IP Library Patent Application 12731847
Patent Application
App. No. 12/731,847

METHOD FOR TREATMENT OF A GAS STREAM CONTAINING SILICON TETRAFLUORIDE AND HYDROGEN CHLORIDE

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Quick Facts
Patent No.
US None
App. No.
12/731,847
Abstract

The present invention is directed to a method for treatment of a gas stream comprising silicon tetrafluoride and hydrogen chloride. For example, the present invention is directed to a method for treatment of such a gas stream that involves contacting the gas stream with a metal that reacts with the hydrogen chloride to provide a treated gas stream having reduced hydrogen chloride content. The present invention is further directed to methods for subjecting silicon tetrafluoride and hydrogen chloride-containing gas streams to elevated pressure to provide gas streams suitable for transport.

Claims (63)

1 . A process for removing hydrogen chloride from a gas stream comprising silicon tetrafluoride and having an initial hydrogen chloride content, the process comprising contacting the gas stream with a source of a metal, wherein the metal reacts with the hydrogen chloride, thereby preferentially removing hydrogen chloride from the gas stream and providing a treated gas stream comprising silicon tetrafluoride and having a reduced hydrogen chloride content that is no more than about 90% (v/v) of the initial hydrogen chloride content.

2 . A process as set forth in claim 1 wherein the gas stream has a moisture content of at least about 100 ppm.

3 . A process as set forth in claim 1 wherein the gas stream has a moisture content of from about 100 ppm to about 2500 ppm.

4 . A process as set forth in claim 1 wherein the metal exhibits a removal efficiency that is at least about 95%.

5 . A process as set forth in claim 1 wherein the reduced hydrogen chloride content is no more than about 10% (v/v) of the initial hydrogen chloride content.

6 . A process as set forth in claim 1 wherein the reduced hydrogen chloride content is achieved within about 2 minutes of beginning said contacting.

7 . A process as set forth in claim 1 wherein no more than about 10% (v/v) of the silicon tetrafluoride is removed from the gas stream during said contacting.

8 . A process as set forth in claim 1 wherein the metal source comprises a metal oxide, metal hydroxide, or a combination thereof.

9 . A process as set forth in claim 1 wherein the metal exhibits an electronegativity of less than about 1.65.

10 . A process as set forth in claim 1 wherein the source of metal is a metal oxide or a metal hydroxide of a metal of Groups 2-4 or 12-14 of the Periodic Table of the Elements.

11 . A process as set forth in claim 1 wherein said contacting is conducted at a temperature of from about 25° C. to about 90° C.

12 . A process as set forth in claim 1 wherein said contacting is conducted at a pressure of from about 50 psig to about 1500 psig.

13 . A process as set forth in claim 1 wherein the surface area of the metal source is at least about 80 ft 2 /ft 3 .

14 . A process as set forth in claim 13 wherein the surface area of the metal source is from about 80 ft 2 /ft 3 to about 600 ft 2 /ft 3 .

15 . A process as set forth in claim 1 wherein the gas stream is contacted with the metal at a rate of at least about 0.05 lb/hr·ft 2 .

16 . A process as set forth in claim 1 wherein at least a portion of the metal source is in the form of particles ranging in size of from about 500 μm to about 5000 μm.

17 . A process as set forth in claim 1 wherein the metal source exhibits a porosity of from about 30% to about 80%.

18 . A process as set forth in claim 1 wherein the gas stream is contacted with a bed comprising the metal source.

19 . A process as set forth in claim 18 wherein the pressure drop across the bed is from about 1 psig to about 25 psig.

20 . A process as set forth in claim 18 wherein the gas stream passes over the bed of metal source at a space velocity of at least about 0.1 ft/minute.

21 . A process as set forth in claim 18 wherein the bed is in the form of a packed bed, fluidized bed, or moving bed.

22 . A process as set forth in claim 1 wherein the metal exhibits a removal efficiency that is at least about 90%.

23 . A process as set forth in claim 1 wherein the metal exhibits a removal efficiency that is at least about 98%.

24 . A process as set forth in claim 1 wherein the gas stream has a moisture content of from about 300 ppm to about 800 ppm.

25 . A process as set forth in claim 1 wherein the reduced hydrogen chloride content is no more than about 5% (v/v) of the initial hydrogen chloride content.

26 . A process as set forth in claim 1 wherein the reduced hydrogen chloride content is no more than about 0.5% (v/v) of the initial hydrogen chloride content.

27 . A process as set forth in claim 1 wherein no more than about 0.5% (v/v) of the silicon tetrafluoride is removed from the gas stream during said contacting.

28 . A process as set forth in claim 1 wherein said contacting is conducted at a temperature of from about 45° C. to about 70° C.

29 . A process as set forth in claim 1 wherein the surface area of the metal source is at least about 200 ft 2 /ft 3 .

30 . A process as set forth in claim 1 wherein the surface area of the metal source is from about 200 ft 2 /ft 3 to about 400 ft 2 /ft 3 .

31 . A process as set forth in claim 1 wherein at least a portion of the metal source is in the form of particles ranging in size of from about 1000 μm to about 4000 μm.

32 . A process as set forth in claim 1 wherein the metal source exhibits a porosity of from about 40% to about 70%.

33 . A process for removing hydrogen chloride from a gas stream comprising silicon tetrafluoride and having an initial pressure and initial hydrogen chloride content, the process comprising:

compressing the gas stream during one or more stages of increasing pressure greater than said initial pressure; and

contacting the gas stream with a source of a metal, thereby providing a treated gas stream having a reduced hydrogen chloride content that is no more than about 90% (v/v) of the initial hydrogen chloride content.

