IP Library Granted Patent US 9,523,800
Granted Patent B2
US 9,523,800 · App. 12/785,310 · Granted Dec 20, 2016

Computation efficiency by iterative spatial harmonics order truncation

Inventors: Andrei Veldman (Santa Clara, CA); John J. Hench (San Jose, CA)
Assignee: KLA-Tencor Corporation
G02B5/1847
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Quick Facts
Patent No.
US 9,523,800
App. No.
12/785,310
Granted
Dec 20, 2016
Kind
B2
Abstract

A method for improving computation efficiency for diffraction signals in optical metrology is described. The method includes simulating a set of spatial harmonics orders for a grating structure. The set of spatial harmonics orders is truncated to provide a first truncated set of spatial harmonics orders based on a first pattern. The first truncated set of spatial harmonics orders is modified by an iterative process to provide a second truncated set of spatial harmonics orders based on a second pattern, the second pattern different from the first pattern. Finally, a simulated spectrum is provided based on the second truncated set of spatial harmonics orders.

Claims (22)

1. A method for improving computation efficiency for diffraction signals in optical metrology, the method comprising:

simulating a set of spatial harmonics orders for a grating structure;

truncating the set of spatial harmonics orders to provide a first truncated set of spatial harmonics orders based on a first pattern, the first truncated set of spatial harmonics orders having fewer spatial harmonics orders than the set of spatial harmonics orders; and, subsequently,

subtracting, by an iterative process, one or more individual spatial harmonics orders from the first truncated set of spatial harmonics orders to provide a second truncated set of spatial harmonics orders based on a second pattern, the second pattern different from the first pattern;

adding, by an iterative process, one or more individual spatial harmonics orders to the second truncated set of spatial harmonics orders to provide a third truncated set of spatial harmonics orders based on a third pattern, the third pattern different from the first and second patterns; and

providing a simulated spectrum based on the third truncated set of spatial harmonics orders.

2. The method of claim 1 , wherein the first pattern is corner-free and is selected from the group consisting of circular and elliptical.

3. The method of claim 1 , further comprising:

subsequent to the simulating and prior to the truncating, prioritizing the spatial harmonics orders within the set of spatial harmonics orders, wherein truncating the set of spatial harmonics orders to provide the first truncated set of spatial harmonics orders is based on the prioritizing.

4. The method of claim 1 , further comprising:

comparing the simulated spectrum to a sample spectrum.

5. A non-transitory machine-accessible storage medium having instructions stored thereon which cause a data processing system to perform a method for improving computation efficiency for diffraction signals in optical metrology, the method comprising:

simulating a set of spatial harmonics orders for a grating structure;

truncating the set of spatial harmonics orders to provide a first truncated set of spatial harmonics orders based on a first pattern, the first truncated set of spatial harmonics orders having fewer spatial harmonics orders than the set of spatial harmonics orders; and, subsequently,

subtracting, by an iterative process, one or more individual spatial harmonics orders from the first truncated set of spatial harmonics orders to provide a second truncated set of spatial harmonics orders based on a second pattern, the second pattern different from the first pattern;

adding, by an iterative process, one or more individual spatial harmonics orders to the second truncated set of spatial harmonics orders to provide a third truncated set of spatial harmonics orders based on a third pattern, the third pattern different from the first and second patterns; and

providing a simulated spectrum based on the third truncated set of spatial harmonics orders.

6. The non-transitory storage medium as in claim 5 , wherein the first pattern is corner-free and is selected from the group consisting of circular and elliptical.

7. The non-transitory storage medium as in claim 5 , having instructions stored thereon which cause a data processing system to perform the method further comprising:

subsequent to the simulating and prior to the truncating, prioritizing the spatial harmonics orders within the set of spatial harmonics orders, wherein truncating the set of spatial harmonics orders to provide the first truncated set of spatial harmonics orders is based on the prioritizing.

8. The non-transitory storage medium as in claim 5 , having instructions stored thereon which cause a data processing system to perform the method further comprising:

comparing the simulated spectrum to a sample spectrum.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2015
From: TOKYO ELECTRON LIMITED
To: KLA-TENCOR CORPORATION
Reel/Frame 035055/0683 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2010
From: VELDMAN, ANDREI; HENCH, JOHN J.
To: TOKYO ELECTRON LIMITED; KLA-TENCOR CORPORATION
Reel/Frame 024511/0325 →
Continuity (1)
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