IP Library Granted Patent US 8,284,593
Granted Patent B2
US 8,284,593 · App. 12/760,039 · Granted Oct 9, 2012

Multi-port memory having a variable number of used write ports

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Quick Facts
Patent No.
US 8,284,593
App. No.
12/760,039
Granted
Oct 9, 2012
Kind
B2
Abstract

A multi-port memory is operated according to a method. Data is written, in a first mode, to a storage node of a memory cell from a first port through a first conductance. The first mode is characterized by a power supply voltage being applied at a power node at a first level. Data is written, in a second mode, to the storage node of the memory cell simultaneously from the first port through the first conductance and a second port through a second conductance. The second mode is characterized by the power supply voltage being applied at the power node at a second level different from the first level.

Claims (43)

1. A multi-port memory, comprising:

a memory cell having a storage node;

a first pass transistor coupled between the storage node and a first port;

a second pass transistor coupled between the storage node and a second port; and

write means coupled to the first port and the second port for:

writing data in a first mode to the storage node from one of the first port and the second port through one of the first pass transistor and the second pass transistor, respectively, when the multi-port memory is powered by a first voltage at a power supply node; and

writing data in a second mode to the storage node simultaneously from the first port and the second port simultaneously through the first pass transistor and the second pass transistor when the multi-port memory is powered by a second voltage different than the first voltage at the power supply node.

2. The multi-port memory of claim 1 , further comprising:

a read circuit coupled to the storage node.

3. The multi-port memory of claim 2 , wherein the write means is further characterized by selectively choosing between the first port and the second port for writing data.

4. The multi-port memory of claim 3 , wherein the write means comprises a first multiplexer having a first input for receiving data to be written from the first port, a second input for receiving data to be written from the second port, and an output coupled to the first port.

5. The multi-port memory of claim 4 , wherein:

the first port has a portion for enabling the first pass transistor;

the second port has a portion for enabling the second pass transistor; and

the write means further comprise a second multiplexer having a first input for receiving an enable signal for the first pass transistor from the portion of the first port for enabling the first pass transistor, a second input for receiving an enable signal for the second pass transistor from the portion of the second port for enabling the second pass transistor, and an output coupled to the first pass transistor.

6. The multi-port memory of claim 1 , wherein:

the memory cell has a second storage node;

the multi-port memory further comprises:

a third pass transistor coupled between the storage node and a complement of the first port;

a fourth pass transistor coupled between the storage node and a complement of the second port; and

the write means is coupled to the complement of each of the first port and the second port for writing data in the first mode to the second storage node from the complement of the one of the first port and the second port through the third pass transistor or fourth pass transistor, respectively, when the multi-port memory is powered by the first voltage at the power supply node and writing data in a second mode to the second storage node simultaneously from the complements of the first port and the second port simultaneously through the third pass transistor and fourth transistor when the multi-port memory is powered by the second voltage different than the first voltage at the power supply node.

7. The multi-port memory of claim 1 wherein the first port is a write port and the second port is a read port in the first mode.

8. The multi-port memory of claim 7 , further comprising a sense amplifier coupled to the second port.

9. The multi-port memory of claim 8 , wherein the write means comprises a first multiplexer having a first input for receiving data to be written from the first port, a second input for receiving data to be written from the second port in the second mode, and an output coupled to the first port.

10. The multi-port memory of claim 1 , wherein the first port and the second port function as independent read/write ports in the first mode.

11. The multi-port memory of claim 10 , further comprising:

a first sense amplifier coupled to the first port; and

a second sense amplifier coupled to the second port.

12. A method of operating a multi-port memory comprising:

writing data in a first mode to a storage node of a memory cell from a first port through a first conductance, wherein the first mode is characterized by a power supply voltage being applied at a power node at a first level; and

writing data in a second mode to the storage node of the memory cell simultaneously from the first port through the first conductance and a second port through a second conductance, wherein the second mode is characterized by the power supply voltage being applied at the power node at a second level different from the first level.

13. The method of claim 12 , wherein the second level is lower than the first level.

14. The method of claim 13 , further comprising reading data stored at the storage node through a sense amplifier coupled to the storage node during the first mode and the second mode.

15. The method of claim 12 , further comprising reading data stored at the storage node through a first sense amplifier coupled to the second port.

16. The method of claim 15 , further comprising reading data stored at the storage node through a second sense amplifier coupled to the first port.

17. The method of claim 12 , wherein the first conductance equals the second conductance.

18. The method of claim 17 , wherein the first conductance is achieved through a first conductive transistor coupled between the storage node and the first port and the second conductance is achieved through a second conductive transistor coupled between the storage node and the second port.

19. A method of operating a multi-port memory:

writing data through a first port, independent of operation of a second port, to a storage node of a memory in a first mode of operation; and

simultaneously writing data through the first port and the second port to the storage node in a second mode of operation,

wherein:

the first mode is characterized by the multi-port memory being operated at a first temperature; and

the second mode is characterized by the multi-port memory being operated at a second temperature, wherein the second temperature differs from the first temperature.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
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From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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