34 . A process as set forth in claim 33 wherein said compressing comprises subjecting the gas stream to a first stage of increasing pressure of at least about 100 psig.

35 . A process as set forth in claim 33 wherein said compressing comprises subjecting the gas stream to a first stage of increasing pressure of from about 100 psig to about 700 psig.

36 . A process as set forth in claim 34 wherein, prior to said first stage, the gas stream has a moisture content of at least about 100 ppm.

37 . A process as set forth in claim 34 wherein, prior to said first stage, the gas stream has a moisture content of from about 100 ppm to about 2500 ppm.

38 . A process as set forth in claim 34 wherein said compressing comprises subjecting the gas stream to a second stage of increasing pressure of at least about 800 psig.

39 . A process as set forth in claim 38 wherein, prior to said second stage, the gas stream has a moisture content of at least about 100 ppm.

40 . A process as set forth in claim 38 wherein, prior to said second stage, the gas stream has a moisture content of from about 100 ppm to about 2500 ppm.

41 . A process as set forth in claim 38 wherein said contacting occurs between said first stage and said second stage.

42 . A process as set forth in claim 34 wherein said compressing comprises subjecting the gas stream to a second stage of increasing pressure of from about 1000 psig to about 1800 psig.

43 . A process as set forth in claim 34 wherein said contacting occurs prior to said first stage.

44 . A process as set forth in claim 33 wherein during said contacting the metal reacts with the hydrogen chloride, thereby providing a treated gas stream comprising silicon tetrafluoride and having a reduced hydrogen chloride content.

45 . A process as set forth in claim 44 wherein the reduced hydrogen chloride content is no more than about 70% (v/v) of the initial hydrogen chloride content.

46 . A process as set forth in claim 44 wherein the reduced hydrogen chloride content is achieved within about 2 minutes of beginning said contacting.

47 . A process as set forth in claim 33 wherein no more than about 1% (v/v) of the silicon tetrafluoride is removed from the gas stream during said contacting.

48 . A process as set forth in claim 33 wherein the source of metal is a metal oxide or a metal hydroxide of a metal of Groups 2-4 or 12-14 of the Periodic Table of the Elements.

49 . A process as set forth in claim 33 wherein said contacting is conducted at a temperature of from about 25° C. to about 90° C.

50 . A process as set forth in claim 33 wherein said contacting is conducted at a pressure of from about 50 psig to about 1500 psig.

51 . A process as set forth in claim 33 wherein said compressing comprises subjecting the gas stream to a first stage of increasing pressure of at least about 200 psig.

52 . A process as set forth in claim 33 wherein, prior to said first stage, the gas stream has a moisture content of at least about 800 ppm.

53 . A process as set forth in claim 33 wherein said compressing comprises subjecting the gas stream to a second stage of increasing pressure of at least about 1000 psig.

54 . A process as set forth in claim 53 wherein, prior to said second stage, the gas stream has a moisture content of from about 300 ppm to about 1700 ppm.

55 . A process as set forth in claim 33 wherein the metal exhibits a removal efficiency that is at least about 95%.

56 . A process as set forth in claim 33 wherein the reduced hydrogen chloride content is no more than about 5% (v/v) of the initial hydrogen chloride content.

57 . A process as set forth in claim 33 wherein no more than about 10% (v/v) of the silicon tetrafluoride is removed from the gas stream during said contacting.

58 . A process as set forth in claim 33 wherein the surface area of the metal source is from about 200 ft 2 /ft 3 to about 400 ft 2 /ft 3 .

59 . A process as set forth in claim 33 wherein at least a portion of the metal source is in the form of particles ranging in size of from about 1000 μm to about 4000 μm.

60 . A process as set forth in claim 33 wherein the metal source exhibits a porosity of from about 40% to about 70%.

61 . A process as set forth in claim 33 wherein the gas stream is contacted with a bed comprising the metal source at a space velocity at least about 4 ft/minute.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Mar 3, 2014
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: NVT, LLC; SUN EDISON LLC; SOLAICX; SUNEDISON, INC.
Reel/Frame 032382/0724 →
SECURITY AGREEMENT Recorded Feb 28, 2014
From: SUNEDISON, INC.; SUN EDISON LLC; SOLAICX; NVT, LLC; ENFLEX CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 032372/0610 →
SECURITY AGREEMENT Recorded Jan 30, 2014
From: SUNEDISON, INC.; SOLAICX; SUN EDISON, LLC; NVT, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 032177/0359 →
RELEASE OF SECURITY INTEREST Recorded Dec 26, 2013
From: BANK OF AMERICA, N.A.
To: ENFLEX CORPORATION; SUN EDISON LLC; SOLAICX; SUNEDISON, INC. (F/K/A MEMC ELECTRONIC MATERIALS, INC.)
Reel/Frame 031870/0031 →
RELEASE OF SECURITY INTEREST Recorded Dec 26, 2013
From: GOLDMAN SACHS BANK USA
To: NVT, LLC; SUN EDISON LLC; SOLAICX; SUNEDISON, INC. (F/K/A MEMC ELECTRONIC MATERIALS, INC.)
Reel/Frame 031870/0092 →
SECURITY AGREEMENT Recorded Oct 1, 2012
From: NVT, LLC; SUN EDISON LLC; SOLAICX, INC.; MEMC ELECTRONIC MATERIALS, INC.
To: GOLDMAN SACHS BANK USA
Reel/Frame 029057/0810 →
SECURITY AGREEMENT Recorded Apr 1, 2011
From: MEMC ELECTRONIC MATERIALS, INC.; SUNEDISON LLC; SOLAICX
To: BANK OF AMERICA, N.A.
Reel/Frame 026064/0720 →