IP Library › Granted Patent US 8,357,029
Granted Patent B2
US 8,357,029 · App. 12/747,225 · Granted Jan 22, 2013

Polishing apparatus

Inventors: Makoto Fukushima (Tokyo, JP); Tetsuji Togawa (Tokyo, JP); Hozumi Yasuda (Tokyo, JP); Koji Saito (Tokyo, JP); Osamu Nabeya (Tokyo, JP); Tomoshi Inoue (Tokyo, JP)
Assignee: Ebara Corporation
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Quick Facts
Patent No.
US 8,357,029
App. No.
12/747,225
Granted
Jan 22, 2013
Kind
B2
Abstract

A polishing apparatus is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. The polishing apparatus includes a polishing table ( 100 ) having a polishing surface ( 101 a ), a top ring body ( 2 ) configured to hold and press a substrate against the polishing surface ( 101 a ), and a retainer ring ( 3 ) provided at an outer peripheral portion of the top ring body ( 2 ) and configured to press the polishing surface ( 101 a ). A fulcrum for receiving a lateral force applied from the substrate to the retainer ring ( 3 ) during polishing of the substrate is located above a central portion of the substrate.

Claims (27)

1. An apparatus for polishing a substrate, comprising:

a polishing table having a polishing surface;

a top ring body having a pressure chamber for being supplied with a pressurized fluid and configured to press the substrate against said polishing surface under a fluid pressure when said pressure chamber is supplied with the pressurized fluid; and

a retainer ring provided at an outer peripheral portion of said top ring body and configured to be movable independently of said top ring body and to press said polishing surface;

wherein a fulcrum for receiving a lateral force applied from the substrate to said retainer ring during polishing of the substrate is located above a central portion of the substrate.

2. The apparatus according to claim 1 , wherein said retainer ring is tiltable about said fulcrum.

3. The apparatus according to claim 1 , wherein said retainer ring is vertically movably supported on an axis passing through said fulcrum.

4. The apparatus according to claim 1 , wherein said top ring body has at least one elastic membrane configured to form a plurality of pressure chambers for being supplied with a pressurized fluid; and

wherein said fulcrum is located above said pressure chamber located at the central portion of the substrate.

5. The apparatus according to claim 1 , wherein said fulcrum is located at a rotation center of a support mechanism for supporting said retainer ring by said top ring body.

6. An apparatus for polishing a substrate, comprising:

a polishing table having a polishing surface;

a top ring body having a pressure chamber for being supplied with a pressurized fluid and configured to press the substrate against said polishing surface under a fluid pressure when said pressure chamber is supplied with the pressurized fluid; and

a retainer ring provided at an outer peripheral portion of said top ring body and configured to be movable independently of said top ring body and to press said polishing surface;

wherein a support mechanism for supporting said retainer ring tiltably to allow said retainer ring to follow movement of said polishing surface is located above a central portion of the substrate.

7. The apparatus according to claim 6 , wherein said support mechanism supports said retainer ring vertically movably.

8. The apparatus according to claim 6 , wherein said retainer ring is movable independently of said top ring body by said support mechanism.

9. The apparatus according to claim 6 , wherein sliding contact surfaces of said support mechanism is composed of a low friction material.

10. The apparatus according to claim 6 , wherein said retainer ring comprises a ring member configured to hold an peripheral edge of the substrate, a holding portion disposed at a central portion of said top ring body and configured to hold said ring member, and a connecting portion for connecting said ring member and said holding portion; and

wherein said holding portion is supported by said support mechanism.

11. The apparatus according to claim 6 , wherein said top ring body has at least one elastic membrane configured to form a plurality of pressure chambers for being supplied with a pressurized fluid; and

wherein said support mechanism is located above said pressure chamber located at the central portion of the substrate.

12. The apparatus according to claim 6 , wherein said support mechanism comprises a spherical bearing mechanism for supporting said retainer ring rotatably by a spherical surface.

13. The apparatus according to claim 6 , wherein said support mechanism comprises a gyro mechanism for supporting said retainer ring rotatably about two orthogonal axes.

14. The apparatus according to claim 6 , wherein a metal ring is mounted on said retainer ring.

15. The apparatus according to claim 6 , further comprising a nozzle configured to supply a fluid for cooling said retainer ring.

16. The apparatus according to claim 6 , further comprising a rotary drive unit provided in said top ring body and configured to transmit a rotative force from said top ring body to said retainer ring.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2010
From: FUKUSHIMA, MAKOTO; TOGAWA, TETSUJI; YASUDA, HOZUMI; SAITO, KOJI; NABEYA, OSAMU; INOUE, TOMOSHI
To: EBARA CORPORATION
Reel/Frame 024516/0621 →
Priority Claims (1)
JP 2008-031307 · Feb 13, 2008 · national
Continuity (1)
Related Publication 20100273405A1 · Oct 28, 2010