IP Library Granted Patent US 8,356,526
Granted Patent B2
US 8,356,526 · App. 12/736,532 · Granted Jan 22, 2013

Contamination measurement station and method for a semiconductor substrates transport pod

Inventors: Arnaud Favre (Annecy, FR); Erwan Godot (Annecy, FR); Bertrand Bellet (Chambery, FR)
Assignee: Alcatel Lucent
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Quick Facts
Patent No.
US 8,356,526
App. No.
12/736,532
Granted
Jan 22, 2013
Kind
B2
Abstract

The invention concerns a measurement station for the measurement of particle contamination of a transport pod for the conveyance and atmospheric storage of semiconductor substrates, such pod comprising a casing capable of being closed by means of a removable access door, such station comprising: an interface ( 5 ) capable of coupling to a casing of a transport pod ( 3 ) instead of the said door, the interface ( 5 ) comprising at least one injection nozzle ( 9 ) arranged at one mobile end of a pipe protruding from the said interface to direct a jet of gas in a perpendicular direction towards a portion of the wall ( 13 ) on the inside ( 10 ) of the said casing coupled to the said measurement station, so as to detach particles ( 11 ) from the said casing ( 3 ) by the impact of the gas jet on the said wall ( 13 ), and a measurement device ( 7 ) comprising a vacuum pump ( 17 ), a particle counter ( 19 ), and a measurement conduit ( 21 ) of which an inlet ( 23 ) leads to the inside ( 10 ) of the said casing ( 3 ), and of which an outlet ( 25 ) is coupled to the vacuum pump ( 17 ), the measurement conduit ( 21 ) being furthermore connected to the particle counter ( 19 ), to connect the inside ( 10 ) of the casing of the transport pod ( 3 ) coupled to the said measurement station with the particle counter ( 19 ). The invention also concerns a method for the measurement of particle contamination of a transport pod for the conveyance and atmospheric storage of semiconductor substrates.

Claims (10)

1. A measurement station for measurement of particle contamination of a transport pod for conveyance and atmospheric storage of semiconductor substrates, the transport pod comprising a casing capable of being closed by a removable access door, the measurement station comprising:

an interface capable of coupling to a casing of the transport pod instead of the removable access door, the interface comprising at least one injection nozzle arranged at one mobile end of a pipe protruding from the interface to direct a gas jet in a perpendicular direction towards a portion of a wall on an inside of the casing coupled to the measurement station, to detach particles from the casing by an impact of the gas jet on the wall, and

a measurement device comprising a vacuum pump, a particle counter and a measurement conduit, of which an inlet leads to the inside of the casing and of which an outlet is connected to the vacuum pump, the measurement conduit being connected to the particle counter to create a communication between the inside of the casing of the transport pod coupled to the measurement station and the particle counter.

2. The measurement station of claim 1 , wherein the interface is equipped with a plurality of spacers that enable the interface to couple with the casing while leaving interstitial gaps for a passage of a leak flow between the inside of the casing and the external environment.

3. The measurement station of claim 2 , wherein the plurality of spacers have a shape of studs.

4. The measurement station of claim 1 , further comprising an atmospheric chamber surrounding the interface.

5. The measurement station of claim 1 , wherein the at least one injection nozzle is configured to inject a pulsed gas jet.

6. The measurement station of claim 1 , wherein the interface comprises a plurality of injection nozzles equipped with particle filters.

7. The measurement station of claim 1 , further comprising stoppers to plug filtered gas passages of the casing of the transport pod.

8. The measurement station of claim 1 , further comprising a processing unit operable to generate a signal to a cleaning unit, the signal being representative of a state of cleanliness of the casing of the transport pod.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2021
From: ALCATEL LUCENT
To: ADIXEN VACUUM PRODUCTS
Reel/Frame 058181/0086 →
CHANGE OF NAME Recorded Nov 22, 2021
From: ADIXEN VACUUM PRODUCTS
To: PFEIFFER VACUUM
Reel/Frame 058219/0044 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2010
From: FAVRE, ARNAUD; GODOT, ERWAN; BELLET, BERTRAND
To: ALCATEL LUCENT
Reel/Frame 025303/0007 →
Priority Claims (1)
FR 08 02284 · Apr 24, 2008 · national
Continuity (1)
Related Publication 20110048143A1 · Mar 3, 2011