IP Library Granted Patent US 8,153,504
Granted Patent B2
US 8,153,504 · App. 12/742,424 · Granted Apr 10, 2012

Process for manufacturing a composite substrate

Assignee: Soitec
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Quick Facts
Patent No.
US 8,153,504
App. No.
12/742,424
Granted
Apr 10, 2012
Kind
B2
Abstract

The invention relates to a process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate, characterized in that the process includes, before bonding, the formation of a bonding layer between the first and the second substrate, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of the material of the first substrate.

Claims (20)

1. A process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate, the process further comprising, before bonding, the formation of a bonding layer between the first and the second substrate, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of a material of the first substrate, and wherein the plasma is of the O 2 or N 2 type, or a mixture thereof.

2. The process according to claim 1 , wherein the regions of a different type are made of a different material from that of the islands.

3. The process according to claim 1 , wherein the regions of a different type are empty.

4. The process according to claim 1 , further comprising, after bonding, a heat treatment, which is intended to intensify the bonding energy.

5. The process according to claim 1 , wherein the bonding is followed by debonding the second substrate and the first substrate.

6. The process according to claim 5 , wherein the debonding is carried out via chemical etching.

7. A process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate, the process further comprising:

formation of a bonding layer between the first and the second substrate before bonding, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of a material of the first substrate;

formation of a mask on the surface of the first substrate in the complementary pattern, whereby the mask does not cover areas of the first substrate corresponding to the pattern; and

formation of the islands in the areas of the first substrate not covered by the mask.

8. The process according to claim 7 , wherein a mask removal process is carried out during or after formation of the islands in the areas of the first substrate not covered by the mask.

9. A process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate, the process further comprising:

production of an embrittlement area in the second substrate so as to define a thin layer before bonding; and

formation of a bonding layer between the first and the second substrate before bonding, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of a material of the first substrate.

10. The process according to claim 9 , further comprising, after bonding, a remainder of the second substrate is detached along the embrittlement area, so that the thin layer is transferred onto the first substrate.

11. A process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate in a molecular adhesion-bonding operation, the process further comprising forming of a bonding layer between the first and the second substrate before bonding, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of a material of the first substrate.

12. A process for manufacturing a composite substrate comprising bonding a first substrate onto a second semiconducting substrate, the process further comprising:

formation of a bonding layer between the first and the second substrate before bonding, the bonding layer comprising a plurality of islands distributed over a surface of the first substrate in a determined pattern and separated from one another by regions of a different type, which are distributed in a complementary pattern, wherein the islands are formed via a plasma treatment of a material of the first substrate;

bonding a thin layer onto a final support; and

debonding the second substrate from the first substrate.

Assignments (2)
CHANGE OF NAME Recorded Feb 28, 2012
From: S.O.I. TEC SILICON ON INSULATOR TECHNOLOGIES; CHEMIN DES FRANQUES; PARC TECHNOLOGIES DES FONTAINES; BERNIN. FRANCE 38190
To: SOITEC
Reel/Frame 028138/0895 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2012
From: ALLIBERT, FREDERIC; KERDILES, SEBASTIEN
To: SOITEC
Reel/Frame 027555/0082 →
Priority Claims (1)
FR 07 54077 · Mar 28, 2007 · national
Continuity (1)
Related Publication 20100323496A1 · Dec 23, 2010