IP Library Granted Patent US 7,982,204
Granted Patent B2
US 7,982,204 · App. 12/788,603 · Granted Jul 19, 2011

Using unstable nitrides to form semiconductor structures

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Quick Facts
Patent No.
US 7,982,204
App. No.
12/788,603
Granted
Jul 19, 2011
Kind
B2
Abstract

Incompatible materials, such as copper and nitrided barrier layers, may be adhered more effectively to one another. In one embodiment, a precursor of copper is deposited on the nitrided barrier. The precursor is then converted, through the application of energy, to copper which could not have been as effectively adhered to the barrier in the first place.

Claims (12)

1. A semiconductor structure comprising:

a substrate;

a substantially nitride free metal nanowire over said substrate; and

a metal nitride over said nanowire, said metal nitride including at least three metal atoms per nitrogen atom.

2. The structure of claim 1 wherein said nanowire is copper.

3. The structure of claim 1 wherein said substrate is a nitride.

4. The structure of claim 3 wherein said substrate includes tungsten or titanium nitride.

5. A semiconductor structure comprising:

a substrate;

a metal nanowire nitride layer over said substrate; and

a region of substantially nitride free metal formed in said layer.

6. The structure of claim 5 wherein said metal nitride includes the same metal as said substantially nitride free metal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →