by the signal extracting device is (m−k) to less than (m+k) times as much as the reference cycle, where k is in a range of more than 0 to less than 1 and m is a natural number of 2 or more,

the cycle correcting device sets cycles obtained by dividing the cycle of the interference waveform into m equal parts, as correction cycles and sets waveforms corresponding to correction cycles as m waveforms.

4. The physical quantity sensor according to claim 3 , wherein k is substantially 0.5.

5. The physical quantity sensor according to claim 1 ,

wherein the reference cycle is:

the cycle of the interference waveform at the time when the measurement target is in a static condition; or

an average of a predetermined number of the cycles of the interference waveforms measured immediately before correction by the cycle correcting device.

6. The physical quantity sensor according to claim 1 , further comprising:

a counting device configured to count the number of interference waveforms included in the output signal in each of the first oscillation period and the second oscillation period;

a distance calculating device configured to calculate a distance to the measurement target, based on: a counting result received from the counting device; a minimum oscillation wavelength; and a maximum oscillation wavelength for a period for which the counting device counts the number of interference waveforms; and

a cycle calculating device configured to calculate the cycle of the interference waveform based on the distance calculated by the distance calculating device,

wherein the cycle correcting device sets the cycle obtained by the cycle calculating device as the reference cycle.

7. The physical quantity sensor according to claim 1 , further comprising:

a counting device configured to count the number of interference waveforms included in the output signal in each of the first oscillation period and the second oscillation period;

a distance-proportional number calculating device configured to calculate an average of the number of interference waveforms so as to obtain a distance-proportional number, the distance-proportional number being the number of interference waveforms proportional to an average distance between the semiconductor laser and the measurement target; and

a cycle calculating device configured to calculate the cycle of the interference waveform based on the distance-proportional number,

wherein the cycle correcting device sets the cycle obtained by the cycle calculating device as the reference cycle.

8. A physical quantity measuring method, the method comprising:

(a) operating a semiconductor laser such that at least one of a first oscillation period and a second oscillation period repeatedly exists, wherein an oscillation wavelength continuously and monotonically increases during the first oscillation period, and the oscillation wavelength continuously and monotonically decreases during the second oscillation period;

(b) detecting an electrical signal including interference waveforms, the interference waveforms being caused by a self-coupling effect of the laser light emitted from the semiconductor laser and return light from the measurement target;

(c) measuring each cycle of the interference waveform whenever the interference waveform is input;

(d) comparing each cycle of the interference waveforms with a reference cycle so as to correct the cycles of the interference waveforms; and

(e) calculating at least one of displacement and velocity of the measurement target based on each of the cycles of the interference waveforms corrected in step (d).

9. The method according to claim 8 , wherein step (e) comprises:

calculating at least one of the displacement and velocity of the measurement target based on: a frequency of a sampling clock to measure the cycles of the interference waveforms; the reference cycle; an average wavelength of the semiconductor laser; and a variation of the cycles corrected in step (d) with respect to the reference cycle.

10. The method according to claim 8 ,

wherein, if the cycle of the interference waveform measured in step (c) is k times as much as the reference cycle, where k is in a range of more than 0 to less than 1,

step (d) comprises:

setting a cycle obtained by adding the cycle of the interference waveform and a next cycle of the interference waveform, as a correction cycle of the interference waveform; and

setting a waveform corresponding to the correction cycle as a single waveform, and

wherein, if the cycle of the interference waveform measured in step (c) is (m−k) to less than (m+k) times as much as the reference cycle, where k is in a range of more than 0 to less than 1 and m is a natural number of 2 or more,

step (d) comprises:

setting cycles obtained by dividing the cycle of the interference waveform into m equal parts, as correction cycles; and

setting waveforms corresponding to correction cycles as m waveforms.

11. The method according to claim 10 , wherein k is substantially 0.5.

12. The method according to claim 8 ,

wherein the reference cycle is:

the cycle of the interference waveform at the time when the measurement target is in a static condition; or

an average of a predetermined number of the cycles of the interference waveforms measured immediately before step (d).

13. The method according to claim 8 , further comprising:

(f) counting the number of interference waveforms included in the output signal in each of the first oscillation period and the second oscillation period;

(g) calculating a distance to the measurement target, based on: a counting result in step (f); a minimum oscillation wavelength; and a maximum oscillation wavelength for a period for which the number of interference waveforms is counted in step (f); and

(h) calculating the cycle of the interference waveform based on the distance calculated in step (g),

wherein step (d) comprises: setting the cycle obtained in step (h) as the reference cycle.

14. The physical quantity measuring method according to claim 8 , further comprising:

(f) counting the number of interference waveforms included in the output signal in each of the first oscillation period and the second oscillation period;

(g) calculating an average of the number of interference waveforms so as to obtain a distance-proportional number, the distance-proportional number being the number of interference waveforms proportional to an average distance between the semiconductor laser and the measurement target; and

(h) calculating the cycle of the interference waveform based on the distance-proportional number,

wherein step (d) comprises: setting the cycle obtained in step (h) as the reference cycle.

15. A non-transitory computer readable medium storing a program causing a computer to execute a process for measuring physical quantity, the process comprising:

(a) operating a semiconductor laser such that at least one of a first oscillation period and a second oscillation period repeatedly exists, wherein an oscillation wavelength continuously and monotonically increases during the first oscillation period, and the oscillation wavelength continuously and monotonically decreases during the second oscillation period;

(b) detecting an electrical signal including interference waveforms, the interference waveforms being caused by a self-coupling effect of the laser light emitted from the semiconductor laser and return light from the measurement target;

(c) measuring each cycle of the interference waveform whenever the interference waveform is input;

(d) comparing each cycle of the interference waveforms with a reference cycle so as to correct the cycles of the interference waveforms; and

(e) calculating at least one of displacement and velocity of the measurement target based on each of the cycles of the interference waveforms corrected in step (d).