IP Library Granted Patent US 8,685,856
Granted Patent B2
US 8,685,856 · App. 12/728,448 · Granted Apr 1, 2014

Solid-state imaging device, fabrication method thereof, imaging apparatus, and fabrication method of anti-reflection structure

Inventors: Kensaku Maeda (Kanagawa, JP); Kaoru Koike (Kumamoto, JP); Tohru Sasaki (Kumamoto, JP); Tetsuya Tatsumi (Kanagawa, JP)
Assignee: Sony Corporation
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Quick Facts
Patent No.
US 8,685,856
App. No.
12/728,448
Granted
Apr 1, 2014
Kind
B2
Abstract

A fabrication method of an anti-reflection structure includes the steps of: forming a resin film having micro-particles dispersed therein on a surface of a substrate; forming a protrusion dummy pattern on the resin film by etching the resin film using the micro-particles in the resin film as a mask while gradually etching the micro-particles; and forming a protrusion pattern on the surface of the substrate by etching back the surface of the substrate together with the resin film having the protrusion dummy pattern formed thereon, and transferring a surface shape of the protrusion dummy pattern formed on a surface of the resin film to the surface of the substrate.

Claims (10)

1. A fabrication method of an anti-reflection structure, the method comprising the steps of:

providing a resin film having micro-particles dispersed therein on a surface of a substrate;

forming a dummy protrusion pattern on a surface of the resin film by etching the resin film using the micro-particles in the resin film as a mask while gradually etching the micro-particles; and

forming a protrusion pattern on the surface of the substrate by etching back the surface of the substrate together with the resin film having the protrusion dummy pattern formed thereon, thereby transferring a surface shape of the dummy protrusion pattern formed on the surface of the resin film to the surface of the substrate and eliminating the resin film, the resulting protrusions being tapering in cross-section from a relatively wide base to a relatively narrow end, the resulting protrusions having a distribution pitch and an aspect ratio of height to base diameter effective to suppress reflection of light and provide the anti-reflection structure.

2. The fabrication method of an anti-reflection structure according to claim 1 , wherein the resin film having the micro-particles dispersed therein is formed by a coating method.

3. The fabrication method of an anti-reflection structure according to claim 1 or 2 , wherein the micro-particles are made from metal oxides or a phthalocyanine compound; and the resin film is selected from a group consisting of a novolac-based resin, a styrene-based resin, an acrylic resin, a polysiloxane-based resin, and a polyimide-based resin.

4. The fabrication method of an anti-reflection structure according to claim 1 or 2 , wherein the resin film contains a heat curing agent.

5. The method of claim 1 , wherein the resulting protrusions have an aspect ratio of 4 or less.

6. The method of claim 5 , wherein the resulting protrusions have an aspect ration of 1 to 2, inclusive, and a distribution pitch of 100 nm to 200 nm inclusive.

7. The method of claim 5 , wherein the resulting protrusions have an aspect ratio of 2.5 or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2010
From: MAEDA, KENSAKU; KOIKE, KAORU; SASAKI, TOHRU; TATSUMI, TETSUYA
To: SONY CORPORATION
Reel/Frame 024115/0027 →
Priority Claims (2)
JP 2009-086671 · Mar 31, 2009 · national
JP 2009-121605 · May 20, 2009 · national
Continuity (1)
Related Publication 20100244169A1 · Sep 30, 2010